Patents by Inventor Keiki Ito

Keiki Ito has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10074519
    Abstract: Provided is a plasma processing apparatus in which an external circuit is electrically connected, via a line, to a predetermined electric member within a processing container thereof, and noises of first and second high frequency waves are attenuated or blocked by a filter provided on the line when the noises enter the line from the electric member toward the external circuit. The filter includes: an air core coil provided at a first stage when viewed from the electric member side; a toroidal coil connected in series with the air core coil; an electroconductive casing configured to accommodate or enclose the air core coil and the toroidal coil; a first condenser electrically connected between a connection point between the air core coil and the toroidal coil and the casing; and a second condenser connected between a terminal of the toroidal coil at the external circuit side and the casing.
    Type: Grant
    Filed: September 9, 2013
    Date of Patent: September 11, 2018
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Keiki Ito, Masaki Nishikawa, Naohiko Okunishi, Junichi Shimada, Ken Koyanagi
  • Patent number: 10056230
    Abstract: A power supply system includes a high frequency power supply which supplies a high frequency power; a DC power supply which supplies a first negative DC voltage or a second negative DC voltage having an absolute value larger than that of the first DC voltage; and a control unit which performs a power supply control process of repeating a supply and a stop of the supply of the high frequency power alternately; stopping supplies of the first and second DC voltages for a first period, which is a time period from a beginning of the supply of the high frequency power within a period during which the high frequency power is being supplied; supplying the first DC voltage for a second period except the first period within the period; and supplying the second DC voltage for a period during which the supply of the high frequency power is stopped.
    Type: Grant
    Filed: March 21, 2016
    Date of Patent: August 21, 2018
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Taichi Hirano, Junji Ishibashi, Keiki Ito, Kunihiro Sato
  • Publication number: 20160284514
    Abstract: A power supply system includes a high frequency power supply which supplies a high frequency power; a DC power supply which supplies a first negative DC voltage or a second negative DC voltage having an absolute value larger than that of the first DC voltage; and a control unit which performs a power supply control process of repeating a supply and a stop of the supply of the high frequency power alternately; stopping supplies of the first and second DC voltages for a first period, which is a time period from a beginning of the supply of the high frequency power within a period during which the high frequency power is being supplied; supplying the first DC voltage for a second period except the first period within the period; and supplying the second DC voltage for a period during which the supply of the high frequency power is stopped.
    Type: Application
    Filed: March 21, 2016
    Publication date: September 29, 2016
    Inventors: Taichi Hirano, Junji Ishibashi, Keiki Ito, Kunihiro Sato
  • Patent number: 9441791
    Abstract: A gas supply unit, for supplying a gas into a processing chamber in which a substrate is processed, includes a plurality of gas supply sources, a mixing line for mixing a plurality of gases supplied from the gas supply sources to make a gaseous mixture, a multiplicity of branch lines for branching the gaseous mixture to be supplied to a multiplicity of places in the processing chamber, and an additional gas supply unit for supplying a specified additional gas to a gaseous mixture flowing in at least one branch line. The gas supply unit also includes pressure gauges and valves for adjusting gas flow rates in the branch lines, respectively, and a pressure ratio controller for controlling that gaseous mixtures branched into the branch lines to have a specified pressure ratio by adjusting opening degrees of the valves based on measurement results obtained by using the pressure gauges.
    Type: Grant
    Filed: November 30, 2012
    Date of Patent: September 13, 2016
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Kenetsu Mizusawa, Keiki Ito, Masahide Itoh
  • Publication number: 20150235809
    Abstract: Provided is a plasma processing apparatus in which an external circuit is electrically connected, via a line, to a predetermined electric member within a processing container thereof, and noises of first and second high frequency waves are attenuated or blocked by a filter provided on the line when the noises enter the line from the electric member toward the external circuit. The filter includes: an air core coil provided at a first stage when viewed from the electric member side; a toroidal coil connected in series with the air core coil; an electroconductive casing configured to accommodate or enclose the air core coil and the toroidal coil; a first condenser electrically connected between a connection point between the air core coil and the toroidal coil and the casing; and a second condenser connected between a terminal of the toroidal coil at the external circuit side and the casing.
    Type: Application
    Filed: September 9, 2013
    Publication date: August 20, 2015
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Keiki Ito, Masaki Nishikawa, Naohiko Okunishi, Junichi Shimada, Ken Koyanagi
  • Patent number: 8906193
    Abstract: A gas supply unit, for supplying a gas into a processing chamber in which a substrate is processed, includes a plurality of gas supply sources, a mixing line for mixing a plurality of gases supplied from the gas supply sources to make a gaseous mixture, a multiplicity of branch lines for branching the gaseous mixture to be supplied to a multiplicity of places in the processing chamber, and an additional gas supply unit for supplying a specified additional gas to a gaseous mixture flowing in at least one branch line. The gas supply unit also includes pressure gauges and valves for adjusting gas flow rates in the branch lines, respectively, and a pressure ratio controller for controlling that gaseous mixtures branched into the branch lines to have a specified pressure ratio by adjusting opening degrees of the valves based on measurement results obtained by using the pressure gauges.
