Patents by Inventor Keith Gendreau

Keith Gendreau has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10895540
    Abstract: The present invention relates to a novel, non-rotating tomographic imaging system, including a multi-source x-ray imaging module which includes multiple x-ray sources within a vacuum manifold, each equipped with a non-thermionic cathode which can reduce image scan time (and hence, motion artifacts), or delivered radiation dose, through under-sampled acquisition sequences, and without adding additional sources. The non-thermionic nature of the cathode enables rapid on/off switching of x-rays without concern as to the thermal mass or the thermal time-constant of the cathode. The modules can be flexibly interconnected to each other to allow configuration as part of a distributed ring of sources, or in other x-ray imaging geometries. Modularity provides the present invention an advantage in making it easier to debug and repair a distributed-source imaging system, such as a computed tomographic (CT) system.
    Type: Grant
    Filed: May 8, 2019
    Date of Patent: January 19, 2021
    Assignee: United States of America as represented by the Administrator of NASA
    Inventors: Rajiv Gupta, Wolfgang Krull, Jake Hecla, Avilash Cramer, Steven Kenyon, Zaven Arzoumanian, Keith Gendreau
  • Publication number: 20110007869
    Abstract: An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.
    Type: Application
    Filed: August 6, 2010
    Publication date: January 13, 2011
    Applicant: UNIVERSITY OF MARYLAND, BALTIMORE COUNTY
    Inventors: KEITH GENDREAU, Jose Vanderlei Martins, Zaven Arzoumanian
  • Patent number: 7796726
    Abstract: An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.
    Type: Grant
    Filed: February 14, 2007
    Date of Patent: September 14, 2010
    Assignee: University of Maryland, Baltimore County
    Inventors: Keith Gendreau, Jose Vanderlei Martins, Zaven Arzoumanian