Patents by Inventor Keiki Ito
Keiki Ito has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10074519Abstract: Provided is a plasma processing apparatus in which an external circuit is electrically connected, via a line, to a predetermined electric member within a processing container thereof, and noises of first and second high frequency waves are attenuated or blocked by a filter provided on the line when the noises enter the line from the electric member toward the external circuit. The filter includes: an air core coil provided at a first stage when viewed from the electric member side; a toroidal coil connected in series with the air core coil; an electroconductive casing configured to accommodate or enclose the air core coil and the toroidal coil; a first condenser electrically connected between a connection point between the air core coil and the toroidal coil and the casing; and a second condenser connected between a terminal of the toroidal coil at the external circuit side and the casing.Type: GrantFiled: September 9, 2013Date of Patent: September 11, 2018Assignee: TOKYO ELECTRON LIMITEDInventors: Keiki Ito, Masaki Nishikawa, Naohiko Okunishi, Junichi Shimada, Ken Koyanagi
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Patent number: 10056230Abstract: A power supply system includes a high frequency power supply which supplies a high frequency power; a DC power supply which supplies a first negative DC voltage or a second negative DC voltage having an absolute value larger than that of the first DC voltage; and a control unit which performs a power supply control process of repeating a supply and a stop of the supply of the high frequency power alternately; stopping supplies of the first and second DC voltages for a first period, which is a time period from a beginning of the supply of the high frequency power within a period during which the high frequency power is being supplied; supplying the first DC voltage for a second period except the first period within the period; and supplying the second DC voltage for a period during which the supply of the high frequency power is stopped.Type: GrantFiled: March 21, 2016Date of Patent: August 21, 2018Assignee: TOKYO ELECTRON LIMITEDInventors: Taichi Hirano, Junji Ishibashi, Keiki Ito, Kunihiro Sato
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Publication number: 20160284514Abstract: A power supply system includes a high frequency power supply which supplies a high frequency power; a DC power supply which supplies a first negative DC voltage or a second negative DC voltage having an absolute value larger than that of the first DC voltage; and a control unit which performs a power supply control process of repeating a supply and a stop of the supply of the high frequency power alternately; stopping supplies of the first and second DC voltages for a first period, which is a time period from a beginning of the supply of the high frequency power within a period during which the high frequency power is being supplied; supplying the first DC voltage for a second period except the first period within the period; and supplying the second DC voltage for a period during which the supply of the high frequency power is stopped.Type: ApplicationFiled: March 21, 2016Publication date: September 29, 2016Inventors: Taichi Hirano, Junji Ishibashi, Keiki Ito, Kunihiro Sato
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Patent number: 9441791Abstract: A gas supply unit, for supplying a gas into a processing chamber in which a substrate is processed, includes a plurality of gas supply sources, a mixing line for mixing a plurality of gases supplied from the gas supply sources to make a gaseous mixture, a multiplicity of branch lines for branching the gaseous mixture to be supplied to a multiplicity of places in the processing chamber, and an additional gas supply unit for supplying a specified additional gas to a gaseous mixture flowing in at least one branch line. The gas supply unit also includes pressure gauges and valves for adjusting gas flow rates in the branch lines, respectively, and a pressure ratio controller for controlling that gaseous mixtures branched into the branch lines to have a specified pressure ratio by adjusting opening degrees of the valves based on measurement results obtained by using the pressure gauges.Type: GrantFiled: November 30, 2012Date of Patent: September 13, 2016Assignee: TOKYO ELECTRON LIMITEDInventors: Kenetsu Mizusawa, Keiki Ito, Masahide Itoh
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Publication number: 20150235809Abstract: Provided is a plasma processing apparatus in which an external circuit is electrically connected, via a line, to a predetermined electric member within a processing container thereof, and noises of first and second high frequency waves are attenuated or blocked by a filter provided on the line when the noises enter the line from the electric member toward the external circuit. The filter includes: an air core coil provided at a first stage when viewed from the electric member side; a toroidal coil connected in series with the air core coil; an electroconductive casing configured to accommodate or enclose the air core coil and the toroidal coil; a first condenser electrically connected between a connection point between the air core coil and the toroidal coil and the casing; and a second condenser connected between a terminal of the toroidal coil at the external circuit side and the casing.Type: ApplicationFiled: September 9, 2013Publication date: August 20, 2015Applicant: TOKYO ELECTRON LIMITEDInventors: Keiki Ito, Masaki Nishikawa, Naohiko Okunishi, Junichi Shimada, Ken Koyanagi
