Abstract: A system for generating a pruned diagnostic list of potential bridging faults in a circuit includes a pattern generator operable to generate test patterns for testing a circuit and a tester in communication with the pattern generator that is operable to apply the test patterns to the circuit and generate a plurality of resultant vectors. The system also includes a stuck-at fault dictionary including a list of a plurality of nets of the circuit, each net having at least one resultant vector that indicates a potential stuck-at fault at the net. The system further includes a test analysis tool in communication with the pattern generator and the tester, the test analysis tool operable to create an initial logical diagnostic list of tested nets of the circuit associated with the potential stuck-at faults indicated in the stuck-at fault dictionary, the initial logical diagnostic list created in response to the generated plurality of resultant vectors.