    Type: Grant
    Filed: December 31, 2009
    Date of Patent: December 9, 2014
    Assignee: Tokyo Electron Limited
    Inventors: Kenetsu Mizusawa, Keiki Ito, Masahide Itoh
  • Patent number: 8109288
    Abstract: A partial pressure control system 45 includes two valves 2 which are branched from an operation gas supply pipe 44 and which variably control operation gas, pressure sensors 3 which are respectively connected to the each valves 2 in series and which detect pressure of the operation gas, and a controller 25 which proportionally controls the operation of the valves 2 based on detection result of the pressure sensors 3, thereby relatively controlling pressures P1 and P2 of the two valves. With this configuration, it is possible to reduce wastefull consumption of the operation gas, and to enhance the responsivity with respect to change of setting and the like.
    Type: Grant
    Filed: July 31, 2008
    Date of Patent: February 7, 2012
    Assignee: Tokyo Electron Limited
    Inventors: Hideki Nagaoka, Hiroshi Koizumi, Jun Ooyabu, Tsuyoshi Shimazu, Hiroki Endo, Keiki Ito, Daisuke Hayashi
  • Publication number: 20100163112
    Abstract: A gas supply unit, for supplying a gas into a processing chamber in which a substrate is processed, includes a plurality of gas supply sources, a mixing line for mixing a plurality of gases supplied from the gas supply sources to make a gaseous mixture, a multiplicity of branch lines for branching the gaseous mixture to be supplied to a multiplicity of places in the processing chamber, and an additional gas supply unit for supplying a specified additional gas to a gaseous mixture flowing in at least one branch line. The gas supply unit also includes pressure gauges and valves for adjusting gas flow rates in the branch lines, respectively, and a pressure ratio controller for controlling that gaseous mixtures branched into the branch lines to have a specified pressure ratio by adjusting opening degrees of the valves based on measurement results obtained by using the pressure gauges.
    Type: Application
    Filed: December 31, 2009
    Publication date: July 1, 2010
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Kenetsu Mizusawa, Keiki Ito, Masahide Itoh
  • Patent number: 7481240
    Abstract: A partial pressure control system 45 includes two valves 2 which are branched from an operation gas supply pipe 44 and which variably control operation gas, pressure sensors 3 which are respectively connected to the each valves 2 in series and which detect pressure of the operation gas, and a controller 25 which proportionally controls the operation of the valves 2 based on detection result of the pressure sensors 3, thereby relatively controlling pressures P1 and P2 of the two valves. With this configuration, it is possible to reduce wastefull consumption of the operation gas, and to enhance the responsivity with respect to change of setting and the like.
    Type: Grant
    Filed: June 9, 2004
    Date of Patent: January 27, 2009
    Assignee: Tokyo Electron Limited
    Inventors: Hideki Nagaoka, Hiroshi Koizumi, Jun Ooyabu, Tsuyoshi Shimazu, Hiroki Endo, Keiki Ito, Daisuke Hayashi
  • Publication number: 20080300728
    Abstract: A partial pressure control system 45 includes two valves 2 which are branched from an operation gas supply pipe 44 and which variably control operation gas, pressure sensors 3 which are respectively connected to the each valves 2 in series and which detect pressure of the operation gas, and a controller 25 which proportionally controls the operation of the valves 2 based on detection result of the pressure sensors 3, thereby relatively controlling pressures P1 and P2 of the two valves. With this configuration, it is possible to reduce wastefull consumption of the operation gas, and to enhance the responsivity with respect to change of setting and the like.
    Type: Application
    Filed: July 31, 2008
    Publication date: December 4, 2008
    Inventors: Hideki Nagaoka, Hiroshi Koizumi, Jun Ooyabu, Tsuyoshi Shimazu, Hiroki Endo, Keiki Ito, Daisuke Hayashi
  • Patent number: 7353841
    Abstract: Provided is a relative pressure control system has a simple configuration, but enables accurate regulation of a division ratio of an operation gas, and concurrently makes it possible to securely drain the operation gas from an operation gas pipeline in case of emergency. The system includes a plurality of air operated valves of a normally open type that are connected to an operation gas pipeline supplied with an operation gas; pressure sensors that are series connected to the respective air operated valves and that detect output pressures of the respective air operated valves; a controller that controls operation pressures of the respective air operated valves in accordance with the pressures detected by the pressure sensors; and a hard interlock solenoid valve that correlates the plurality of air operated valves to one another so that at least one of the plurality of air operated valves is normally opened.