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Patent number: 8906193Abstract: A gas supply unit, for supplying a gas into a processing chamber in which a substrate is processed, includes a plurality of gas supply sources, a mixing line for mixing a plurality of gases supplied from the gas supply sources to make a gaseous mixture, a multiplicity of branch lines for branching the gaseous mixture to be supplied to a multiplicity of places in the processing chamber, and an additional gas supply unit for supplying a specified additional gas to a gaseous mixture flowing in at least one branch line. The gas supply unit also includes pressure gauges and valves for adjusting gas flow rates in the branch lines, respectively, and a pressure ratio controller for controlling that gaseous mixtures branched into the branch lines to have a specified pressure ratio by adjusting opening degrees of the valves based on measurement results obtained by using the pressure gauges.Type: GrantFiled: December 31, 2009Date of Patent: December 9, 2014Assignee: Tokyo Electron LimitedInventors: Kenetsu Mizusawa, Keiki Ito, Masahide Itoh
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Patent number: 8109288Abstract: A partial pressure control system 45 includes two valves 2 which are branched from an operation gas supply pipe 44 and which variably control operation gas, pressure sensors 3 which are respectively connected to the each valves 2 in series and which detect pressure of the operation gas, and a controller 25 which proportionally controls the operation of the valves 2 based on detection result of the pressure sensors 3, thereby relatively controlling pressures P1 and P2 of the two valves. With this configuration, it is possible to reduce wastefull consumption of the operation gas, and to enhance the responsivity with respect to change of setting and the like.Type: GrantFiled: July 31, 2008Date of Patent: February 7, 2012Assignee: Tokyo Electron LimitedInventors: Hideki Nagaoka, Hiroshi Koizumi, Jun Ooyabu, Tsuyoshi Shimazu, Hiroki Endo, Keiki Ito, Daisuke Hayashi
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Publication number: 20100163112Abstract: A gas supply unit, for supplying a gas into a processing chamber in which a substrate is processed, includes a plurality of gas supply sources, a mixing line for mixing a plurality of gases supplied from the gas supply sources to make a gaseous mixture, a multiplicity of branch lines for branching the gaseous mixture to be supplied to a multiplicity of places in the processing chamber, and an additional gas supply unit for supplying a specified additional gas to a gaseous mixture flowing in at least one branch line. The gas supply unit also includes pressure gauges and valves for adjusting gas flow rates in the branch lines, respectively, and a pressure ratio controller for controlling that gaseous mixtures branched into the branch lines to have a specified pressure ratio by adjusting opening degrees of the valves based on measurement results obtained by using the pressure gauges.Type: ApplicationFiled: December 31, 2009Publication date: July 1, 2010Applicant: TOKYO ELECTRON LIMITEDInventors: Kenetsu Mizusawa, Keiki Ito, Masahide Itoh
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Patent number: 7481240Abstract: A partial pressure control system 45 includes two valves 2 which are branched from an operation gas supply pipe 44 and which variably control operation gas, pressure sensors 3 which are respectively connected to the each valves 2 in series and which detect pressure of the operation gas, and a controller 25 which proportionally controls the operation of the valves 2 based on detection result of the pressure sensors 3, thereby relatively controlling pressures P1 and P2 of the two valves. With this configuration, it is possible to reduce wastefull consumption of the operation gas, and to enhance the responsivity with respect to change of setting and the like.Type: GrantFiled: June 9, 2004Date of Patent: January 27, 2009Assignee: Tokyo Electron LimitedInventors: Hideki Nagaoka, Hiroshi Koizumi, Jun Ooyabu, Tsuyoshi Shimazu, Hiroki Endo, Keiki Ito, Daisuke Hayashi
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Publication number: 20080300728Abstract: A partial pressure control system 45 includes two valves 2 which are branched from an operation gas supply pipe 44 and which variably control operation gas, pressure sensors 3 which are respectively connected to the each valves 2 in series and which detect pressure of the operation gas, and a controller 25 which proportionally controls the operation of the valves 2 based on detection result of the pressure sensors 3, thereby relatively controlling pressures P1 and P2 of the two valves. With this configuration, it is possible to reduce wastefull consumption of the operation gas, and to enhance the responsivity with respect to change of setting and the like.Type: ApplicationFiled: July 31, 2008Publication date: December 4, 2008Inventors: Hideki Nagaoka, Hiroshi Koizumi, Jun Ooyabu, Tsuyoshi Shimazu, Hiroki Endo, Keiki Ito, Daisuke Hayashi
