Abstract: The present disclosure relates to a semiconductor memory device and a fabricating method thereof, and the semiconductor memory device includes a substrate, bit lines, plugs and a spacer structure. The bit lines are separately disposed on the substrate, and the plugs are also disposed on the substrate to alternately arrange with the bit lines. The spacer structure is disposed on the substrate, between each of the bit lines and each of the plugs. The spacer structure includes a first air gap layer, a first spacer and a second air gap layer, and the first air gap layer, the first spacer and the second air gap layer are sequentially stacked between sidewalls of the bit lines and the plugs. Therefore, two air gap layers may be formed between the bit lines and the storage node contacts to improve the delay between the resistor and the capacitor.

Abstract: A method of manufacturing a semiconductor memory device is provided in the present invention, including steps of providing a substrate, forming word lines extending in a first direction in said substrate, forming bit lines extending in a second direction over said word lines, forming partition structures between said bit lines and right above said word lines, forming storage node contacts in spaces defined by said bit lines and said partition structures, wherein a portion of said storage node contact protruding from top surfaces of said bit lines and said partition structures is contact pad, forming a silicon nitride liner on said contact pads, said bit lines and said partition structures, and forming a silicon oxide layer on said silicon nitride liner.

Abstract: A semiconductor memory device is provided in the present invention, including a substrate, word lines in the substrate, bit lines over the word lines, partition structures between the bit lines and right above the word lines, storage node contacts in spaces defined by the bit lines and the partition structures and electrically connecting with the substrate, wherein a portion of the storage node contact protruding from top surfaces of the bit lines and the partition structures is contact pad, and contact pad isolation structures on the partition structures and between the contact pads, wherein the contact pad isolation structure includes outer silicon nitride layers and inner silicon oxide layers.

Abstract: The present disclosure relates to a semiconductor memory device and a fabricating method thereof, and the semiconductor memory device includes a substrate, bit lines, plugs and a spacer structure. The bit lines are separately disposed on the substrate, and the plugs are also disposed on the substrate to alternately arrange with the bit lines. The spacer structure is disposed on the substrate, between each of the bit lines and each of the plugs. The spacer structure includes a first air gap layer, a first spacer and a second air gap layer, and the first air gap layer, the first spacer and the second air gap layer are sequentially stacked between sidewalls of the bit lines and the plugs. Therefore, two air gap layers may be formed between the bit lines and the storage node contacts to improve the delay between the resistor and the capacitor.

Abstract: Embodiments of devices and methods for evaluating tissue are disclosed. In one embodiment, a method for measuring a characteristic of a tissue may include passing a current through the tissue, measuring a signal corresponding to the voltage resulting from passing the current through the tissue, analyzing current passed through the tissue and resulting voltage to determine the electrical characteristics of the tissue; and analyzing the electrical characteristics of the tissue to determine a status of the tissue. Methods for achieving relatively constant sensor application pressure are disclosed.

Abstract: A device for cold rolling a thread on a tubular support member of a rotary shouldered thread connection includes obtaining an original root depth of a thread root, cold rolling the thread until a minimum increased root depth tolerance is achieved.

Abstract: A virtual integration test system includes a computer configured to receive data indicative of measured dimensions of as-built components. The computer is also configured to perform a motion mechanics simulation on at least two deformation-uncritical components of the as-built components and perform a deformation mechanics simulation on at least one deformation-critical component of the as-built components. The motion mechanics simulation and the deformation mechanics simulation are performed concurrently within a simulation environment. In addition, the computer is configured to determine interface and integration compatibility of the as-built components based on the motion mechanics simulation and the deformation mechanics simulation, and to output an output signal indicative of the interface and integration compatibility of the as-built components.

Abstract: A system includes a data storage device containing encrypted data to be decrypted, and a VZ storage device containing a key material for decrypting data, wherein the VZ storage device decrypts the encrypted data by consuming a portion of the key material and stores the decrypted data in the consumed portion of the key material.

Abstract: Embodiments of devices and methods for evaluating tissue are disclosed. In one embodiment, a method for measuring a characteristic of a tissue may include passing a current through the tissue, measuring a signal corresponding to the voltage resulting from passing the current through the tissue, analyzing current passed through the tissue and resulting voltage to determine the electrical characteristics of the tissue; and analyzing the electrical characteristics of the tissue to determine a status of the tissue. Disposable sensors are disclosed.

Abstract: A semiconductor memory device is provided in the present invention, including a substrate, word lines in the substrate, bit lines over the word lines, partition structures between the bit lines and right above the word lines, storage node contacts in spaces defined by the bit lines and the partition structures and electrically connecting with the substrate, wherein a portion of the storage node contact protruding from top surfaces of the bit lines and the partition structures is contact pad, and contact pad isolation structures on the partition structures and between the contact pads, wherein the contact pad isolation structure includes outer silicon nitride layers and inner silicon oxide layers.

