Patents by Inventor Keith L. Hart

Keith L. Hart has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Reflectivity and resolution X-ray dispersive and reflective structures for carbon, beryllium and boron analysis
    Patent number: 4785470
    Abstract: X-ray dispersive and reflective structures and materials are constructed which exhibit improved characteristics in specific ranges of interest. The structures are formed of metallic and non-metallic layer pairs. The structures are formed of alternating layers of Cr:C, Ni:C or V:C for carbon analysis and Mo:B.sub.4 C for beryllium an boron analysis. The layered structures can be formed from Ni:C for analysis of both carbon and boron.
    Type: Grant
    Filed: April 25, 1986
    Date of Patent: November 15, 1988
    Assignee: Ovonic Synthetic Materials Company, Inc.
    Inventors: James L. Wood, Keith L. Hart
  • X-ray dispersive and reflective structures
    Patent number: 4727000
    Abstract: X-ray dispersive and reflective structures and materials are provided which exhibit at least one third of the theoretical integral reflection coefficient for the structures in the range of interest without fluorescence or absorption edges. The materials can be thermally activated to control the desired properties, during or post deposition. The structures can be deposited by ion beam absorption techniques to form the structures in a precise manner. The index of the refraction of the structures can be continuously varying throughout the structures.
    Type: Grant
    Filed: June 18, 1986
    Date of Patent: February 23, 1988
    Assignee: Ovonic Synthetic Materials Co., Inc.
    Inventors: Stanford R. Ovshinsky, John Keem, Steven A. Flessa, James L. Wood, Keith L. Hart, Lennard Sztaba
  • X-ray dispersive and reflective structures and method of making the structures
    Patent number: 4693933
    Abstract: X-ray dispersive and reflective structures and materials are provided which exhibit improved resolution and reflectivity in specific ranges of interest without substantial fluorescence or absorption edges. The structures are formed of metallic and non-metallic layer pairs and can include a buffer layer between each layer to prevent interdiffusion to stabilize the structures. The materials can be thermally activated to control the desired properties, during or post deposition. The structures can be deposited by ion beam absorption techniques to form the structures in a precise manner. The index of the refraction of the structures can be continuously varying throughout the structures.
    Type: Grant
    Filed: October 31, 1983
    Date of Patent: September 15, 1987
    Assignee: Ovonic Synthetic Materials Company, Inc.
    Inventors: John E. Keem, Stanford R. Ovshinsky, Steven A. Flessa, James L. Wood, Keith L. Hart, Lennard Sztaba
  • Multiple wavelength X-ray dispersive devices and method of making the devices
    Patent number: 4675889
    Abstract: Multiple wavelength X-ray dispersive devices and method of forming them are provided which reflect at least two wavelengths of interest at the same or different angles. The devices include a plurality of layer sets formed on one another, each set having at least two units. At least one unit includes at least two layers having a first d spacing and the second unit has at least one layer with a second d spacing. A plurality of one or both of the units can also be provided in each layer set.
    Type: Grant
    Filed: July 8, 1985
    Date of Patent: June 23, 1987
    Assignee: Ovonic Synthetic Materials Company, Inc.
    Inventors: James L. Wood, Nicola J. Grupido, Keith L. Hart, John E. Keem