Abstract: An inference model construction method obtains a distribution of control points pertaining to a reference state and a distribution of the control points pertaining to a defined state with respect to a defined representation model. The method extracts a first feature value based on the distribution of the control points pertaining to the reference state. The method machine-learns the distribution of the control points pertaining to the defined state while using, as a label, the first feature value, and constructs an inference model based on a result of the leaning performed with respect to a plurality of the defined representation models.

Abstract: An information processing apparatus includes an effective range acquisition unit configured to acquire an effective range of color information with respect to the color information extracted from an image of an object captured by an imaging unit, and a color region extraction unit configured to extract a color region corresponding to the color information from another captured image that is different from the captured image from which the color information is extracted, based on the effective range of the color information.

Abstract: To remove components, such as fog, from a captured image while suppressing a reduction in image quality. An image processing apparatus includes a unit configured to derive parameters for image quality improving processing based on the transmittance of light incident on each pixel of captured image data including a fine particle component and a unit configured to generate corrected image data of the captured image data by performing image quality improving processing to improve image quality of the captured image data using the parameters and removal processing to remove the fine particle component from the captured image data on the captured image data.

Abstract: An information processing apparatus includes an effective range acquisition unit configured to acquire an effective range of color information with respect to the color information extracted from an image of an object captured by an imaging unit, and a color region extraction unit configured to extract a color region corresponding to the color information from another captured image that is different from the captured image from which the color information is extracted, based on the effective range of the color information.

Abstract: An image processing apparatus includes an acquiring unit configured to acquire a first image of a subject viewed from a first point of view and a second image of the subject viewed from a second point of view different from the first point of view, wherein the first image and the second image have different blurred states from each other; a processing unit configured to change a blurred state of at least one of the first image and the second image; and a determining unit configured to compare the first image and the second image after the blurred state of at least one of the first image and the second image is changed by the processing unit to determine image regions corresponding to the subject between the first image and the second image.

Abstract: An image processing apparatus is configured to obtain multi-viewpoint image data indicating a plurality of images acquired in a case where the same object is viewed from different viewpoints, perform, on the multi-viewpoint image data, blurring processing which increases a size of blur of the plurality of images according to a magnitude of a parallax between the plurality of images, and generate, using the multi-viewpoint image data on which the blurring processing has been performed, stereoscopic image data used for stereoscopic vision of the object.

Abstract: An image processing apparatus includes an acquiring unit configured to acquire a first image of a subject viewed from a first point of view and a second image of the subject viewed from a second point of view different from the first point of view, wherein the first image and the second image have different blurred states from each other; a processing unit configured to change a blurred state of at least one of the first image and the second image; and a determining unit configured to compare the first image and the second image after the blurred state of at least one of the first image and the second image is changed by the processing unit to determine image regions corresponding to the subject between the first image and the second image.

Abstract: To remove components, such as fog, from a captured image while suppressing a reduction in image quality. An image processing apparatus includes a unit configured to derive parameters for image quality improving processing based on the transmittance of light incident on each pixel of captured image data including a fine particle component and a unit configured to generate corrected image data of the captured image data by performing image quality improving processing to improve image quality of the captured image data using the parameters and removal processing to remove the fine particle component from the captured image data on the captured image data.

Abstract: There is provided an image processing apparatus comprising: an acquisition unit configured to acquire captured images captured by a plurality of image capturing units for capturing an object from different viewpoints; a specifying unit configured to specify a defective image from the plurality of captured images; a determination unit configured to determine a weight for each captured image based on a position of the image capturing unit that has captured the defective image specified by the specifying unit; and a synthesis unit configured to generate a synthesized image by weighting and synthesizing the plurality of captured images based on the weights determined by the determination unit.

Abstract: A super-resolution capability is enhanced when a distance to a principal object is set as a synthetic focal distance. The principal object is extracted from images imaged by a plurality of imaging units, and a super-resolution capability of the extracted principal object is calculated. An imaging parameter is adjusted according to the calculated super-resolution capability.

Abstract: There is provided an image processing apparatus comprising: an acquisition unit configured to acquire captured images captured by a plurality of image capturing units for capturing an object from different viewpoints; a specifying unit configured to specify a defective image from the plurality of captured images; a determination unit configured to determine a weight for each captured image based on a position of the image capturing unit that has captured the defective image specified by the specifying unit; and a synthesis unit configured to generate a synthesized image by weighting and synthesizing the plurality of captured images based on the weights determined by the determination unit.

Abstract: A connecting pin for use in a bicycle chain for example. The connecting pin has a pin body for connecting a plurality of connecting members at least one of which defines a through hole, an inserting portion attached to a longitudinal end the pin body, the inserting portion having a tapered portion insertible into and retainable at the through hole and a detachable connecting portion provided between the pin body and the inserting portion for detachably connecting the same. A connecting method using the connecting pin is also disclosed.

Abstract: A semiconductor device testing device for testing a semiconductor device having input/output terminals includes a dynamic load circuit provided for each of the input/output terminals of the semiconductor device and a comparator provided for each of the input/output terminals of the semiconductor device which compares the voltage value obtained at the input/output terminal with a predetermined value to detect whether the internal state of the semiconductor device is a high impedance state or not. The confirmation of the electrical connection between the semiconductor device and the testing device is thereby conducted by the dynamic load circuit and the comparator.

Abstract: A semiconductor device testing device for conducting a logical verification and an electric characteristics measurement of a semiconductor device, includes a measuring circuit provided corresponding to each pin of the semiconductor device to be tested, the measuring circuit including a comparator intended to compare the output voltage or current from the semiconductor device with a referent voltage or current; a memory for storing information required for the logical verification and the electric characteristics measurement; a controller for controlling the execution of the logical verification and the electric characteristics measurement including an application of a reference voltage or current to the comparator; and a judging circuit to determine whether the result of the logical verification or the electric characteristics measurement is normal or abnormal from the output of the comparator.