Patents by Inventor Keith D. Rule

Keith D. Rule has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260161533
    Abstract: A test and measurement system includes a test and measurement instrument having one or more ports to connect to one or more devices under test (DUTs), a generative AI model, a user interface to allow a user to provide inputs to the system, and one or more processors to receive a user input identifying a test requirement specification, provide the test requirement specification to the generative AI model. receive a set of prerequisites from the generative AI model, use the set of prerequisites to generate an order for a set of tests for the DUT to minimize hardware changes for testing and minimize data collection instances from the DUT, perform the set of tests according to the order to acquire data from the DUT, and analyze the acquired data from the DUT to determine if the DUT has passed or failed one or more of the tests.
    Type: Application
    Filed: December 1, 2025
    Publication date: June 11, 2026
    Inventors: Keith D. Rule, Dane Miller, Madhusudan Acharya, Nitin Khaneja, P E Ramesh, Frederick B. Kuhlman, III
  • Publication number: 20260086906
    Abstract: A test and measurement system includes one or more test and measurement instruments at least one of which connects to a device under test (DUT), one or more memories, a generative artificial intelligence (AI) model connected to the one or more test and measurement instruments, and the one or more memories, and one or more processors to provide an artificial intelligence (AI) assistant as an interface to the generative AI model, present a user interface that allows a user to enter a prompt, use the AI assistant to translate the prompt into one or more queries for the generative AI model, send commands to the test and measurement instrument connected to the DUT to perform one or more tests on the DUT, take results from the one or more tests and convert them to user-interpretable results, and provide the user with results from the prompt at the user interface.
    Type: Application
    Filed: September 12, 2025
    Publication date: March 26, 2026
    Inventors: Archana I. Akkalakot, Keith D. Rule, Nitin Khaneja, Prashanth Thota
  • Publication number: 20260003862
    Abstract: A test and measurement instrument includes one or more memories, a generative artificial intelligence (AI) model to access to the one or more memories, a display, user controls, and one or more processors configured to access an application programming interface (API) of an AI assistant for the generative AI model, receive one or more user inputs as a prompt through one or more of the API or a user interface, access a master vector database to retrieve a list of master candidates, compare the prompt to the list of master candidates to select ones of the master candidates, send the selected ones to a vector database, receive specific candidates from the vector database, send the prompt and the specific candidates to the generative AI model, receive a response, and display the response on the display.
    Type: Application
    Filed: June 18, 2025
    Publication date: January 1, 2026
    Inventors: Dane Miller, Keith D. Rule, Abdul Bailey
  • Publication number: 20250355023
    Abstract: A computing device includes one or more memories including test and measurement knowledge, a generative artificial intelligence (AI) model having access to the one or more memories, a display, user controls to allow the user to provide inputs, and one or more processors configured to execute that code that causes the one or more processors to: access an application programming interface (API) of an AI assistant for the generative AI model to allow the user to interact with the AI assistant, receive one or more user inputs through one or more of the API or a user interface, the user inputs providing a description of one or more waveforms to be generated, use the AI assistant to develop each waveform definition from the description and access the generative AI model, receive one or more waveforms from the AI assistant, and store the one or more waveforms.
    Type: Application
    Filed: May 9, 2025
    Publication date: November 20, 2025
    Inventors: Christopher N. White, Sam J. Strickling, Keith D. Rule, Abdul Bailey
  • Patent number: 12442845
    Abstract: A computing device includes a port to allow the computing device to connect to a network, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to determine that a new waveform has been added to a repository connected to the computing device, perform a set of measurements on the new waveform, attach results from the measurements to the new waveform as metadata, and store the new waveform and attached metadata to the repository. A method of managing waveform data includes determining that a new waveform has been added to a repository, performing a set of measurements on the new waveform, attaching results from the measurements to the new waveform as metadata, and storing the new waveform and attached metadata to the repository.
    Type: Grant
    Filed: February 4, 2022
    Date of Patent: October 14, 2025
    Assignee: TEKTRONIX, INC.
    Inventors: Frederick B. Kuhlman, III, Adam M. Reeves, Thomas Buida, Gary J. Waldo, Keith D. Rule, James R. Bailey, Mitchell Parsons
  • Publication number: 20250277844
    Abstract: A test and measurement system includes one or more test and measurement instruments comprising at least one test and measurement instrument having one or more ports to connect the to a device under test (DUT), one or more memories including test and measurement knowledge, a generative artificial intelligence (AI) model connected to the one or more test and measurement instruments, and the one or more memories, one or more processors to: present a user interface having a prompt to a user, receive a request from the user, the request comprising one or more tasks to be performed by the one or more test and measurement instrument, access an application programming interface (API) of the generative AI model to translate the request to commands, send the commands to the one or more test and measurement instruments, and display an output on the user interface.
