Patents by Inventor Keita Andrew Yokoyama

Keita Andrew Yokoyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods, systems, and computer-readable media for nondestructively measuring physical properties of a material by observing induced displacements using different focal configurations
    Patent number: 11397227
    Abstract: A method for quantitatively measuring a physical characteristic of a material includes performing one or more interrogations of a material sample, each interrogation using a push focal configuration. The method further includes taking measurements of displacement over time of a material sample caused by the one or more interrogations. Each measurement uses an interrogation focal configuration. The method further includes determining a physical characteristic of the material sample based on the measurements of displacement over time of the material sample. According to the method, at least one of the following is true: a tracking focal configuration used for one of the measurements is different from a tracking focal configuration used for another of the measurements; and a push focal configuration used for one of the interrogations is different from a push focal configuration used for another of the interrogations.
    Type: Grant
    Filed: January 15, 2021
    Date of Patent: July 26, 2022
    Assignee: THE UNIVERSITY OF NORTH CAROLINA AT CHAPEL HILL
    Inventors: Caterina M. Gallippi, Keita Andrew Yokoyama, Md Murad Hossain
  • METHODS, SYSTEMS, AND COMPUTER-READABLE MEDIA FOR NONDESTRUCTIVELY MEASURING PHYSICAL PROPERTIES OF A MATERIAL BY OBSERVING INDUCED DISPLACEMENTS USING DIFFERENT FOCAL CONFIGURATIONS
    Publication number: 20210239775
    Abstract: A method for quantitatively measuring a physical characteristic of a material includes performing one or more interrogations of a material sample, each interrogation using a push focal configuration. The method further includes taking measurements of displacement over time of a material sample caused by the one or more interrogations. Each measurement uses an interrogation focal configuration. The method further includes determining a physical characteristic of the material sample based on the measurements of displacement over time of the material sample. According to the method, at least one of the following is true: a tracking focal configuration used for one of the measurements is different from a tracking focal configuration used for another of the measurements; and a push focal configuration used for one of the interrogations is different from a push focal configuration used for another of the interrogations.
    Type: Application
    Filed: January 15, 2021
    Publication date: August 5, 2021
    Inventors: Caterina M. Gallippi, Keita Andrew Yokoyama, Md Murad Hossain