Patents by Inventor Kelvon Naifeng Li

Kelvon Naifeng Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Analysis of deep-level cause of fault of storage management
    Patent number: 11704186
    Abstract: Storage management is performed. For example, a computing device may determine that a fault belongs to one of a plurality of predefined fault categories based on description information of the fault of a storage system. Then, the computing device may determine at least one fault cause associated with the fault category at a first level of a hierarchical structure of predetermined fault causes. Further, the computing device may determine a first fault cause that causes the fault among the at least one fault cause. After that, the computing device may determine a target fault cause at the deepest level that causes the fault based on the first fault cause. As a result, the root cause of a fault of a storage system may be accurately and efficiently determined, thereby providing the possibility of fundamentally eliminating the fault.
    Type: Grant
    Filed: December 15, 2020
    Date of Patent: July 18, 2023
    Assignee: EMC IP HOLDING COMPANY LLC
    Inventor: Kelvon Naifeng Li
  • ANALYSIS OF DEEP-LEVEL CAUSE OF FAULT OF STORAGE MANAGEMENT
    Publication number: 20220138032
    Abstract: Storage management is performed. For example, a computing device may determine that a fault belongs to one of a plurality of predefined fault categories based on description information of the fault of a storage system. Then, the computing device may determine at least one fault cause associated with the fault category at a first level of a hierarchical structure of predetermined fault causes. Further, the computing device may determine a first fault cause that causes the fault among the at least one fault cause. After that, the computing device may determine a target fault cause at the deepest level that causes the fault based on the first fault cause. As a result, the root cause of a fault of a storage system may be accurately and efficiently determined, thereby providing the possibility of fundamentally eliminating the fault.
    Type: Application
    Filed: December 15, 2020
    Publication date: May 5, 2022
    Inventor: Kelvon Naifeng Li