Patents by Inventor Keisuke TANUMA

Keisuke TANUMA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Charged Particle Beam Device and Scan Waveform Generation Method
    Publication number: 20230260739
    Abstract: It is aimed to properly correct the various types of distortion without a reduction in observation throughput.
    Type: Application
    Filed: July 13, 2020
    Publication date: August 17, 2023
    Inventors: Keisuke TANUMA, Masato KAMIO, Hironori ITABASHI, Hiroki KANNAMI, Yusuke SEKI, Takumi UEZONO, Mitsuhiro NAKAMURA
  • Charged Particle Beam Device and Sample Observation Method
    Publication number: 20230197400
    Abstract: A dielectric microscopic observation is possible, which suppresses image flow regardless of scanning speed.
    Type: Application
    Filed: June 12, 2020
    Publication date: June 22, 2023
    Inventors: Yusuke SEKI, Mitsuhiro NAKAMURA, Keisuke TANUMA