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Patent number: 7353841Abstract: Provided is a relative pressure control system has a simple configuration, but enables accurate regulation of a division ratio of an operation gas, and concurrently makes it possible to securely drain the operation gas from an operation gas pipeline in case of emergency. The system includes a plurality of air operated valves of a normally open type that are connected to an operation gas pipeline supplied with an operation gas; pressure sensors that are series connected to the respective air operated valves and that detect output pressures of the respective air operated valves; a controller that controls operation pressures of the respective air operated valves in accordance with the pressures detected by the pressure sensors; and a hard interlock solenoid valve that correlates the plurality of air operated valves to one another so that at least one of the plurality of air operated valves is normally opened.Type: GrantFiled: December 7, 2005Date of Patent: April 8, 2008Assignees: CKD Corporation, Tokyo Electron LimitedInventors: Tetsujiro Kono, Hiroki Doi, Minoru Ito, Hideki Nagaoka, Keiki Ito, Hiroki Endo, Tsuyoshi Shimazu, Jun Hirose, Osamu Katsumata, Kazuyuki Miura, Takashi Kitazawa
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Publication number: 20060124169Abstract: A gas supply unit, for supplying a gas into a processing chamber in which a substrate is processed, includes a plurality of gas supply sources, a mixing line for mixing a plurality of gases supplied from the gas supply sources to make a gaseous mixture, a multiplicity of branch lines for branching the gaseous mixture to be supplied to a multiplicity of places in the processing chamber, and an additional gas supply unit for supplying a specified additional gas to a gaseous mixture flowing in at least one branch line. The gas supply unit also includes pressure gauges and valves for adjusting gas flow rates in the branch lines, respectively, and a pressure ratio controller for controlling that gaseous mixtures branched into the branch lines to have a specified pressure ratio by adjusting opening degrees of the valves based on measurement results obtained by using the pressure gauges.Type: ApplicationFiled: December 8, 2005Publication date: June 15, 2006Applicant: Tokyo Electron LimitedInventors: Kenetsu Mizusawa, Keiki Ito, Masahide Itoh
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Publication number: 20060097644Abstract: Provided is a relative pressure control system has a simple configuration, but enables accurate regulation of a division ratio of an operation gas, and concurrently makes it possible to securely drain the operation gas from an operation gas pipeline in case of emergency. The system includes a plurality of air operated valves of a normally open type that are connected to an operation gas pipeline supplied with an operation gas; pressure sensors that are series connected to the respective air operated valves and that detect output pressures of the respective air operated valves; a controller that controls operation pressures of the respective air operated valves in accordance with the pressures detected by the pressure sensors; and a hard-interlock solenoid valve that correlates the plurality of air operated valves to one another so that at least one of the plurality of air operated valves is normally opened.Type: ApplicationFiled: December 7, 2005Publication date: May 11, 2006Applicants: CKD CORPORATION, TOKYO ELECTRON LIMITEDInventors: Tetsujiro Kono, Hiroki Doi, Minoru Ito, Hideki Nagaoka, Keiki Ito, Hiroki Endo, Tsuyoshi Shimazu, Jun Hirose, Osamu Katsumata, Kazuyuki Miura, Takashi Kitazawa
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Publication number: 20050029369Abstract: A partial pressure control system 45 includes two valves 2 which are branched from an operation gas supply pipe 44 and which variably control operation gas, pressure sensors 3 which are respectively connected to the each valves 2 in series and which detect pressure of the operation gas, and a controller 25 which proportionally controls the operation of the valves 2 based on detection result of the pressure sensors 3, thereby relatively controlling pressures P1 and P2 of the two valves. With this configuration, it is possible to reduce wastefull consumption of the operation gas, and to enhance the responsivity with respect to change of setting and the like.Type: ApplicationFiled: June 9, 2004Publication date: February 10, 2005Inventors: Hideki Nagaoka, Hiroshi Koizumi, Jun Ooyabu, Tsuyoshi Shimazu, Hiroki Endo, Keiki Ito, Daisuke Hayashi
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Patent number: 5554249Abstract: A magnetron plasma etching system has a plurality of processing chambers connected to a common transfer chamber. Each processing chamber has a pair of counter electrodes for generating an electric field and a magnet mechanism for generating a magnetic field having an N-S axis crossing the electric field. All magnetic fields are rotated in the same plane. The rotation of the magnetic fields is controlled by a controller. When one of the magnetic fields is rotated, the other magnetic fields are rotated at equal speed such that the directions of N-S axes thereof are parallel and identical to that of the one of the magnetic fields.Type: GrantFiled: February 28, 1995Date of Patent: September 10, 1996Assignee: Tokyo Electron LimitedInventors: Makoto Hasegawa, Tsuyoshi Saito, Fumihiko Higuchi, Hideaki Amano, Katsunori Naitoh, Takashi Tozawa, Tatsuya Nakagome, Keiki Ito, Kouji Suzuki