Patents by Inventor Keith A. Edwards

Keith A. Edwards has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6748280
    Abstract: A method for a run-to-run (R2R) control system includes processing materials using a process input and producing a process output, storing the process input in a database, the storing including using a timestamp, and storing at least one measurement of the process output in the database aligned with each process input using the timestamp. The method further includes iterating over the data in the database to estimate one or more coefficients for a model, and, if one or more measurements is missing, replacing the missing measurements based on a prediction from said model. The model is updated with said coefficient estimates. The method additionally includes iterating over the data from the database to estimate a process state, and, if one or more of the measurements is missing from the database, replacing the missing measurements based on prediction from the model. The model is updated with said process state estimate.
    Type: Grant
    Filed: June 14, 2002
    Date of Patent: June 8, 2004
    Assignee: Brooks Automation, Inc.
    Inventors: Jianping Zou, James A. Mullins, Keith A. Edwards
  • Patent number: 6725098
    Abstract: A method for a run-to-run (R2R) control system includes processing materials using a process input and producing a process output, storing the process input in a database, the storing including using a timestamp, storing at least one measurement of the process output in the database aligned with each process input using the timestamp, iterating over the data from the database to estimate a process state, and, if one or more of the measurements is missing from the database, predicting the missing measurements for the database based on a model, and determining an error for calculating a next process input, the error based on the data in the database.
    Type: Grant
    Filed: October 23, 2001
    Date of Patent: April 20, 2004
    Assignee: Brooks Automation, Inc.
    Inventors: Keith A. Edwards, Jianping Zou, James A. Mullins
  • Patent number: 6572443
    Abstract: An apparatus and method for detecting a process endpoint. The method includes receiving a first data signal and a second data signal and combining the first data signal and the second data signal to generate a combined data signal. The method also includes detecting a peak in the combined data signal, wherein the peak indicates the process endpoint. The apparatus includes a data collection unit capable of receiving a plurality of data signals and a signal analysis unit. The signal analysis unit is capable of combining the plurality of data signals received through the data collection unit to generate a combined data signal and identifying a peak in the combined data signal indicative of the process endpoint.
    Type: Grant
    Filed: August 7, 2000
    Date of Patent: June 3, 2003
    Assignee: Advanced Micro Devices Inc.
    Inventors: Peter J. Beckage, Keith A. Edwards, Ralf B. Lukner, Wonhui Cho
  • Publication number: 20030078680
    Abstract: A method for a run-to-run (R2R) control system includes processing materials using a process input and producing a process output, storing the process input in a database, the storing including using a timestamp, storing at least one measurement of the process output in the database aligned with each process input using the timestamp, iterating over the data from the database to estimate a process state, and, if one or more of the measurements is missing from the database, predicting the missing measurements for the database based on a model, and determining an error for calculating a next process input, the error based on the data in the database.
    Type: Application
    Filed: October 23, 2001
    Publication date: April 24, 2003
    Applicant: PRI Automation, Inc.
    Inventors: Keith A. Edwards, Jianping Zou, James A. Mullins
  • Patent number: 6179688
    Abstract: The invention, in a first aspect, includes a method and apparatus for detecting the endpoint in a chemical-mechanical polishing process. The first aspect includes a chemical-mechanical polishing tool modified to receive a first and a second data signal; combine the first and second data signals to generate a combined data signal; and detect a peak in the combined data signal, wherein the peak indicates the process endpoint. In a second aspect, the invention is a method and an apparatus for detecting the endpoint in a chemical-mechanical polishing process. The second aspect includes an apparatus implementing a method in which a data signal is received. The data signal is analyzed to detect a peak indicative of the process endpoint in the received data signal.
    Type: Grant
    Filed: March 17, 1999
    Date of Patent: January 30, 2001
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Peter J. Beckage, Keith A. Edwards, Ralf B. Lukner, Wonhui Cho