Abstract: A method for assisting launch of a machine learning model includes: acquiring a model file from offline training of the machine learning model; determining a training data table used in a model training process by analyzing the model file; creating in an online database an online data table having consistent table information with the training data table; and importing at least a part of offline data into the online data table.

Abstract: A static memory cell capable of balancing bit line leakage currents is characterized by including a 1st PMOS transistor, a 2nd PMOS transistor, a 1st NMOS transistor, a 2nd NMOS transistor, a 3rd NMOS transistor, a 4th NMOS transistor, a 5th NMOS transistor, a 6th NMOS transistor, a 7th NMOS transistor, an 8th NMOS transistor, a write word line, a read word line, a read bit line, an inverted read bit line, a write bit line and an inverted write bit line. The 1st NMOS transistor, the 2nd NMOS transistor, the 3rd NMOS transistor and the 4th NMOS transistor are all normal threshold NMOS transistors. The 1st PMOS transistor and the 2nd PMOS transistor are both low threshold PMOS transistors. The 5th NMOS transistor, the 6th NMOS transistor, the 7th NMOS transistor and the 8th NMOS transistor are all low threshold NMOS transistors. The static memory cell has the advantages of high read operation speed, low power consumption and high stability under low operating voltage conditions.

Abstract: A static memory cell capable of balancing bit line leakage currents is characterized by including a 1st PMOS transistor, a 2nd PMOS transistor, a 1st NMOS transistor, a 2nd NMOS transistor, a 3rd NMOS transistor, a 4th NMOS transistor, a 5th NMOS transistor, a 6th NMOS transistor, a 7th NMOS transistor, an 8th NMOS transistor, a write word line, a read word line, a read bit line, an inverted read bit line, a write bit line and an inverted write bit line. The 1st NMOS transistor, the 2nd NMOS transistor, the 3rd NMOS transistor and the 4th NMOS transistor are all normal threshold NMOS transistors. The 1st PMOS transistor and the 2nd PMOS transistor are both low threshold PMOS transistors. The 5th NMOS transistor, the 6th NMOS transistor, the 7th NMOS transistor and the 8th NMOS transistor are all low threshold NMOS transistors. The static memory cell has the advantages of high read operation speed, low power consumption and high stability under low operating voltage conditions.

Abstract: The present invention discloses a static RAM for defensive differential power consumption analysis, comprising a replica bit-line circuit, a decoder, an address latch circuit, a clock circuit, n-bit memory arrays, n-bit data selectors, n-bit input circuit and n-bit output circuits; the output circuits comprises a sensitivity amplifier and a data latch circuit; the 1st PMOS tube, the 2nd PMOS tube, the 3rd PMOS tube, the 4th PMOS tube, the 5th PMOS tube, the 6th PMOS tube, the 7th PMOS tube, the 1st NMOS tube, the 2nd NMOS tube, the 3rd NMOS tube, the 4th NMOS tube and the 5th NMOS tube constitute the sensitivity amplifier; two NOR gates, the 8th PMOS tube, the 9th PMOS tube, the 10th PMOS tube, the 11th PMOS tube, the 6th NMOS tube, the 7th NMOS tube, the 8th NMOS tube, the 9th NMOS tube and the 10th NMOS tube constitute the data latch circuit; the present invention is characterized in that energy consumption in each working cycle is basically identical, which is provided with higher capability in defense of

Abstract: The present invention discloses a replica bit-line circuit, comprising a replica unit, the 1st inverter, the 2nd inverter, the 3rd inverter, the 4th inverter, the 5th inverter, the 6th inverter, the 7th inverter, the 8th inverter, the 9th inverter, the 1st NAND gate, the 2nd NAND gate, the 3rd NAND gate, the 1st NOR gate, the 2nd NOR gate and the 1st PMOS tube; the 2nd NOR gate is provided with the 1st input terminal, the 2nd input terminal, a set terminal and an output terminal; advantages of the present invention are stated as follows: It can inhibit feedback oscillation incurred by replica bit-line and replica wordline signal to obtain accurate wordline control signal; it can save switching power consumption of memory array by 53.7% under the power voltage of 1.2V.

Abstract: The present invention discloses a replica bit-line circuit, comprising a replica unit, the 1st inverter, the 2nd inverter, the 3rd inverter, the 4th inverter, the 5th inverter, the 6th inverter, the 7th inverter, the 8th inverter, the 9th inverter, the 1st NAND gate, the 2nd NAND gate, the 3rd NAND gate, the 1st NOR gate, the 2nd NOR gate and the 1st PMOS tube; the 2nd NOR gate is provided with the 1st input terminal, the 2nd input terminal, a set terminal and an output terminal; advantages of the present invention are stated as follows: It can inhibit feedback oscillation incurred by replica bit-line and replica wordline signal to obtain accurate wordline control signal; it can save switching power consumption of memory array by 53.7% under the power voltage of 1.2V.

Abstract: The present invention discloses a static RAM for defensive differential power consumption analysis, comprising a replica bit-line circuit, a decoder, an address latch circuit, a clock circuit, n-bit memory arrays, n-bit data selectors, n-bit input circuit and n-bit output circuits; the output circuits comprises a sensitivity amplifier and a data latch circuit; the 1st PMOS tube, the 2nd PMOS tube, the 3rd PMOS tube, the 4th PMOS tube, the 5th PMOS tube, the 6th PMOS tube, the 7th PMOS tube, the 1st NMOS tube, the 2nd NMOS tube, the 3rd NMOS tube, the 4th NMOS tube and the 5th NMOS tube constitute the sensitivity amplifier; two NOR gates, the 8th PMOS tube, the 9th PMOS tube, the 10th PMOS tube, the 11th PMOS tube, the 6th NMOS tube, the 7th NMOS tube, the 8th NMOS tube, the 9th NMOS tube and the 10th NMOS tube constitute the data latch circuit; the present invention is characterized in that energy consumption in each working cycle is basically identical, which is provided with higher capability in defense of