Patents by Inventor Keita FUJINO

Keita FUJINO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220357359
    Abstract: Provided is a technique for making a user analyze a sample while providing convenience to the user. An information providing system is provided with a determination unit configured to determine whether or not the part needs to be replaced, a display unit, and a display control unit configured to control the display unit. The display control unit causes the display unit to display supplier information on a supplier of the part when the part needs to be replaced.
    Type: Application
    Filed: March 28, 2022
    Publication date: November 10, 2022
    Inventors: Kazuma WATANABE, Hiroshi ARAI, Masato HIRADE, Yuichiro IKEDA, Hideo NAKAJIMA, Kenji YAMASAKI, Keita FUJINO
  • Publication number: 20220358636
    Abstract: Provided is a technique that makes a user analyze a sample without stressing the user as much as possible. An analyzer is provided with a display unit and a display control unit for controlling the display unit. The display control unit causes the display unit to display predetermined information in a step in which the user is waiting among steps of analyzing the sample.
    Type: Application
    Filed: March 28, 2022
    Publication date: November 10, 2022
    Inventors: Kazuma WATANABE, Hiroshi ARAI, Keita FUJINO, Masato HIRADE, Yuichiro IKEDA, Hideo NAKAJIMA, Kenji YAMASAKI
  • Patent number: 11454647
    Abstract: A cantilever has a probe at a tip end. An optical system emits laser light to the cantilever and detects the laser light reflected by the cantilever. A measurement unit measures characteristics of a sample based on a displacement of the cantilever obtained by a change in a position of the laser light detected by the optical system. The laser light adjustment unit adjusts, when adjusting the optical axis of the laser light, a spot diameter of the laser light to be larger than the spot diameter when measuring the characteristics of a sample. The imaging unit captures an image of a range including the position of the probe when adjusting the optical axis of the laser light. The display unit displays the captured image.
    Type: Grant
    Filed: July 27, 2018
    Date of Patent: September 27, 2022
    Assignee: Shimadzu Corporation
    Inventors: Kazuma Watanabe, Keita Fujino, Masato Hirade, Kenji Yamasaki, Hideo Nakajima, Yuichiro Ikeda, Hiroshi Arai
  • Publication number: 20210311091
    Abstract: A cantilever (2) has a probe (7) at a tip end. An optical system (80) emits laser light to the cantilever (2) and detects the laser light reflected by the cantilever (2). A measurement unit (14) measures characteristics of a sample (9) based on a displacement of the cantilever (2) obtained by a change in a position of the laser light detected by the optical system (80). The laser light adjustment unit (20) adjusts, when adjusting the optical axis of the laser light, a spot diameter of the laser light to be larger than the spot diameter when measuring the characteristics of a sample (8). The imaging unit (10) captures an image of a range including the position of the probe (7) when adjusting the optical axis of the laser light. The display unit (12) displays the captured image.
    Type: Application
    Filed: July 27, 2018
    Publication date: October 7, 2021
    Inventors: Kazuma WATANABE, Keita FUJINO, Masato HIRADE, Kenji YAMASAKI, Hideo NAKAJIMA, Yuichiro IKEDA, Hiroshi ARAI
  • Patent number: 11054441
    Abstract: A laser beam adjustment unit adjusts a laser beam applied to a cantilever. Assuming that a direction of displacement of a spot of the laser beam on a light receiving surface when the cantilever is displaced during measurement of properties of a sample is defined as a first direction, and a direction orthogonal to the first direction on the light receiving surface is defined as a second direction, the laser beam adjustment unit adjusts the laser beam such that a length of the spot of the laser beam in the second direction during adjustment of a position of a detection unit is longer than a length of the spot of the laser beam in the first direction during measurement of the properties of the sample.
    Type: Grant
    Filed: August 17, 2020
    Date of Patent: July 6, 2021
    Assignee: Shimadzu Corporation
    Inventor: Keita Fujino
  • Patent number: 10996238
    Abstract: A driving mechanism relatively displaces a measuring unit and a sample table such that a relative positional relationship between the measuring unit and the sample table is switched between a first positional relationship and a second positional relationship. In the second positional relationship, the sample table is exposed to the outside from within a lower housing. A controller includes a high voltage generation circuit that generates a high voltage to be supplied to a scanner. A first mechanical switch causes a power supply not to supply a voltage to the high voltage generation circuit in the second positional relationship.
    Type: Grant
    Filed: February 11, 2020
    Date of Patent: May 4, 2021
    Assignee: Shimadzu Corporation
    Inventor: Keita Fujino
  • Publication number: 20210102971
    Abstract: A laser beam adjustment unit adjusts a laser beam applied to a cantilever. Assuming that a direction of displacement of a spot of the laser beam on a light receiving surface when the cantilever is displaced during measurement of properties of a sample is defined as a first direction, and a direction orthogonal to the first direction on the light receiving surface is defined as a second direction, the laser beam adjustment unit adjusts the laser beam such that a length of the spot of the laser beam in the second direction during adjustment of a position of a detection unit is longer than a length of the spot of the laser beam in the first direction during measurement of the properties of the sample.
