Patents by Inventor Keita FUJINO
Keita FUJINO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20220358636Abstract: Provided is a technique that makes a user analyze a sample without stressing the user as much as possible. An analyzer is provided with a display unit and a display control unit for controlling the display unit. The display control unit causes the display unit to display predetermined information in a step in which the user is waiting among steps of analyzing the sample.Type: ApplicationFiled: March 28, 2022Publication date: November 10, 2022Inventors: Kazuma WATANABE, Hiroshi ARAI, Keita FUJINO, Masato HIRADE, Yuichiro IKEDA, Hideo NAKAJIMA, Kenji YAMASAKI
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Publication number: 20220357359Abstract: Provided is a technique for making a user analyze a sample while providing convenience to the user. An information providing system is provided with a determination unit configured to determine whether or not the part needs to be replaced, a display unit, and a display control unit configured to control the display unit. The display control unit causes the display unit to display supplier information on a supplier of the part when the part needs to be replaced.Type: ApplicationFiled: March 28, 2022Publication date: November 10, 2022Inventors: Kazuma WATANABE, Hiroshi ARAI, Masato HIRADE, Yuichiro IKEDA, Hideo NAKAJIMA, Kenji YAMASAKI, Keita FUJINO
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Patent number: 11454647Abstract: A cantilever has a probe at a tip end. An optical system emits laser light to the cantilever and detects the laser light reflected by the cantilever. A measurement unit measures characteristics of a sample based on a displacement of the cantilever obtained by a change in a position of the laser light detected by the optical system. The laser light adjustment unit adjusts, when adjusting the optical axis of the laser light, a spot diameter of the laser light to be larger than the spot diameter when measuring the characteristics of a sample. The imaging unit captures an image of a range including the position of the probe when adjusting the optical axis of the laser light. The display unit displays the captured image.Type: GrantFiled: July 27, 2018Date of Patent: September 27, 2022Assignee: Shimadzu CorporationInventors: Kazuma Watanabe, Keita Fujino, Masato Hirade, Kenji Yamasaki, Hideo Nakajima, Yuichiro Ikeda, Hiroshi Arai
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Publication number: 20210311091Abstract: A cantilever (2) has a probe (7) at a tip end. An optical system (80) emits laser light to the cantilever (2) and detects the laser light reflected by the cantilever (2). A measurement unit (14) measures characteristics of a sample (9) based on a displacement of the cantilever (2) obtained by a change in a position of the laser light detected by the optical system (80). The laser light adjustment unit (20) adjusts, when adjusting the optical axis of the laser light, a spot diameter of the laser light to be larger than the spot diameter when measuring the characteristics of a sample (8). The imaging unit (10) captures an image of a range including the position of the probe (7) when adjusting the optical axis of the laser light. The display unit (12) displays the captured image.Type: ApplicationFiled: July 27, 2018Publication date: October 7, 2021Inventors: Kazuma WATANABE, Keita FUJINO, Masato HIRADE, Kenji YAMASAKI, Hideo NAKAJIMA, Yuichiro IKEDA, Hiroshi ARAI
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Patent number: 11054441Abstract: A laser beam adjustment unit adjusts a laser beam applied to a cantilever. Assuming that a direction of displacement of a spot of the laser beam on a light receiving surface when the cantilever is displaced during measurement of properties of a sample is defined as a first direction, and a direction orthogonal to the first direction on the light receiving surface is defined as a second direction, the laser beam adjustment unit adjusts the laser beam such that a length of the spot of the laser beam in the second direction during adjustment of a position of a detection unit is longer than a length of the spot of the laser beam in the first direction during measurement of the properties of the sample.Type: GrantFiled: August 17, 2020Date of Patent: July 6, 2021Assignee: Shimadzu CorporationInventor: Keita Fujino
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Patent number: 10996238Abstract: A driving mechanism relatively displaces a measuring unit and a sample table such that a relative positional relationship between the measuring unit and the sample table is switched between a first positional relationship and a second positional relationship. In the second positional relationship, the sample table is exposed to the outside from within a lower housing. A controller includes a high voltage generation circuit that generates a high voltage to be supplied to a scanner. A first mechanical switch causes a power supply not to supply a voltage to the high voltage generation circuit in the second positional relationship.Type: GrantFiled: February 11, 2020Date of Patent: May 4, 2021Assignee: Shimadzu CorporationInventor: Keita Fujino
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Publication number: 20210102971Abstract: A laser beam adjustment unit adjusts a laser beam applied to a cantilever. Assuming that a direction of displacement of a spot of the laser beam on a light receiving surface when the cantilever is displaced during measurement of properties of a sample is defined as a first direction, and a direction orthogonal to the first direction on the light receiving surface is defined as a second direction, the laser beam adjustment unit adjusts the laser beam such that a length of the spot of the laser beam in the second direction during adjustment of a position of a detection unit is longer than a length of the spot of the laser beam in the first direction during measurement of the properties of the sample.Type: ApplicationFiled: August 17, 2020Publication date: April 8, 2021Inventor: Keita Fujino
