Patents by Inventor Keishi Hanahara

Keishi Hanahara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measuring a three-dimensional position of an object
    Patent number: 4846576
    Abstract: A method for measuring a three-dimensional position of an object with a single camera and a multislit light, i.e., a source of multiplanar light beams. A surface of the object is irradiated with multislit lights, i.e., multiplanar light beams, having a plurality of slit light faces and also irradiated with a single standard slit light having a slit light face identical to one of the plurality of slit light faces of the multislit lights. A plurality of slit light photo images corresponding to a plurality of slit light projected images and a standard slit light photo image corresponding to a slit light projected image formed on the object are obtained. One of the slit light photo images which corresponds to the standard slit light photo image is specified and made to correspond, to compute a three-dimensional position of the object in a predetermined coordinate.
    Type: Grant
    Filed: May 20, 1986
    Date of Patent: July 11, 1989
    Assignee: Fujitsu Limited
    Inventors: Tsugito Maruyama, Shinji Kanda, Keishi Hanahara
  • Spectrum analyzer without distinct band-pass filter components
    Patent number: 4358733
    Abstract: In an n-band spectrum analyzer, separation of frequency bands is performed by n+1 low-pass (or high-pass) filters. The outputs of adjacent low-pass (or high-pass) filters are subtracted. The output of each subtraction circuit is smoothed by an accumulator.
    Type: Grant
    Filed: October 22, 1980
    Date of Patent: November 9, 1982
    Assignee: Fujitsu Limited
    Inventor: Keishi Hanahara