Abstract: A lead frame has a frame section for carriage, a square die pad for mounting a semiconductor chip, and four suspension arms bridging the frame section and corners of the die pad. The die pad has a plurality of oblique slits therein extending parallel to one another and parallel to a diagonal line of the die pad passing first and second corners of the die pad. During encapsulation, resin is introduced from a gate of molding dies located at the first corner to a vent of the molding dies located at the second corner. The oblique slits enhances oblique resin-flow under the lower surface of the die pad during encapsulation of the semiconductor device, to thereby prevent a die pad shift, unfilling of the resin and resin void in the semiconductor device.

Abstract: A semiconductor device has a plurality of chip regions each having semiconductor elements disposed therein and a plurality of electrode pads disposed on a surface thereof. The chip regions are separated and defined by scribing line regions. A plurality of dummy pads are disposed in the scribing line regions for use in positioning the electrode pads upon wafer probe test. The dummy pads are disposed in diagonally opposite positions across each of the chip regions one on each side of the each of the chip regions.

Abstract: In a solid-state image pickup device, a high melting point metal film is used in a cell portion region (photoelectric conversion portion) as a light shielding film which defines an open area of a photoelectric conversion element and an aluminum film which is covered with a high melting point metal is used in a peripheral region as wiring.