Patents by Inventor Keitaro Takagi

Keitaro Takagi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for inspecting semiconductor device
    Patent number: 7385686
    Abstract: A laser diode chip is scanned and irradiated with laser light penetrating the interior of crystal of a chip and having a wavelength which produces no electromotive force by optical excitation. When the temperature of a chip 1 increases through irradiation, a thermoelectromotive force is generated in a crystal abnormal part of the chip 1 by a Seebeck effect. This thermoelectromotive force is detected from a change of a voltage or current appearing between the anode and cathode of the chip 1 and displayed at a CRT to thereby detect defects inside the crystal.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: June 10, 2008
    Assignee: Canon Kabushiki Kaisha
    Inventors: Shigemitsu Shiba, Keitaro Takagi
  • Method and apparatus for inspecting semiconductor device
    Publication number: 20040263830
    Abstract: A laser diode chip is scanned and irradiated with laser light penetrating the interior of crystal of a chip and having a wavelength which produces no electromotive force by optical excitation. When the temperature of a chip 1 increases through irradiation, a thermoelectromotive force is generated in a crystal abnormal part of the chip 1 by a Seebeck effect. This thermoelectromotive force is detected from a change of a voltage or current appearing between the anode and cathode of the chip 1 and displayed at a CRT to thereby detect defects inside the crystal.
    Type: Application
    Filed: June 23, 2004
    Publication date: December 30, 2004
    Applicant: CANON KABUSHIKI KAISHA
    Inventors: Shigemitsu Shiba, Keitaro Takagi