Patents by Inventor Keith D. Rule
Keith D. Rule has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20260161533Abstract: A test and measurement system includes a test and measurement instrument having one or more ports to connect to one or more devices under test (DUTs), a generative AI model, a user interface to allow a user to provide inputs to the system, and one or more processors to receive a user input identifying a test requirement specification, provide the test requirement specification to the generative AI model. receive a set of prerequisites from the generative AI model, use the set of prerequisites to generate an order for a set of tests for the DUT to minimize hardware changes for testing and minimize data collection instances from the DUT, perform the set of tests according to the order to acquire data from the DUT, and analyze the acquired data from the DUT to determine if the DUT has passed or failed one or more of the tests.Type: ApplicationFiled: December 1, 2025Publication date: June 11, 2026Inventors: Keith D. Rule, Dane Miller, Madhusudan Acharya, Nitin Khaneja, P E Ramesh, Frederick B. Kuhlman, III
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Publication number: 20260086906Abstract: A test and measurement system includes one or more test and measurement instruments at least one of which connects to a device under test (DUT), one or more memories, a generative artificial intelligence (AI) model connected to the one or more test and measurement instruments, and the one or more memories, and one or more processors to provide an artificial intelligence (AI) assistant as an interface to the generative AI model, present a user interface that allows a user to enter a prompt, use the AI assistant to translate the prompt into one or more queries for the generative AI model, send commands to the test and measurement instrument connected to the DUT to perform one or more tests on the DUT, take results from the one or more tests and convert them to user-interpretable results, and provide the user with results from the prompt at the user interface.Type: ApplicationFiled: September 12, 2025Publication date: March 26, 2026Inventors: Archana I. Akkalakot, Keith D. Rule, Nitin Khaneja, Prashanth Thota
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Publication number: 20260003862Abstract: A test and measurement instrument includes one or more memories, a generative artificial intelligence (AI) model to access to the one or more memories, a display, user controls, and one or more processors configured to access an application programming interface (API) of an AI assistant for the generative AI model, receive one or more user inputs as a prompt through one or more of the API or a user interface, access a master vector database to retrieve a list of master candidates, compare the prompt to the list of master candidates to select ones of the master candidates, send the selected ones to a vector database, receive specific candidates from the vector database, send the prompt and the specific candidates to the generative AI model, receive a response, and display the response on the display.Type: ApplicationFiled: June 18, 2025Publication date: January 1, 2026Inventors: Dane Miller, Keith D. Rule, Abdul Bailey
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Publication number: 20250355023Abstract: A computing device includes one or more memories including test and measurement knowledge, a generative artificial intelligence (AI) model having access to the one or more memories, a display, user controls to allow the user to provide inputs, and one or more processors configured to execute that code that causes the one or more processors to: access an application programming interface (API) of an AI assistant for the generative AI model to allow the user to interact with the AI assistant, receive one or more user inputs through one or more of the API or a user interface, the user inputs providing a description of one or more waveforms to be generated, use the AI assistant to develop each waveform definition from the description and access the generative AI model, receive one or more waveforms from the AI assistant, and store the one or more waveforms.Type: ApplicationFiled: May 9, 2025Publication date: November 20, 2025Inventors: Christopher N. White, Sam J. Strickling, Keith D. Rule, Abdul Bailey
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Patent number: 12442845Abstract: A computing device includes a port to allow the computing device to connect to a network, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to determine that a new waveform has been added to a repository connected to the computing device, perform a set of measurements on the new waveform, attach results from the measurements to the new waveform as metadata, and store the new waveform and attached metadata to the repository. A method of managing waveform data includes determining that a new waveform has been added to a repository, performing a set of measurements on the new waveform, attaching results from the measurements to the new waveform as metadata, and storing the new waveform and attached metadata to the repository.Type: GrantFiled: February 4, 2022Date of Patent: October 14, 2025Assignee: TEKTRONIX, INC.Inventors: Frederick B. Kuhlman, III, Adam M. Reeves, Thomas Buida, Gary J. Waldo, Keith D. Rule, James R. Bailey, Mitchell Parsons
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Publication number: 20250277844Abstract: A test and measurement system includes one or more test and measurement instruments comprising at least one test and measurement instrument having one or more ports to connect the to a device under test (DUT), one or more memories including test and measurement knowledge, a generative artificial intelligence (AI) model connected to the one or more test and measurement instruments, and the one or more memories, one or more processors to: present a user interface having a prompt to a user, receive a request from the user, the request comprising one or more tasks to be performed by the one or more test and measurement instrument, access an application programming interface (API) of the generative AI model to translate the request to commands, send the commands to the one or more test and measurement instruments, and display an output on the user interface.Type: ApplicationFiled: September 5, 2024Publication date: September 4, 2025Inventors: Keith D. Rule, Frederick B. Kuhlman, III, Aaron Acton, Alexander Ulyanov, Sean T. Marty, Dane Miller
