Patents by Inventor Keiko Yano

Keiko Yano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100276359
    Abstract: Provided is an absorption column for body fluid purification by which the saturated adsorption amount of a substance to be adsorbed can be increased or the time required for reaching the saturated adsorption can be shortened, and therefore, the column capacity can be considerably reduced and the treatment time can be considerably shortened. The adsorption column having functional groups 6 specifically binding to a substance to be adsorbed including at least low density lipoprotein, immobilized on the surface of a porous support 5.
    Type: Application
    Filed: September 8, 2008
    Publication date: November 4, 2010
    Applicant: REI Medical Co., Ltd.
    Inventors: Masamichi Ippommatsu, Chie Kurusu, Riichi Miyamoto, Sayaka Ishii, Kazuki Nakanishi, Hiroyoshi Minakuchi, Keiko Yano
  • Patent number: 6033134
    Abstract: In the production of semiconductor devices, a pattern-wise exposed resist coating is developed with a developer to form a resist pattern corresponding to the pattern of exposure radiation on an article to be fabricated. The development being carried out with a developer consisting of one or more organic solvents, in at least two stages and in each stage of the development, the development is interrupted when a substantial permeation of the developer of a surface portion of the pattern-forming area of the resist pattern in which the resist pattern remains is completed, and the developed resist coating is dried between this stage and the following development stages. The development of the exposed resist coating is carried out by using a developing apparatus which comprises at least one set of developer-supplying system and rinsing solution-supplying system, and a conveyor means for guiding the article carrying the resist coating.
    Type: Grant
    Filed: March 11, 1998
    Date of Patent: March 7, 2000
    Assignee: Fujitsu Limited
    Inventors: Takashi Maruyama, Tatsuo Chijimatsu, Koichi Kobayashi, Keiko Yano, Hiroyuki Kanata
  • Patent number: 5906912
    Abstract: An electroconductive pattern is formed by coating a substrate with a solution comprising 100 parts by weight of a soluble electroconductive polymer containing an organic radical capable of cross-linking with a cross-linking agent, 5 to 1,000 parts by weight of a cross-linking agent, and 100 to 100,000 parts by weight of a solvent; effecting cross-linking of the resultant coated film to obtain a cured electroconductive film having a sheet resistance of 10.sup.10 .OMEGA./.quadrature. or less; forming a pattern as an upper layer on the cured electroconductive layer; and transferring the pattern of the upper layer to the cured electroconductive layer.
    Type: Grant
    Filed: April 11, 1997
    Date of Patent: May 25, 1999
    Assignee: Fujitsu Limited
    Inventors: Keiji Watanabe, Miwa Igarashi, Ei Yano, Keiko Yano, Takashi Maruyama, Eiichi Hoshino, Kotaro Shirabe, Masafumi Nakaishi
  • Patent number: 5804354
    Abstract: A composition for forming a conductivity imparting agent comprising:(a) 0.1 to 20 parts by weight of sulfonated polyaniline having a content of a sulfonic acid group of 20 to 80% with respect to an aromatic ring of the sulfonated polyaniline;(b) 100 parts by weight of a solvent;(c) 0.01 to 10 parts by weight of an amine and/or quaternary ammonium salt; and(d) 0.001 to 100 parts by weight of at least one kind of a sulfonic acid group-containing component selected from the following (A) and (B);(A) compounds having a sulfonic acid group; and(B) polymers having a sulfonic acid group.
    Type: Grant
    Filed: June 16, 1997
    Date of Patent: September 8, 1998
    Assignees: Fujitsu Limited, Nitto Chemical Industry Co., Ltd.
    Inventors: Keiji Watanabe, Yasuhiro Yoneda, Takashi Maruyama, Keiko Yano, Tomio Nakamura, Shigeru Shimizu, Takashi Saitoh, Takahisa Namiki, Ei Yano, Miwa Igarashi, Yoko Kuramitsu
  • Patent number: 5783367
    Abstract: In the production of semiconductor devices, a pattern-wise exposed resist coating is developed with a developer to form a resist pattern corresponding to the pattern of exposure radiation on an article to be fabricated. The development being carried out with a developer consisting of one or more organic solvents, in at least two stages and in each stage of the development, the development is interrupted when a substantial permeation of the developer of a surface portion of the pattern-forming area of the resist pattern in which the resist pattern remains is completed, and the developed resist coating is dried between this stage and the following development stages. The development of the exposed resist coating is carried out by using a developing apparatus which comprises at least one set of developer-supplying system and rinsing solution-supplying system, and a conveyor means for guiding the article carrying the resist coating.