    Type: Application
    Filed: September 5, 2024
    Publication date: September 4, 2025
    Inventors: Keith D. Rule, Frederick B. Kuhlman, III, Aaron Acton, Alexander Ulyanov, Sean T. Marty, Dane Miller
  • Publication number: 20240288474
    Abstract: A reconfigurable, automatically self-adjusting test and measurement instrument includes an interface configured to receive one or more static data preconditions for data received in an input signal and one or more dynamic data preconditions for data received in the input signal, the one or more static data preconditions and dynamic data preconditions defining one or more rules for data received during an input signal acquisition period to conform; and one or more processors configured to receive the one or more static and dynamic data preconditions, configure testing parameters of the test and measurement instrument to satisfy the one or more static preconditions, acquire the input signal, and analyze data received in the input signal to determine whether the one or more dynamic data preconditions are met.
    Type: Application
    Filed: May 6, 2024
    Publication date: August 29, 2024
    Inventors: David C. Vollum, Seamus L. Brokaw, Byron T. Faber, Keith D. Rule
  • Patent number: 11797356
    Abstract: A method of synchronizing tasks in a test and measurement system, includes receiving, at a client in the system, a task input, receiving, at a job manager running on a first device processor in the system, a call from the client to create a job associated with the task, returning to the client an action containing at least one job code block associated with the job, receiving a call for the action, executing the at least one job code block by at least one processor in the system, determining that the job has completed, and completing the task.
    Type: Grant
    Filed: September 11, 2020
    Date of Patent: October 24, 2023
    Assignee: Tektronix, Inc.
    Inventors: Timothy E. Sauerwein, Clinton M. Alter, Sean T. Marty, Jenny Yang, Keith D. Rule
  • Publication number: 20230333148
    Abstract: A test and measurement instrument includes an input for accepting an input signal from a Device Under Test (DUT), acquisition memory for storing a sampled waveform derived from the input signal, an output display, and one or more processors configured to accept a portion of the sampled waveform as a search portion, search the sampled waveform for portions similar to the search portion, and visually indicate, on the output display, portions of the sampled waveform that are similar to the search portion as matched portions. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.
    Type: Application
    Filed: April 14, 2023
    Publication date: October 19, 2023
    Applicant: Tektronix, Inc.
    Inventors: Lance H. Forsberg, Keith D. Rule, David N. Wyban
  • Publication number: 20230012393
    Abstract: A test and measurement instrument includes one or more ports including at least one test port configured to couple to one or more devices under test, a user interface to receive one or more user inputs, an acquisition memory to store waveform data acquired from the one or more devices under test, one or more processors configured to execute code that causes the one or more processors to: receive an input through the user interface; determine one or more requested data types based on the input; transform the waveform data into compressed data containing only data elements corresponding to the one or more requested data types; and transmit the compressed data to a client.
    Type: Application
    Filed: July 7, 2022
    Publication date: January 12, 2023
    Applicant: Tektronix, Inc.
    Inventor: Keith D. Rule
  • Publication number: 20220268839
    Abstract: A test and measurement system includes a primary instrument having an input for receiving a test signal for measurement or analysis from a Device Under Test (DUT) and generating a test waveform from the test signal, and a duplicator for sending a copy of the test waveform to one or more secondary instruments. The one or more secondary instruments are each structured to access the copy of the test signal for analysis, and each of the one or more secondary instruments includes a receiver structured to receive a command related to measurement or analysis of the copy of the test waveform, one or more processes for executing the received command, and an output for sending results of the executed command to be displayed on a user interface that is separate from any user interface of the one or more secondary instruments.
    Type: Application
    Filed: February 25, 2022
    Publication date: August 25, 2022
    Inventors: John J. Pickerd, Keith D. Rule, Mark Anderson Smith
  • Publication number: 20220252647
    Abstract: A computing device includes a port to allow the computing device to connect to a network, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to determine that a new waveform has been added to a repository connected to the computing device, perform a set of measurements on the new waveform, attach results from the measurements to the new waveform as metadata, and store the new waveform and attached metadata to the repository. A method of managing waveform data includes determining that a new waveform has been added to a repository, performing a set of measurements on the new waveform, attaching results from the measurements to the new waveform as metadata, and storing the new waveform and attached metadata to the repository.
    Type: Application
    Filed: February 4, 2022
    Publication date: August 11, 2022
    Applicant: Initial State Technologies, Inc.
    Inventors: Frederick B. Kuhlman, III, Adam M. Reeves, Thomas Buida, Gary J. Waldo, Keith D. Rule, James R. Bailey, Mitchell Parsons
  • Patent number: 11237190
    Abstract: A test and measurement instrument, including a memory configured to store a waveform data record; one or more processors, and a display. The one or more processors are configured to receive the waveform data record, determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record, detect one or more logical path segments in the plurality of occurrences, and generating a visual representation of each measurement value and overlaying each of the visual representations of each measurement value. The visual representations of each measurement value and/or the one or more logical path segments may be displayed on the display.
    Type: Grant
    Filed: January 6, 2020
    Date of Patent: February 1, 2022
    Assignee: Tektronix, Inc.