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Publication number: 20240288474Abstract: A reconfigurable, automatically self-adjusting test and measurement instrument includes an interface configured to receive one or more static data preconditions for data received in an input signal and one or more dynamic data preconditions for data received in the input signal, the one or more static data preconditions and dynamic data preconditions defining one or more rules for data received during an input signal acquisition period to conform; and one or more processors configured to receive the one or more static and dynamic data preconditions, configure testing parameters of the test and measurement instrument to satisfy the one or more static preconditions, acquire the input signal, and analyze data received in the input signal to determine whether the one or more dynamic data preconditions are met.Type: ApplicationFiled: May 6, 2024Publication date: August 29, 2024Inventors: David C. Vollum, Seamus L. Brokaw, Byron T. Faber, Keith D. Rule
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Patent number: 11797356Abstract: A method of synchronizing tasks in a test and measurement system, includes receiving, at a client in the system, a task input, receiving, at a job manager running on a first device processor in the system, a call from the client to create a job associated with the task, returning to the client an action containing at least one job code block associated with the job, receiving a call for the action, executing the at least one job code block by at least one processor in the system, determining that the job has completed, and completing the task.Type: GrantFiled: September 11, 2020Date of Patent: October 24, 2023Assignee: Tektronix, Inc.Inventors: Timothy E. Sauerwein, Clinton M. Alter, Sean T. Marty, Jenny Yang, Keith D. Rule
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Publication number: 20230333148Abstract: A test and measurement instrument includes an input for accepting an input signal from a Device Under Test (DUT), acquisition memory for storing a sampled waveform derived from the input signal, an output display, and one or more processors configured to accept a portion of the sampled waveform as a search portion, search the sampled waveform for portions similar to the search portion, and visually indicate, on the output display, portions of the sampled waveform that are similar to the search portion as matched portions. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.Type: ApplicationFiled: April 14, 2023Publication date: October 19, 2023Applicant: Tektronix, Inc.Inventors: Lance H. Forsberg, Keith D. Rule, David N. Wyban
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Publication number: 20230012393Abstract: A test and measurement instrument includes one or more ports including at least one test port configured to couple to one or more devices under test, a user interface to receive one or more user inputs, an acquisition memory to store waveform data acquired from the one or more devices under test, one or more processors configured to execute code that causes the one or more processors to: receive an input through the user interface; determine one or more requested data types based on the input; transform the waveform data into compressed data containing only data elements corresponding to the one or more requested data types; and transmit the compressed data to a client.Type: ApplicationFiled: July 7, 2022Publication date: January 12, 2023Applicant: Tektronix, Inc.Inventor: Keith D. Rule
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Publication number: 20220268839Abstract: A test and measurement system includes a primary instrument having an input for receiving a test signal for measurement or analysis from a Device Under Test (DUT) and generating a test waveform from the test signal, and a duplicator for sending a copy of the test waveform to one or more secondary instruments. The one or more secondary instruments are each structured to access the copy of the test signal for analysis, and each of the one or more secondary instruments includes a receiver structured to receive a command related to measurement or analysis of the copy of the test waveform, one or more processes for executing the received command, and an output for sending results of the executed command to be displayed on a user interface that is separate from any user interface of the one or more secondary instruments.Type: ApplicationFiled: February 25, 2022Publication date: August 25, 2022Inventors: John J. Pickerd, Keith D. Rule, Mark Anderson Smith
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Publication number: 20220252647Abstract: A computing device includes a port to allow the computing device to connect to a network, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to determine that a new waveform has been added to a repository connected to the computing device, perform a set of measurements on the new waveform, attach results from the measurements to the new waveform as metadata, and store the new waveform and attached metadata to the repository. A method of managing waveform data includes determining that a new waveform has been added to a repository, performing a set of measurements on the new waveform, attaching results from the measurements to the new waveform as metadata, and storing the new waveform and attached metadata to the repository.Type: ApplicationFiled: February 4, 2022Publication date: August 11, 2022Applicant: Initial State Technologies, Inc.Inventors: Frederick B. Kuhlman, III, Adam M. Reeves, Thomas Buida, Gary J. Waldo, Keith D. Rule, James R. Bailey, Mitchell Parsons
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Patent number: 11237190Abstract: A test and measurement instrument, including a memory configured to store a waveform data record; one or more processors, and a display. The one or more processors are configured to receive the waveform data record, determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record, detect one or more logical path segments in the plurality of occurrences, and generating a visual representation of each measurement value and overlaying each of the visual representations of each measurement value. The visual representations of each measurement value and/or the one or more logical path segments may be displayed on the display.Type: GrantFiled: January 6, 2020Date of Patent: February 1, 2022Assignee: Tektronix, Inc.Inventors: Keith D. Rule, Sean T. Marty
