Patents by Inventor Ken-ichiro Hatake

Ken-ichiro Hatake has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test apparatus and test method
    Patent number: 7471092
    Abstract: A test apparatus to test a device under test (DUT) to which a reference voltage of a predetermined high voltage is supplied is provided.
    Type: Grant
    Filed: January 26, 2007
    Date of Patent: December 30, 2008
    Assignee: Advantest Corporation
    Inventors: Seiji Amanuma, Ken-ichiro Hatake
  • Test Apparatus and test method
    Publication number: 20070194795
    Abstract: A test apparatus to test a device under test (DUT) to which a reference voltage of a predetermined high voltage is supplied is provided.
    Type: Application
    Filed: January 26, 2007
    Publication date: August 23, 2007
    Applicant: Advantest Corporation
    Inventors: Seiji Amanuma, Ken-Ichiro Hatake