Patents by Inventor Keith Horner

Keith Horner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9824439
    Abstract: A method of generating an indication of at least one characteristic of a patient's bone mineral density. The method comprises obtaining at least one measurement of a width of a patient's inferior mandibular cortex and generating said indication based upon said at least one measurement. The at least one measurement is obtained at a location along the inferior mandibular cortex between the ante-gonion and a point on the inferior mandibular cortex defined with reference to the mental foramen.
    Type: Grant
    Filed: September 9, 2008
    Date of Patent: November 21, 2017
    Assignee: Manchester Imaging Limited
    Inventors: Philip Daniel Allen, Keith Horner, Jim Graham, Hugh Devlin
  • Publication number: 20100215229
    Abstract: A method of generating an indication of at least one characteristic of a patient's bone mineral density. The method comprises obtaining at least one measurement of a width of a patient's inferior mandibular cortex and generating said indication based upon said at least one measurement. The at least one measurement is obtained at a location along the inferior mandibular cortex between the ante-gonion and a point on the inferior mandibular cortex defined with reference to the mental foramen.
    Type: Application
    Filed: September 9, 2008
    Publication date: August 26, 2010
    Applicant: THE UNIVERSITY OF MANCHESTER
    Inventors: Philip Daniel Allen, Keith Horner, Jim Graham, Hugh Devlin
  • Patent number: 4725884
    Abstract: A method and apparatus for measuring the width of a small object between a pair of opposed edges thereof e.g. the width of a line on a semiconductor wafer, having a light microscope, a video system for receiving an optical image from the microscope and for displaying the image on a display surface having a reference datum, and an optical system for transmitting the optical image from the light microscope to the video system. In order to measure the width of the line of the wafer, relative adjustment is carried out between the optical system and the object to a first measuring position in which the image is moved across the display surface until a predetermined intensity level of one of the edges of the line is brought to a predetermined position relative to the reference datum. Further relative adjustment is then carried out to a second measuring position in which a further predetermined intensity level of the other edge of the object is brought to a predetermined position relative to the reference datum.
    Type: Grant
    Filed: May 19, 1986
    Date of Patent: February 16, 1988
    Assignee: Vickers PLC
    Inventors: Andrew W. Gurnell, Keith Horner, Richard R. Jackson