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Publication number: 20210325432Abstract: An oscilloscope includes an input port to receive an input signal, a trigger system coupled to the input port and operable to generate a trigger signal in response to detecting a trigger event in the input signal, the trigger system includes at least one finite state machine, and a snippet compiler configured to accept one or more Declarative Trigger Language (DTL) code snippets as an input, compile the one or more DTL code snippets into one or more state machine op codes, and output the one or more state machine op codes. The trigger system uses the one or more state machine op codes to configure the at least one finite state machine.Type: ApplicationFiled: June 25, 2021Publication date: October 21, 2021Applicant: Tektronix, Inc.Inventors: Aidan A. D. Jensen, Keith D. Rule, Dawson C. Green
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Patent number: 11018964Abstract: An apparatus and method that captures a complete history of serial network Link Training negotiations by continuously monitoring multiple analog signals representing both sides of full duplex lanes in real-time by pattern matching the Link Training Frame Marker and the subsequent negotiation request/response data values. The apparatus and method compare the digitized version of the incoming signal against a nominal pattern at the start to find the Frame Markers and Control Channel data, storing only those Control Channel data values that do not match the current compare pattern, and further by updating the current compare pattern to the new pattern just received, so that only the transitions in the data values are stored, thereby vastly reducing the amount of data presented to the user, but nonetheless retaining the complete substantive history of the Link Training negotiations.Type: GrantFiled: December 30, 2016Date of Patent: May 25, 2021Assignee: Tektronix, Inc.Inventors: David L. Kelly, Patrick A. Smith, Jed H. Andrews, Keith D. Rule
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Publication number: 20210081257Abstract: A method of synchronizing tasks in a test and measurement system, includes receiving, at a client in the system, a task input, receiving, at a job manager running on a first device processor in the system, a call from the client to create a job associated with the task, returning to the client an action containing at least one job code block associated with the job, receiving a call for the action, executing the at least one job code block by at least one processor in the system, determining that the job has completed, and completing the task.Type: ApplicationFiled: September 11, 2020Publication date: March 18, 2021Applicant: Tektronix, Inc.Inventors: Timothy E. Sauerwein, Clinton M. Alter, Sean T. Marty, Jenny Yang, Keith D. Rule
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Publication number: 20200233016Abstract: A test and measurement instrument, including a memory configured to store a waveform data record; one or more processors, and a display. The one or more processors are configured to receive the waveform data record, determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record, detect one or more logical path segments in the plurality of occurrences, and generating a visual representation of each measurement value and overlaying each of the visual representations of each measurement value. The visual representations of each measurement value and/or the one or more logical path segments may be displayed on the display.Type: ApplicationFiled: January 6, 2020Publication date: July 23, 2020Inventors: Keith D. Rule, Sean T. Marty
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Publication number: 20190113542Abstract: A test-and-measurement instrument is described. A state machine, corresponding to a regular expression, can be stored in the test-and-measurement instrument. The state machine can be modified to reflect a trigger condition received from a user. The modified state machine can then be used to invoke a trigger when the condition is met in the bits of a bit stream.Type: ApplicationFiled: December 4, 2018Publication date: April 18, 2019Applicant: Tektronix, Inc.Inventors: Aidan A. Daly-Jensen, Keith D. Rule, Dawson C. Green
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Publication number: 20180356445Abstract: A test and measurement instrument including an interface configured to receive one or more preconditions for data acquisition, the one or more preconditions defining one or more rules to which data received during the data acquisition is to conform, and one or more processors. The one or more processors are configured to receive the one or more preconditions for data acquisition, determine whether the test and measurement instrument can be configured to implement the one or more preconditions for data acquisition, configure the test and measurement instrument to implement the one or more preconditions for data acquisition when the test and measurement instrument can be configured to implement the one or more preconditions for data acquisition, and generate one or more alerts when the test and measurement instrument cannot be configured to implement the one or more preconditions for data acquisition.Type: ApplicationFiled: June 7, 2018Publication date: December 13, 2018Applicant: Tektronix, Inc.Inventors: David C. Vollum, Seamus L. Brokaw, Byron T. Faber, Keith D. Rule
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Patent number: 10148547Abstract: A test-and-measurement instrument is described. A state machine, corresponding to a regular expression, can be stored in the test-and-measurement instrument. The state machine can be modified to reflect a trigger condition received from a user. The modified state machine can then be used to invoke a trigger when the condition is met in the bits of a bit stream.Type: GrantFiled: December 17, 2014Date of Patent: December 4, 2018Assignee: Tektronix, Inc.Inventors: Edward F. Tanous, Keith D. Rule, James Feist