Abstract: A malfunction detection device provided with an acquisition unit, a cutout unit, a feature extraction unit, a learning unit, and a deviation degree computation unit. The acquisition unit is configured to acquire device data. The cutout unit is configured to cut out data from the acquired device data based on predetermined conditions. The feature extraction unit is configured to extract a feature vector from the cut-out device data. The learning unit is configured to analyze the extracted feature vector. The learning unit is configured to generate a model of the feature vector based on analysis results. The deviation degree computation unit is configured to compute a degree of deviation between a feature vector of newly acquired device data and the model of the feature vector.

Abstract: A system includes: a monitoring data obtainer configured to obtain real-time monitoring data regarding equipment; a deterioration index calculator configured to calculate an estimated deterioration index of the equipment from an equipment model and the obtained monitoring data, the equipment model being created by modeling a relationship between the real-time monitoring data of the equipment in a normal state; a time change predictor configured to predict a time change of the estimated deterioration index; and a scheduler configured to estimate a cost in a future caused by the abnormal event, the cost being estimated based on the predicted time change of the estimated deterioration index and the relationship between the estimated deterioration index and the probability of the abnormal event.

Abstract: A system includes: a monitoring data obtainer configured to obtain real-time monitoring data regarding equipment; a deterioration index calculator configured to calculate an estimated deterioration index of the equipment from an equipment model and the obtained monitoring data, the equipment model being created by modeling a relationship between the real-time monitoring data of the equipment in a normal state; a time change predictor configured to predict a time change of the estimated deterioration index; and a scheduler configured to estimate a cost in a future caused by the abnormal event, the cost being estimated based on the predicted time change of the estimated deterioration index and the relationship between the estimated deterioration index and the probability of the abnormal event.