Patents by Inventor Keizo Kakitani

Keizo Kakitani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • FABRICATION METHOD OF IC INLET, ID TAG, ID TAG READER AND METHOD OF READING DATA THEREOF
    Publication number: 20090283599
    Abstract: A method accurately inspects whether an IC inlet to be inspected is non-defective or defective in a state in which a large number of IC inlets are formed over an insulating film. The inspection of IC inlets formed over an insulating film is performed by transmitting microwaves to the IC inlets from antennas. To selectively irradiate the microwaves to only one IC inlet to be inspected out of a large number of IC inlets that are formed over the insulating film, a radio-wave absorbing plate is inserted between the insulating film and the antennas, and the microwaves are irradiated to the IC inlet through a slit formed in the radio-wave absorbing plate. The radio-wave absorbing plate is configured such that the slit, which is substantially equal to the IC inlet in size, is formed in a portion of a planar plate that is formed of a radio-wave absorber.
    Type: Application
    Filed: July 30, 2009
    Publication date: November 19, 2009
    Inventors: Michio OKAMOTO, Hisao Yamagata, Nobuo Murakami, Keizo Kakitani, Hidehiro Fujiwara, Takeshi Saitou
  • Fabrication method of IC inlet, ID tag, ID tag reader and method of reading date thereof
    Publication number: 20060258025
    Abstract: A method accurately inspects whether an IC inlet to be inspected is non-defective or defective in a state in which a large number of IC inlets are formed over an insulating film. The inspection of IC inlets formed over an insulating film is performed by transmitting microwaves to the IC inlets from antennas. To selectively irradiate the microwaves to only one IC inlet to be inspected out of a large number of IC inlets that are formed over the insulating film, a radio-wave absorbing plate is inserted between the insulating film and the antennas, and the microwaves are irradiated to the IC inlet through a slit formed in the radio-wave absorbing plate. The radio-wave absorbing plate is configured such that the slit, which is substantially equal to the IC inlet in size, is formed in a portion of a planar plate that is formed of a radio-wave absorber.
    Type: Application
    Filed: July 24, 2006
    Publication date: November 16, 2006
    Inventors: Michio Okamoto, Hisao Yamagata, Nobuo Murakami, Keizo Kakitani, Hidehiro Fujiwara, Takeshi Saitou
  • Fabrication method of IC inlet, ID tag, ID tag reader and method of reading data thereof
    Publication number: 20040253818
    Abstract: A method accurately inspects whether an IC inlet to be inspected is non-defective or defective in a state in which a large number of IC inlets are formed over an insulating film. The inspection of IC inlets formed over an insulating film is performed by transmitting microwaves to the IC inlets from antennas. To selectively irradiate the microwaves to only one IC inlet to be inspected out of a large number of IC inlets that are formed over the insulating film, a radio-wave absorbing plate is inserted between the insulating film and the antennas, and the microwaves are irradiated to the IC inlet through a slit formed in the radio-wave absorbing plate. The radio-wave absorbing plate is configured such that the slit, which is substantially equal to the IC inlet in size, is formed in a portion of a planar plate that is formed of a radio-wave absorber.
    Type: Application
    Filed: January 9, 2004
    Publication date: December 16, 2004
    Inventors: Michio Okamoto, Hisao Yamagata, Nobuo Murakami, Keizo Kakitani, Hidehiro Fujiwara, Takeshi Saitou