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Publication number: 20200319229Abstract: A driving mechanism relatively displaces a measuring unit and a sample table such that a relative positional relationship between the measuring unit and the sample table is switched between a first positional relationship and a second positional relationship. In the second positional relationship, the sample table is exposed to the outside from within a lower housing. A controller includes a high voltage generation circuit that generates a high voltage to be supplied to a scanner. A first mechanical switch causes a power supply not to supply a voltage to the high voltage generation circuit in the second positional relationship.Type: ApplicationFiled: February 11, 2020Publication date: October 8, 2020Inventor: Keita FUJINO
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Patent number: 10641790Abstract: Provided is a scanning probe microscope being able to shorten an observation time of a minute observation object. Main measurement is performed to acquire a surface image of a sample based on a detection signal in a measurement range of a plurality of lines by repeating, for each line, processing of scanning a cantilever at predetermined second intervals in a Y-direction after acquiring the detection signal at predetermined first intervals while scanning the cantilever on a line having a predetermined length along an X-direction. Preliminary measurement is performed to acquire a surface image of the sample by acquiring the detection signal at intervals wider than the first intervals or scanning the cantilever in the Y-direction at intervals wider than the second intervals before the main measurement, the surface image of the sample being coarser than the surface image in the main measurement.Type: GrantFiled: March 1, 2019Date of Patent: May 5, 2020Assignee: Shimadzu CorporationInventors: Kazuma Watanabe, Keita Fujino, Eiji Iida, Masato Hirade, Kenji Yamasaki, Hideo Nakajima, Yuichiro Ikeda, Hiroshi Arai
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Patent number: 10598691Abstract: A scanning probe microscope includes a light source, a detector, a housing, an opening and closing door, an opening and closing sensor, a control unit, and the like. The opening and closing door is provided in the housing. The control unit 16 also functions as the light intensity change processing unit 164. In the scanning probe microscope, when the opening and closing sensor detects opening and closing of the opening and closing door, the light intensity change processing unit automatically changes the intensity of light irradiated from the light source based on a detection result of the opening and closing sensor. Therefore, it is possible to omit light intensity adjustment work performed manually by the user. As a result, the workability of the user when using the scanning probe microscope 1 can be improved.Type: GrantFiled: March 1, 2019Date of Patent: March 24, 2020Assignee: Shimadzu CorporationInventors: Kazuma Watanabe, Keita Fujino, Eiji Iida, Masato Hirade, Kenji Yamasaki, Hideo Nakajima, Yuichiro Ikeda, Hiroshi Arai
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Publication number: 20190331711Abstract: A scanning probe microscope includes a light source, a detector, a housing, an opening and closing door, an opening and closing sensor, a control unit, and the like. The opening and closing door is provided in the housing. The control unit 16 also functions as the light intensity change processing unit 164. In the scanning probe microscope, when the opening and closing sensor detects opening and closing of the opening and closing door, the light intensity change processing unit automatically changes the intensity of light irradiated from the light source based on a detection result of the opening and closing sensor. Therefore, it is possible to omit light intensity adjustment work performed manually by the user. As a result, the workability of the user when using the scanning probe microscope 1 can be improved.Type: ApplicationFiled: March 1, 2019Publication date: October 31, 2019Inventors: Kazuma WATANABE, Keita FUJINO, Eiji IIDA, Masato HIRADE, Kenji YAMASAKI, Hideo NAKAJIMA, Yuichiro IKEDA, Hiroshi ARAI
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Publication number: 20190324053Abstract: Provided is a scanning probe microscope being able to shorten an observation time of a minute observation object. Main measurement is performed to acquire a surface image of a sample based on a detection signal in a measurement range of a plurality of lines by repeating, for each line, processing of scanning a cantilever at predetermined second intervals in a Y-direction after acquiring the detection signal at predetermined first intervals while scanning the cantilever on a line having a predetermined length along an X-direction. Preliminary measurement is performed to acquire a surface image of the sample by acquiring the detection signal at intervals wider than the first intervals or scanning the cantilever in the Y-direction at intervals wider than the second intervals before the main measurement, the surface image of the sample being coarser than the surface image in the main measurement.Type: ApplicationFiled: March 1, 2019Publication date: October 24, 2019Inventors: Kazuma WATANABE, Keita FUJINO, Eiji IIDA, Masato HIRADE, Kenji YAMASAKI, Hideo NAKAJIMA, Yuichiro IKEDA, Hiroshi ARAI