Abstract: A non-volatile storage device on a memory module comprising a plurality of memory devices is used to store the locations of defective parts on the memory module, such as data query (“DQ”) terminals, identified during a testing procedure. After testing, the non-volatile storage device, such as an electrically erasable programmable read only memory (“EEPROM”), may be accessed to determine specific memory devices such as dynamic random access memory (“DRAM”) which need to be repaired or replaced rather than re-testing the specific memory module.

Abstract: A non-volatile storage device on a memory module comprising a plurality of memory devices is used to store the locations of defective parts on the memory module, such as data query (“DQ”) terminals, identified during a testing procedure. After testing, the non-volatile storage device, such as an electrically erasable programmable read only memory (“EEPROM”), may be accessed to determine specific memory devices such as dynamic random access memory (“DRAM”) which need to be repaired or replaced rather than re-testing the specific memory module.

Abstract: A method and apparatus of separating integrated circuit (IC) devices according to magnetic properties of the devices is disclosed. A plurality of IC devices are subjected to a magnetic field. The IC devices containing only nonferrous material are not responsive to the magnetic field and are thus gathered to a first collection site. The IC devices containing ferrous material adhere to a moving surface proximate the magnetic field and are transported to a second collection site. The sorted devices are then transported to separate locations for further processing. The apparatus used for separating the IC devices may include a conveyor having a magnetic drum and an antistatic belt which travels about the magnetic drum. The conveyor allows nonferrous IC devices to fall off the edge of the magnetic drum into the first collection site while transporting the ferrous IC devices to another location for collection.

Abstract: A method and apparatus of separating integrated circuit (IC) devices according to magnetic properties of the devices is disclosed. A plurality of IC devices are subjected to a magnetic field. The IC devices containing only nonferrous material are not responsive to the magnetic field and are thus gathered to a first collection site. The IC devices containing ferrous material adhere to a moving surface proximate the magnetic field and are transported to a second collection site. The sorted devices are then transported to separate locations for further processing. The apparatus used for separating the IC devices may include a conveyor having a magnetic drum and an antistatic belt which travels about the magnetic drum. The conveyor allows nonferrous IC devices to fall off the edge of the magnetic drum into the first collection site while transporting the ferrous IC devices to another location for collection.

Abstract: A method and apparatus of separating integrated circuit (IC) devices according to magnetic properties of the devices. A plurality of IC devices are subjected to a magnetic field. The IC devices containing only nonferrous material are not responsive to the magnetic field and are thus gathered to a first collection site. The IC devices containing ferrous material adhere to a moving surface proximate the magnetic field and are transported to a second collection site. The sorted devices are then transported to separate locations for further processing. The apparatus used for separating the IC devices may include a conveyor having a magnetic drum and an antistatic belt which travels about the magnetic drum. The conveyor allows nonferrous IC devices to fall off the edge of the magnetic drum into the first collection site while transporting the ferrous IC devices to another location for collection.

Abstract: A method and apparatus of separating integrated circuit (IC) devices according to magnetic properties of the devices. A plurality of IC devices are subjected to a magnetic field. The IC devices containing only nonferrous material are not responsive to the magnetic field and are thus gathered to a first collection site. The IC devices containing ferrous material adhere to a moving surface proximate the magnetic field and are transported to a second collection site. The sorted devices are then transported to separate locations for further processing. The apparatus used for separating the IC devices may include a conveyor having a magnetic drum and an antistatic belt which travels about the magnetic drum. The conveyor allows nonferrous IC devices to fall off the edge of the magnetic drum into the first collection site while transporting the ferrous IC devices to another location for collection.