Patents by Inventor Keiichi KISAMORI

Keiichi KISAMORI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210232738
    Abstract: An analysis device includes a parameter sample data calculation unit that calculates a plurality of pieces of sample data for parameters for a simulator; a second type sample data acquisition unit that inputs, to the simulator, target data of the first type and each of the plurality of pieces of sample data for the parameters and obtains sample data of the second type for each of the plurality of pieces of sample data; and a parameter value calculation unit that calculates a weight for each of the plurality of pieces of sample data based on the difference between target data of the second type and the calculated sample data of the second type and calculates, using the calculated weight, a value for the parameters corresponding to the target data of the first type and the target data of the second type.
    Type: Application
    Filed: June 7, 2019
    Publication date: July 29, 2021
    Applicants: NEC CORPORATION, National Institute of Advanced Industrial Science and Technology
    Inventors: Keiichi KISAMORI, Keisuke YAMAZAKI
  • Publication number: 20210232737
    Abstract: An analysis device includes a parameter sample data calculation unit that calculates a plurality of pieces of sample data for parameters for a simulator, based on a temporarily set distribution for the parameters, the simulator receiving inputs of data of a first type and outputting data of a second type; a second type sample data acquisition unit that inputs, to the simulator, target data of the first type indicating a target value for the data of the first type and sample data for the parameters and obtains sample data of the second type for each of the plurality of pieces of sample data for the parameters; and a parameter value calculation unit that calculates a weight for each of the plurality of pieces of sample data for the parameters based on the difference between target data of the second type indicating a target value for the data of the second type and the calculated sample data of the second type and based on the relationship between a first distribution followed by the target data of the first ty
    Type: Application
    Filed: June 7, 2019
    Publication date: July 29, 2021
    Applicants: NEC CORPORATION, NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    Inventors: Keiichi KISAMORI, Keisuke YAMAZAKI
  • Publication number: 20210232957
    Abstract: A relationship analysis device includes a parameter sample data calculation unit that calculates sample data for parameters for a simulator that receives inputs of data of a first type and outputs data of a second type, calculating sample data; a second type sample data acquisition unit that inputs, to the simulator, observation data and sample data, and obtains sample data of the second type; and a parameter value determination unit that calculates a weight for sample data based on the difference between observation data of the second type and the sample data of the second type, and based on the relationship between a first distribution that the observation data of the first type followed and a second distribution being a distribution of the data of the first type, and calculates a value for the parameters using the calculated weight.
    Type: Application
    Filed: June 7, 2019
    Publication date: July 29, 2021
    Applicants: NEC CORPORATION, NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    Inventors: Keiichi KISAMORI, Keisuke YAMAZAKI
  • Publication number: 20210224664
    Abstract: A relationship analysis device includes a parameter sample data calculation unit that calculates a plurality of pieces of sample data for parameters for a simulator that receives inputs of data of a first type and outputs data of a second type, calculating the plurality of pieces of sample data; a second type sample data acquisition unit that inputs, to the simulator, observation data of the first type and a plurality of pieces of sample data, and obtains sample data of the second type for each of the plurality of pieces of sample data; and a parameter value determination unit that calculates a weight for each of the plurality of pieces of sample data based on the difference between observation data of the second type and the calculated sample data of the second type and calculates a value for the parameters using the calculated weight.
    Type: Application
    Filed: June 7, 2019
    Publication date: July 22, 2021
    Applicants: NEC CORPORATION, NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    Inventors: Keiichi KISAMORI, Keisuke YAMAZAKI