    Type: Grant
    Filed: January 27, 1995
    Date of Patent: July 21, 1998
    Assignee: Fujitsu Limited
    Inventors: Takashi Maruyama, Tatsuo Chijimatsu, Koichi Kobayashi, Keiko Yano, Hiroyuki Kanata
  • Patent number: 5776659
    Abstract: A composition for irradiation with an ionizing radiation, characterized by comprising: (a) 0.01 to 30 parts by weight of a soluble aniline polymer which comprises one or both of the repeating units represented by the following general formulae (1) and (2), said repeating units being included at least 80% of the total repeating units, possesses a weight average molecular weight of not less than 10,000, and is solid at room temperature; and (b) 100 parts by weight of a solvent, ##STR1## wherein R.sup.1 to R.sup.4 represent an electron-donating group, Y.sup.1 to Y.sup.4 represent --SO.sub.3 -- or --COO--, and M.sup.1 to M.sup.4 represent a hydrogen ion, an ammonium ion, an a1kyl ammonium ion with 1 to 8 carbon atoms, an aromatic ammonium ion, or a quaternary ion of an aromatic heterocyclic ring.
    Type: Grant
    Filed: December 12, 1996
    Date of Patent: July 7, 1998
    Assignees: Fujitsu Limited, Nitto Chemical Industry Co., Ltd.
    Inventors: Keiji Watanabe, Ei Yano, Takahisa Namiki, Keiko Yano, Takashi Maruyama, Tomio Nakamura, Shigeru Shimizu, Takashi Saitoh, Masashi Uzawa, Masami Ishikawa
  • Patent number: 5721091
    Abstract: A composition for forming an electrically conductive layer which is used in patterning of a resist with electric charge beam, which comprises:(a) 0.1 to 20 parts by weight of sulfonated polyanilines with a sulfonic group content ranging from 20 to 80% based on the aromatic ring, the sulfonated polyaniline having a weight average molecular weight of 500 to 100,000 and a molecular weight dispersion of not more than 5,(b) 100 parts by weight of a solvent, and(c) 0.01 to 30 parts by weight of amines and/or quaternary ammonium salts,and if desired, it further comprises 0 to 200 parts by weight of the following substance(s) (A) and/or (B) as component (d):(A) a high molecular weight compound soluble in the aforesaid solvent (b),(B) a surface active agent.
    Type: Grant
    Filed: June 6, 1995
    Date of Patent: February 24, 1998
    Assignees: Fujitsu Limited, Nitto Chemical Industry Co., Ltd.
    Inventors: Keiji Watanabe, Yasuhiro Yoneda, Takashi Maruyama, Keiko Yano, Tomio Nakamura, Shigeru Shimizu, Takashi Saitoh
  • Patent number: 5560870
    Abstract: A composition for forming an electrically conductive layer which is used in patterning of a resist with electric charge beam, which comprises:(a) 0.1 to 20 parts by weight of sulfonated polyanilines with a sulfonic group content ranging from 20 to 80% based on the aromatic ring, the sulfonated polyaniline having a weight average molecular weight of 500 to 100,000 and a molecular weight dispersion of not more than 5,(b) 100 parts by weight of a solvent, and(c) 0.01 to 30 parts by weight of amines and/or quaternary ammonium salts,and if desired, it further comprises 0 to 200 parts by weight of the following substance(s) (A) and/or (B) as component (d):(A) a high molecular weight compound soluble in the aforesaid solvent (b),(B) a surface active agent.
    Type: Grant
    Filed: May 22, 1995
    Date of Patent: October 1, 1996
    Assignees: Fujitsu Limited, Nitto Chemical Industry Co.
    Inventors: Keiji Watanabe, Yasuhiro Yoneda, Takashi Maruyama, Keiko Yano, Tomio Nakamura, Shigeru Shimizu, Takashi Saitoh
  • Patent number: 5210696
    Abstract: An electron beam exposure data processing method includes the steps of inputting exposure data relating to a pattern to be written, and determining whether or not the pattern should be subjected to a framing process. The method further includes performing the framing process when it is determined that the pattern should be subjected to the framing process so that the pattern is partitioned into a frame pattern and an inner pattern surrounded by the frame pattern, reducing the inner pattern by a reduction rate to thereby generate a reduced inner pattern, and determining an exposure dose for the frame pattern and an exposure dose for the reduced inner pattern. There are also provided an electron beam exposure method which employs the electron beam exposure data processing method and an apparatus implementing the same.
    Type: Grant
    Filed: February 8, 1990
    Date of Patent: May 11, 1993
    Assignee: Fujitsu Limited
    Inventor: Keiko Yano
  • Patent number: 5091285
    Abstract: A pattern-forming method using an electroconductive composition comprising at least one TCNQ complex salt selected from the group consisting of isoquinolinium-TCNQ complex salts, quinolinium-TCNQ complex salts, alkyl pyridinium-TCNQ complex salts, and morpholinium-TCNQ complex salts, a specific polymer, and a solvent are disclosed. This composition gives an electroconductive film having a superior long-term storage stability and electroconductive characteristics.When this electroconductive composition is coated on a resist to form an electroconductive film, and a pattern is formed by an irradiation with charging beams, such as electron beams, an accumulation of charges (charge-up) is prevented and a fine resist pattern in which a misregistration is completely prevented is obtained.
    Type: Grant
    Filed: April 27, 1990
    Date of Patent: February 25, 1992
    Assignees: Fujitsu Limited, Nitto Chemical Industry Co., Ltd.
    Inventors: Keiji Watanabe, Yasuhiro Yoneda, Koichi Kobayashi, Keiko Yano, Tomio Nakamura, Shigeru Shimizu