Patents by Inventor Kelly Barry

Kelly Barry has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Selection of wavelengths for integrated circuit optical metrology
    Patent number: 7474993
    Abstract: Specific wavelengths to use in optical metrology of an integrated circuit can be selected using one or more selection criteria and termination criteria. Wavelengths are selected using the selection criteria, and the selection of wavelengths is iterated until the termination criteria are met.
    Type: Grant
    Filed: April 20, 2007
    Date of Patent: January 6, 2009
    Assignee: Timbre Technologies, Inc.
    Inventors: Srinivas Doddi, Lawrence Lane, Vi Vuong, Michael Laughery, Junwei Bao, Kelly Barry, Nickhil Jakatdar, Emmanuel Drege
  • Selection of wavelengths for integrated circuit optical metrology
    Publication number: 20070198211
    Abstract: Specific wavelengths to use in optical metrology of an integrated circuit can be selected using one or more selection criteria and termination criteria. Wavelengths are selected using the selection criteria, and the selection of wavelengths is iterated until the termination criteria are met.
    Type: Application
    Filed: April 20, 2007
    Publication date: August 23, 2007
    Applicant: Timbre Technologies, Inc.
    Inventors: Srinivas Doddi, Lawrence Lane, Vi Vuong, Michael Laughery, Junwei Bao, Kelly Barry, Nickhil Jakatdar, Emmanuel Drege
  • Selection of wavelengths for integrated circuit optical metrology
    Patent number: 7216045
    Abstract: Specific wavelengths to use in optical metrology of an integrated circuit can be selected using one or more selection criteria and termination criteria. Wavelengths are selected using the selection criteria, and the selection of wavelengths is iterated until the termination criteria are met.
    Type: Grant
    Filed: June 3, 2002
    Date of Patent: May 8, 2007
    Assignee: Timbre Technologies, Inc.
    Inventors: Srinivas Doddi, Lawrence Lane, Vi Vuong, Mike Laughery, Junwei Bao, Kelly Barry, Nickhil Jakatdar, Emmanuel Drege
  • Selection of wavelengths for integrated circuit optical metrology
    Publication number: 20030225535
    Abstract: Specific wavelengths to use in optical metrology of an integrated circuit can be selected using one or more selection criteria and termination criteria. Wavelengths are selected using the selection criteria, and the selection of wavelengths is iterated until the termination criteria are met.
    Type: Application
    Filed: June 3, 2002
    Publication date: December 4, 2003
    Inventors: Srinivas Doddi, Lawrence Lane, Vi Vuong, Mike Laughery, Junwei Bao, Kelly Barry, Nickhil Jakatdar, Emmanuel Drege