Abstract: A computer-aided engineering (CAE) toolkit is disclosed that streamlines and automates aspects of a CAE simulation to validate the designs of pressure-controlling components, such as BOP rams. The CAE toolkit enables a designer to provide a model of a pressure-controlling component, and to provide property values that describe aspects of the system to be modeled. Based on these inputs, the CAE toolkit generates a model for the system that includes the pressure-controlling component, as well as any other components that will be part of the simulation. The CAE toolkit can automatically generate a finite element analysis (FEA) model from the system model, and then use the FEA model to perform a simulation of the pressure-controlling component during operation. The CAE toolkit enables a designer with no training or experience with CAE or FEA techniques to perform and automate simulations of the operation of a pressure-controlling component design.

Abstract: A multi-disciplinary optimization (MDO) framework and workflow facilitates analysis and optimization of set of designs of a pressure-controlling component. The MDO workflow generally enables design workflow integration and automation, which can improve engineering efficiency, and enables automated optimization within the workflow automation, which facilitates performance and reliability improvement for product development. The MDO workflow enables the integration of computer-aided design (CAD), finite element analysis (FEA), digital manufacturing simulation (DMS), and optimization packages to facilitate testing and optimization of a set of pressure-controlling component designs. As such, the MDO framework and workflow improve the efficiency of the design process by providing a scalable solution for automating aspects of the design process for a set of designs of a pressure-controlling component, which may represent a product family or a set of competing alternative designs.

Abstract: Embodiments of devices and methods for evaluating tissue are disclosed. In one embodiment, a method for measuring a characteristic of a tissue may include passing a current through the tissue, measuring a signal corresponding to the voltage resulting from passing the current through the tissue, analyzing current passed through the tissue and resulting voltage to determine the electrical characteristics of the tissue; and analyzing the electrical characteristics of the tissue to determine a status of the tissue. Disposable sensors are disclosed.

Abstract: An apparatus that is usable with a well includes a housing and a body. The housing includes an inlet and an outlet, and a fluid flow is communicated between the inlet and outlet. The body disposed inside the housing to form a fluid restriction for the fluid flow. The body includes an opening therethrough to divert a first portion of the fluid flow into a first fluid flow path; and a first surface to at least partially define the first fluid flow path. The body is adapted to move to control fluid communication through the first flow path based at least in part on at least one fluid property of the flow.

Abstract: A pump rod can include a body that includes a longitudinal axis; and a pin at an end of the body where the pin includes threads where the threads include tangential elliptical roots.

Abstract: A thread structure in accordance to one or more embodiments includes a thread extending helically along a portion of a bit body in spaced thread turns, the thread having a crest extending between a first flank and a second flank and a root extending between the thread turns, the root having a curvature defined by a portion of an ellipse tangentially adjoining the first and second flank at respective flank transition points, the ellipse having a major axis extending parallel to the axis and a minor axis extending perpendicular to the major axis and through a root bottom.

Abstract: An integrated quantum random noise source includes a substrate, an optical oscillator that may be integral to the substrate coupled by an optical waveguide to an optical directional coupler. The optical directional coupler has two outputs that are coupled by optical waveguides to a pair of photodetectors that are part of a balanced photodetector. The balanced photodetector in response outputs an analogue signal proportional to the difference in photocurrents of the two photodetectors. The analogue output signal from the balanced photodetector is a random Gaussian-distributed signal representative of quadrature measurements on the quantum vacuum state of light. The random noise source can be coupled other apparatus to provide a source of random bits.

Abstract: Embodiments of devices and methods for evaluating tissue are disclosed. In one embodiment, a method for measuring a characteristic of a tissue may include passing a current through the tissue, measuring a signal corresponding to the voltage resulting from passing the current through the tissue, analyzing current passed through the tissue and resulting voltage to determine the electrical characteristics of the tissue; and analyzing the electrical characteristics of the tissue to determine a status of the tissue. Disposable sensors are disclosed.

Abstract: A thread structure in accordance to one or more embodiments includes a thread extending helically along a portion of a bit body in spaced thread turns, the thread having a crest extending between a first flank and a second flank and a root extending between the thread turns, the root having a curvature defined by a portion of an ellipse tangentially adjoining the first and second flank at respective flank transition points, the ellipse having a major axis extending parallel to the axis and a minor axis extending perpendicular to the major axis and through a root bottom.

Abstract: A device for cold rolling a thread on a tubular support member of a rotary shouldered thread connection includes obtaining an original root depth of a thread root, cold rolling the thread until a minimum increased root depth tolerance is achieved.