    Inventors: Keith D. Rule, Sean T. Marty
  • Publication number: 20210325432
    Abstract: An oscilloscope includes an input port to receive an input signal, a trigger system coupled to the input port and operable to generate a trigger signal in response to detecting a trigger event in the input signal, the trigger system includes at least one finite state machine, and a snippet compiler configured to accept one or more Declarative Trigger Language (DTL) code snippets as an input, compile the one or more DTL code snippets into one or more state machine op codes, and output the one or more state machine op codes. The trigger system uses the one or more state machine op codes to configure the at least one finite state machine.
    Type: Application
    Filed: June 25, 2021
    Publication date: October 21, 2021
    Applicant: Tektronix, Inc.
    Inventors: Aidan A. D. Jensen, Keith D. Rule, Dawson C. Green
  • Patent number: 11018964
    Abstract: An apparatus and method that captures a complete history of serial network Link Training negotiations by continuously monitoring multiple analog signals representing both sides of full duplex lanes in real-time by pattern matching the Link Training Frame Marker and the subsequent negotiation request/response data values. The apparatus and method compare the digitized version of the incoming signal against a nominal pattern at the start to find the Frame Markers and Control Channel data, storing only those Control Channel data values that do not match the current compare pattern, and further by updating the current compare pattern to the new pattern just received, so that only the transitions in the data values are stored, thereby vastly reducing the amount of data presented to the user, but nonetheless retaining the complete substantive history of the Link Training negotiations.
    Type: Grant
    Filed: December 30, 2016
    Date of Patent: May 25, 2021
    Assignee: Tektronix, Inc.
    Inventors: David L. Kelly, Patrick A. Smith, Jed H. Andrews, Keith D. Rule
  • Publication number: 20210081257
    Abstract: A method of synchronizing tasks in a test and measurement system, includes receiving, at a client in the system, a task input, receiving, at a job manager running on a first device processor in the system, a call from the client to create a job associated with the task, returning to the client an action containing at least one job code block associated with the job, receiving a call for the action, executing the at least one job code block by at least one processor in the system, determining that the job has completed, and completing the task.
    Type: Application
    Filed: September 11, 2020
    Publication date: March 18, 2021
    Applicant: Tektronix, Inc.
    Inventors: Timothy E. Sauerwein, Clinton M. Alter, Sean T. Marty, Jenny Yang, Keith D. Rule
  • Publication number: 20200233016
    Abstract: A test and measurement instrument, including a memory configured to store a waveform data record; one or more processors, and a display. The one or more processors are configured to receive the waveform data record, determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record, detect one or more logical path segments in the plurality of occurrences, and generating a visual representation of each measurement value and overlaying each of the visual representations of each measurement value. The visual representations of each measurement value and/or the one or more logical path segments may be displayed on the display.
    Type: Application
    Filed: January 6, 2020
    Publication date: July 23, 2020
    Inventors: Keith D. Rule, Sean T. Marty
  • Publication number: 20190113542
    Abstract: A test-and-measurement instrument is described. A state machine, corresponding to a regular expression, can be stored in the test-and-measurement instrument. The state machine can be modified to reflect a trigger condition received from a user. The modified state machine can then be used to invoke a trigger when the condition is met in the bits of a bit stream.
    Type: Application
    Filed: December 4, 2018
    Publication date: April 18, 2019
    Applicant: Tektronix, Inc.
    Inventors: Aidan A. Daly-Jensen, Keith D. Rule, Dawson C. Green
  • Publication number: 20180356445
    Abstract: A test and measurement instrument including an interface configured to receive one or more preconditions for data acquisition, the one or more preconditions defining one or more rules to which data received during the data acquisition is to conform, and one or more processors. The one or more processors are configured to receive the one or more preconditions for data acquisition, determine whether the test and measurement instrument can be configured to implement the one or more preconditions for data acquisition, configure the test and measurement instrument to implement the one or more preconditions for data acquisition when the test and measurement instrument can be configured to implement the one or more preconditions for data acquisition, and generate one or more alerts when the test and measurement instrument cannot be configured to implement the one or more preconditions for data acquisition.
    Type: Application
    Filed: June 7, 2018
    Publication date: December 13, 2018
    Applicant: Tektronix, Inc.
    Inventors: David C. Vollum, Seamus L. Brokaw, Byron T. Faber, Keith D. Rule
  • Patent number: 10148547
    Abstract: A test-and-measurement instrument is described. A state machine, corresponding to a regular expression, can be stored in the test-and-measurement instrument. The state machine can be modified to reflect a trigger condition received from a user. The modified state machine can then be used to invoke a trigger when the condition is met in the bits of a bit stream.
    Type: Grant
    Filed: December 17, 2014
    Date of Patent: December 4, 2018
    Assignee: Tektronix, Inc.
    Inventors: Edward F. Tanous, Keith D. Rule, James Feist