    Type: Grant
    Filed: December 7, 2005
    Date of Patent: April 8, 2008
    Assignees: CKD Corporation, Tokyo Electron Limited
    Inventors: Tetsujiro Kono, Hiroki Doi, Minoru Ito, Hideki Nagaoka, Keiki Ito, Hiroki Endo, Tsuyoshi Shimazu, Jun Hirose, Osamu Katsumata, Kazuyuki Miura, Takashi Kitazawa
  • Publication number: 20060124169
    Abstract: A gas supply unit, for supplying a gas into a processing chamber in which a substrate is processed, includes a plurality of gas supply sources, a mixing line for mixing a plurality of gases supplied from the gas supply sources to make a gaseous mixture, a multiplicity of branch lines for branching the gaseous mixture to be supplied to a multiplicity of places in the processing chamber, and an additional gas supply unit for supplying a specified additional gas to a gaseous mixture flowing in at least one branch line. The gas supply unit also includes pressure gauges and valves for adjusting gas flow rates in the branch lines, respectively, and a pressure ratio controller for controlling that gaseous mixtures branched into the branch lines to have a specified pressure ratio by adjusting opening degrees of the valves based on measurement results obtained by using the pressure gauges.
    Type: Application
    Filed: December 8, 2005
    Publication date: June 15, 2006
    Applicant: Tokyo Electron Limited
    Inventors: Kenetsu Mizusawa, Keiki Ito, Masahide Itoh
  • Publication number: 20060097644
    Abstract: Provided is a relative pressure control system has a simple configuration, but enables accurate regulation of a division ratio of an operation gas, and concurrently makes it possible to securely drain the operation gas from an operation gas pipeline in case of emergency. The system includes a plurality of air operated valves of a normally open type that are connected to an operation gas pipeline supplied with an operation gas; pressure sensors that are series connected to the respective air operated valves and that detect output pressures of the respective air operated valves; a controller that controls operation pressures of the respective air operated valves in accordance with the pressures detected by the pressure sensors; and a hard-interlock solenoid valve that correlates the plurality of air operated valves to one another so that at least one of the plurality of air operated valves is normally opened.
    Type: Application
    Filed: December 7, 2005
    Publication date: May 11, 2006
    Applicants: CKD CORPORATION, TOKYO ELECTRON LIMITED
    Inventors: Tetsujiro Kono, Hiroki Doi, Minoru Ito, Hideki Nagaoka, Keiki Ito, Hiroki Endo, Tsuyoshi Shimazu, Jun Hirose, Osamu Katsumata, Kazuyuki Miura, Takashi Kitazawa
  • Publication number: 20050029369
    Abstract: A partial pressure control system 45 includes two valves 2 which are branched from an operation gas supply pipe 44 and which variably control operation gas, pressure sensors 3 which are respectively connected to the each valves 2 in series and which detect pressure of the operation gas, and a controller 25 which proportionally controls the operation of the valves 2 based on detection result of the pressure sensors 3, thereby relatively controlling pressures P1 and P2 of the two valves. With this configuration, it is possible to reduce wastefull consumption of the operation gas, and to enhance the responsivity with respect to change of setting and the like.
    Type: Application
    Filed: June 9, 2004
    Publication date: February 10, 2005
    Inventors: Hideki Nagaoka, Hiroshi Koizumi, Jun Ooyabu, Tsuyoshi Shimazu, Hiroki Endo, Keiki Ito, Daisuke Hayashi
  • Patent number: 5554249
    Abstract: A magnetron plasma etching system has a plurality of processing chambers connected to a common transfer chamber. Each processing chamber has a pair of counter electrodes for generating an electric field and a magnet mechanism for generating a magnetic field having an N-S axis crossing the electric field. All magnetic fields are rotated in the same plane. The rotation of the magnetic fields is controlled by a controller. When one of the magnetic fields is rotated, the other magnetic fields are rotated at equal speed such that the directions of N-S axes thereof are parallel and identical to that of the one of the magnetic fields.
    Type: Grant
    Filed: February 28, 1995
    Date of Patent: September 10, 1996
    Assignee: Tokyo Electron Limited
    Inventors: Makoto Hasegawa, Tsuyoshi Saito, Fumihiko Higuchi, Hideaki Amano, Katsunori Naitoh, Takashi Tozawa, Tatsuya Nakagome, Keiki Ito, Kouji Suzuki