Patents by Inventor Keith Welsh

Keith Welsh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6626569
    Abstract: An image-based quality assurance (IBQA) system is provided for performing quality assurance testing of a medical linear accelerator photon beam. The IBQA system includes an imaging phantom integrated with an automated image analysis system. The imaging phantom comprises a set of fixed and rotatable reference objects which, when radiographed, set the orientation of the phantom, determine magnification factors and measure spatial distortions. The imaging phantom includes a chamber for inserting a radiographic film to record an image of the photon beam. The sampled image is digitized and made available to the automated image analysis system for measuring quality assurance parameters from the sampled image. The measured beam quality parameters are compared with baseline parameter values to determine whether they fall within prescribed specifications.
    Type: Grant
    Filed: May 30, 2001
    Date of Patent: September 30, 2003
    Assignee: The Research Foundation of Suny
    Inventors: Lawrence E. Reinstein, Keith Welsh
  • Publication number: 20020181660
    Abstract: An image-based quality assurance (IBQA) system is provided for performing quality assurance testing of a medical linear accelerator photon beam. The IBQA system includes an imaging phantom integrated with an automated image analysis system. The imaging phantom comprises a set of fixed and rotatable reference objects which, when radiographed, set the orientation of the phantom, determine magnification factors and measure spatial distortions. The imaging phantom includes a chamber for inserting a radiographic film to record an image of the photon beam. The sampled image is digitized and made available to the automated image analysis system for measuring quality assurance parameters from the sampled image. The measured beam quality parameters are compared with baseline parameter values to determine whether they fall within prescribed specifications.
    Type: Application
    Filed: May 30, 2001
    Publication date: December 5, 2002
    Inventors: Lawrence E. Reinstein, Keith Welsh