Patents by Inventor Ken-ichi Setsukinai

Ken-ichi Setsukinai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD FOR MEASURING HYPOCHLORITE ION
    Publication number: 20110033944
    Abstract: A method for measuring hypochlorite ion, which comprises the steps of: (A) reacting, with hypochlorite ion, a compound represented by the following general formula (I): wherein R1 represents a 2-carboxyphenyl group which may be substituted; R2 represents a phenyl group which is substituted with a substituted or unsubstituted amino group; X1 and X2 each independently represents either hydrogen atom or a halogen atom; or a salt thereof; and (B) measuring fluorescence of a dearylated compound generated in the aforementioned step (A) or a salt thereof.
    Type: Application
    Filed: October 22, 2010
    Publication date: February 10, 2011
    Applicants: SEKISUI MEDICAL CO., LTD.
    Inventors: Ken-ichi SETSUKINAI, Yasuteru URANO, Tetsuo NAGANO
  • METHOD FOR MEASURING HYPOCHLORITE ION
    Publication number: 20090263910
    Abstract: A method for measuring hypochlorite ion, which comprises the steps of: (A) reacting, with hypochlorite ion, a compound represented by the following general formula (I): wherein R1 represents a 2-carboxyphenyl group which may be substituted; R2 represents a phenyl group which is substituted with a substituted or unsubstituted amino group; X1 and X2 each independently represents either hydrogen atom or a halogen atom; or a salt thereof; and (B) measuring fluorescence of a dearylated compound generated in the aforementioned step (A) or a salt thereof.
    Type: Application
    Filed: June 29, 2009
    Publication date: October 22, 2009
    Applicants: DAIICHI PURE CHEMICALS CO., LTD
    Inventors: Ken-Ichi Setsukinai, Yasuteru Urano, Tetsuo Nagano
  • METHOD FOR MEASURING HYPOCHLORITE ION
    Publication number: 20080188006
    Abstract: A method for measuring hypochlorite ion, which comprises the steps of. (A) reacting, with hypochlorite ion, a compound represented by the following general formula (I): wherein R1 represents a 2-carboxyphenyl group which may be substituted; R2 represents a phenyl group which is substituted with a substituted or unsubstituted amino group; X1 and X2 each independently represents either hydrogen atom or a halogen atom; or a salt thereof; and (B) measuring fluorescence of a dearylated compound generated in the aforementioned step (A) or a salt thereof.
    Type: Application
    Filed: April 9, 2008
    Publication date: August 7, 2008
    Applicants: TETSUO NAGANO, DAIICHI PURE CHEMICALS CO., LTD.
    Inventors: Ken-ichi SETSUKINAI, Yasuteru URANO, Tetsuo NAGANO
  • Method for measuring hypochlorite ion
    Patent number: 7378282
    Abstract: A method for measuring hypochlorite ion, which comprises the steps of: (A) reacting, with hypochlorite ion, a compound represented by the following general formula (I): wherein R1 represents a 2-carboxyphenyl group which may be substituted; R2 represents a phenyl group which is substituted with a substituted or unsubstituted amino group; X1 and X2 each independently represents either hydrogen atom or a halogen atom; or a salt thereof; and (B) measuring fluorescence of a dearylated compound generated in the aforementioned step (A) or a salt thereof.
    Type: Grant
    Filed: May 14, 2003
    Date of Patent: May 27, 2008
    Assignees: Daiichi Pure Chemicals Co., Ltd.
    Inventors: Ken-ichi Setsukinai, Yasuteru Urano, Tetsuo Nagano
  • Reagents for the measurement of peroxynitrites
    Publication number: 20060211122
    Abstract: A reagent for measuring peroxynitrite comprising a compound represented by the following general formula (I): wherein R1 represents an amino group, or hydroxy group; R2 represents a 2-carboxyphenyl group; and X1 and X2 independently represent hydrogen atom, or a halogen atom (e.g., 2-[6-(4?-hydroxy)phenoxy -3H-xanthen-3-on-9-yl]benzoic acid, or 2-[6-(4?-amino)phenoxy-3H-xanthen-3-on-9-yl]benzoic acid) or a salt thereof, which does not react with superoxide or nitrogen monoxide, a precursor of peroxynitrite, and specifically reacts with peroxynitrite.
    Type: Application
    Filed: October 15, 2003
    Publication date: September 21, 2006
    Inventors: Tetsuo Nagano, Ken-ichi Setsukinai, Yasuteru Urano
  • Reagents for the quantitation of active oxygen
    Patent number: 7087766
    Abstract: A compound represented by general formula (I) or (II) or a salt thereof and an agent for measurement of a reactive oxygen comprising said compound or a salt thereof: wherein R1 and R2 independently represent an aryl group which may be substituted, e.g., a phenyl group substituted with an amino group or a hydroxy group, and R3 represents a 2-carboxyphenyl group which may be substituted.
    Type: Grant
    Filed: February 28, 2001
    Date of Patent: August 8, 2006
    Assignees: Daiichi Pure Chemicals Co., Ltd.
    Inventors: Tetsuo Nagano, Yasuteru Urano, Ken-ichi Setsukinai
  • Method for measuring hypochlorite ion
    Publication number: 20040229371
    Abstract: A method for measuring hypochlorite ion, which comprises the steps of:
    Type: Application
    Filed: May 14, 2003
    Publication date: November 18, 2004
    Applicants: Tetsuo NAGANO, Daiichi Pure Chemicals Co., Ltd.
    Inventors: Ken-ichi Setsukinai, Yasuteru Urano, Tetsuo Nagano
  • Reagents for the quantitation of active oxygen
    Publication number: 20030153027
    Abstract: A compound represented by general formula (I) or (II) or a salt thereof and an agent for measurement of a reactive oxygen comprising said compound or a salt thereof: 1
    Type: Application
    Filed: February 3, 2003
    Publication date: August 14, 2003
    Inventors: Tetsuo Nagano, Yasuteru Urano, Ken-ichi Setsukinai