    Type: Application
    Filed: August 17, 2020
    Publication date: April 8, 2021
    Inventor: Keita Fujino
  • Publication number: 20200319229
    Abstract: A driving mechanism relatively displaces a measuring unit and a sample table such that a relative positional relationship between the measuring unit and the sample table is switched between a first positional relationship and a second positional relationship. In the second positional relationship, the sample table is exposed to the outside from within a lower housing. A controller includes a high voltage generation circuit that generates a high voltage to be supplied to a scanner. A first mechanical switch causes a power supply not to supply a voltage to the high voltage generation circuit in the second positional relationship.
    Type: Application
    Filed: February 11, 2020
    Publication date: October 8, 2020
    Inventor: Keita FUJINO
  • Patent number: 10641790
    Abstract: Provided is a scanning probe microscope being able to shorten an observation time of a minute observation object. Main measurement is performed to acquire a surface image of a sample based on a detection signal in a measurement range of a plurality of lines by repeating, for each line, processing of scanning a cantilever at predetermined second intervals in a Y-direction after acquiring the detection signal at predetermined first intervals while scanning the cantilever on a line having a predetermined length along an X-direction. Preliminary measurement is performed to acquire a surface image of the sample by acquiring the detection signal at intervals wider than the first intervals or scanning the cantilever in the Y-direction at intervals wider than the second intervals before the main measurement, the surface image of the sample being coarser than the surface image in the main measurement.
    Type: Grant
    Filed: March 1, 2019
    Date of Patent: May 5, 2020
    Assignee: Shimadzu Corporation
    Inventors: Kazuma Watanabe, Keita Fujino, Eiji Iida, Masato Hirade, Kenji Yamasaki, Hideo Nakajima, Yuichiro Ikeda, Hiroshi Arai
  • Patent number: 10598691
    Abstract: A scanning probe microscope includes a light source, a detector, a housing, an opening and closing door, an opening and closing sensor, a control unit, and the like. The opening and closing door is provided in the housing. The control unit 16 also functions as the light intensity change processing unit 164. In the scanning probe microscope, when the opening and closing sensor detects opening and closing of the opening and closing door, the light intensity change processing unit automatically changes the intensity of light irradiated from the light source based on a detection result of the opening and closing sensor. Therefore, it is possible to omit light intensity adjustment work performed manually by the user. As a result, the workability of the user when using the scanning probe microscope 1 can be improved.
    Type: Grant
    Filed: March 1, 2019
    Date of Patent: March 24, 2020
    Assignee: Shimadzu Corporation
    Inventors: Kazuma Watanabe, Keita Fujino, Eiji Iida, Masato Hirade, Kenji Yamasaki, Hideo Nakajima, Yuichiro Ikeda, Hiroshi Arai
  • Publication number: 20190331711
    Abstract: A scanning probe microscope includes a light source, a detector, a housing, an opening and closing door, an opening and closing sensor, a control unit, and the like. The opening and closing door is provided in the housing. The control unit 16 also functions as the light intensity change processing unit 164. In the scanning probe microscope, when the opening and closing sensor detects opening and closing of the opening and closing door, the light intensity change processing unit automatically changes the intensity of light irradiated from the light source based on a detection result of the opening and closing sensor. Therefore, it is possible to omit light intensity adjustment work performed manually by the user. As a result, the workability of the user when using the scanning probe microscope 1 can be improved.
    Type: Application
    Filed: March 1, 2019
    Publication date: October 31, 2019
    Inventors: Kazuma WATANABE, Keita FUJINO, Eiji IIDA, Masato HIRADE, Kenji YAMASAKI, Hideo NAKAJIMA, Yuichiro IKEDA, Hiroshi ARAI
  • Publication number: 20190324053
    Abstract: Provided is a scanning probe microscope being able to shorten an observation time of a minute observation object. Main measurement is performed to acquire a surface image of a sample based on a detection signal in a measurement range of a plurality of lines by repeating, for each line, processing of scanning a cantilever at predetermined second intervals in a Y-direction after acquiring the detection signal at predetermined first intervals while scanning the cantilever on a line having a predetermined length along an X-direction. Preliminary measurement is performed to acquire a surface image of the sample by acquiring the detection signal at intervals wider than the first intervals or scanning the cantilever in the Y-direction at intervals wider than the second intervals before the main measurement, the surface image of the sample being coarser than the surface image in the main measurement.
    Type: Application
    Filed: March 1, 2019
    Publication date: October 24, 2019
    Inventors: Kazuma WATANABE, Keita FUJINO, Eiji IIDA, Masato HIRADE, Kenji YAMASAKI, Hideo NAKAJIMA, Yuichiro IKEDA, Hiroshi ARAI