Abstract: Oscillation frequency measurements for trimming oscillators on an integrated circuit device are performed entirely on the device. The oscillation frequency measurements utilize a reference clock. Some measurements count periods of the oscillator signal independently of the reference clock, and some measurements count periods of the reference clock independently of the oscillator signal. After one oscillator on the device has been trimmed, that trimmed oscillator may then be used to make oscillation frequency measurements for trimming another oscillator on the device.

Abstract: A method for testing linearity of an ADC, comprising receiving a trigger signal indicating an ADC input voltage step adjustment, reading an ADC output sample upon receiving the trigger signal, wherein the ADC output sample has a value range of N integer values that correspond to N discrete ADC output codes, computing a histogram of code occurrences for M consecutive ADC output codes, wherein the histogram comprises M number of bins corresponding to the M consecutive ADC output codes, and wherein M is less than N, updating a DNL value and an INL value according to the histogram at an interval of K number of ADC output sample readings, and shifting the histogram by one ADC output code after updating the DNL and the INL values.

Abstract: A method for testing linearity of an ADC, comprising receiving a trigger signal indicating an ADC input voltage step adjustment, reading an ADC output sample upon receiving the trigger signal, wherein the ADC output sample has a value range of N integer values that correspond to N discrete ADC output codes, computing a histogram of code occurrences for M consecutive ADC output codes, wherein the histogram comprises M number of bins corresponding to the M consecutive ADC output codes, and wherein M is less than N, updating a DNL value and an INL value according to the histogram at an interval of K number of ADC output sample readings, and shifting the histogram by one ADC output code after updating the DNL and the INL values.

Abstract: Oscillation frequency measurements for trimming oscillators on an integrated circuit device are performed entirely on the device. The oscillation frequency measurements utilize a reference clock. Some measurements count periods of the oscillator signal independently of the reference clock, and some measurements count periods of the reference clock independently of the oscillator signal. After one oscillator on the device has been trimmed, that trimmed oscillator may then be used to make oscillation frequency measurements for trimming another oscillator on the device.