Abstract: Systems and methods for converting a capacitance signal into a band-limited voltage signal for improved signal processing are disclosed herein. Such systems can include a capacitance-to-voltage converter configured to convert a capacitive signal from a capacitive device that operates at a mechanical frequency into a raw voltage signal, a clock generator configured to convert the mechanical frequency into one or more clock signals, and a filter component configured to apply a band-pass filter response to the raw voltage signal to convert the raw voltage signal into a band-limited voltage signal. The clock generator can be configured to apply the one or more clock signals to the filter component to drive a first pole and a second pole of the band-pass filter response to track the mechanical frequency of the capacitive device such that the geometric mean of the first pole and the second pole is substantially equal to the mechanical frequency.

Abstract: Devices, systems and methods are provided for calibrating a transducer. One exemplary method involves determining a transfer function for the transducer based on a measured response of the transducer to an applied electrical signal, determining a set of values for a plurality of response parameters associated with the transducer based on the transfer function, determining a calibration coefficient value associated with the transducer based at least in part on the set of values and a correlation between physical sensitivity and the plurality of response parameters, and storing the calibration coefficient value in association with the transducer.

Abstract: A pressure sensor device and a method for testing the pressure sensor device is provided. The pressure sensor device includes a first pressure sensor cell having a first capacitance value, and a second pressure sensor cell having a second capacitance value, the second capacitance value being different from the first capacitance value. In one embodiment, the method includes determining a temperature coefficient offset to test for faults in the pressure sensor device. In another embodiment, the method includes determining a differential mode calculation and a common mode calculation. A fault exists if the differential and common mode calculations do not agree.

Abstract: Devices, systems and methods are provided for calibrating a transducer. One exemplary method involves determining a transfer function for the transducer based on a measured response of the transducer to an applied electrical signal, determining a set of values for a plurality of response parameters associated with the transducer based on the transfer function, determining a calibration coefficient value associated with the transducer based at least in part on the set of values and a correlation between physical sensitivity and the plurality of response parameters, and storing the calibration coefficient value in association with the transducer.

Abstract: A pressure sensor device and a method for testing the pressure sensor device is provided. The pressure sensor device includes a first pressure sensor cell having a first capacitance value, and a second pressure sensor cell having a second capacitance value, the second capacitance value being different from the first capacitance value. In one embodiment, the method includes determining a temperature coefficient offset to test for faults in the pressure sensor device. In another embodiment, the method includes determining a differential mode calculation and a common mode calculation. A fault exists if the differential and common mode calculations do not agree.