Abstract: A pellet dispenser system reliably dispenses a pellet when appropriate and is easy to clean. The system includes a hopper having two chambers separated by a divider with a pellet passageway. A dispensing hole allows single pellets to pass into a pellet chute when a disc having one or more pellet holes is rotated by a motor. When a pellet is to be dispensed, such as when a lever is pressed, the disc is rotated within the hopper and carries a pellet in one of the pellet holes until the pellet hole reaches the dispensing hole, at which point the pellet passes through the dispensing hole and into the pellet chute. A beam may be directed through the pellet chute such that the beam is interrupted when a pellet passes through the pellet chute, allowing for verification that a pellet was dispensed.

Abstract: In an embodiment of the present invention there is provided a micro-electromechanical (MEMS) accelerometer, including a substrate, a first sensor and a second sensor. The first sensor is configured to measure an acceleration along a first axis parallel to a plane of the substrate. The second sensor is configured to measure an acceleration along an axis perpendicular to the plane of the substrate. The second sensor comprises a first beam, a second beam and a single support structure. The single support structure supports the first and second beams relative to the substrate, wherein the first and second beams circumscribe the first sensor.

Abstract: In an embodiment of the present invention there is provided a micro-electromechanical (MEMS) accelerometer, including a substrate, a first sensor and a second sensor. The first sensor is configured to measure an acceleration along a first axis parallel to a plane of the substrate. The second sensor is configured to measure an acceleration along an axis perpendicular to the plane of the substrate. The second sensor comprises a first beam, a second beam and a single support structure. The single support structure supports the first and second beams relative to the substrate, wherein the first and second beams circumscribe the first sensor.