Abstract: A communication (on-board) device 10 of the invention has: a communication unit 110 communicating with a portable device 30; an unconfirmed information obtaining unit 120 obtaining unconfirmed information from the portable device 30 which a user has not confirmed at the portable device 30 at the time of communication establishment by the communication unit 110; and an information output unit 150 displaying or outputting audibly the obtained unconfirmed information. In this case, it is preferable that unread mail information regarding one or more electronic mails unread at the time of the communication establishment and/or missed call information regarding one or more missed calls received before the communication has been established be obtained as the unconfirmed information.

Abstract: A vehicle-mounted device or the like is provided by which a content of an electronic mail can be notified by a driver without disturbing safety driving. A vehicle-mounted device 10 has: a communication unit 110 which communicates with a portable device having an electronic mail function; an electronic mail obtaining unit 120 which obtains from the portable device 30 an electronic mail received by the portable device 30; a mail output length calculation unit 150 which calculates mail output length which is output length of the obtained electronic mail text; a destination setting unit 180 which sets a destination; and a text output unit 220 which displays or outputs audibly the electronic mail text based on the mail output length calculated by the mail output length calculation unit 150 and a predetermined condition corresponding to the destination set by the destination setting unit 180.

Abstract: An on-board device 10 has: a communication unit 110 that carries out communication with a portable device 30 that has a transfer reservation function of place information indicating an arbitrary place; a place information acquisition unit 130 that acquires the place information from the portable device 30 after the communication is established; a place information determination unit 140 that determines a category of processing relating to the place information acquired by the place information acquisition unit 130; a place information processing unit 200 that at least registers a place or sets a destination using the place information based on the category determined by the place information determination unit 140; and a route guidance unit 180 that guides a route to a destination when the destination has been set.

Abstract: An on-board device 10 of the invention has: a destination setting unit 110 with which a destination is set; a route guidance unit 130 that provides route guidance for a vehicle until a parking location that corresponds to the destination; a destination information transmitter 140 that transmits destination information indicating the destination to a portable device 30; and an arrival confirmation information receiver 160 that receives from the portable device 30 arrival confirmation information indicating that the destination has been reached. The route guidance unit 130 ends the route guidance for the vehicle to the parking location when the destination information has been transmitted or the arrival confirmation information has been received.

Abstract: A scanning probe microscope performs first scanning movement of a probe in X and Y directions along a sample surface while controlling the position of the probe in a Z direction by an XYZ fine movement mechanism. Measurement information about the sample surface is obtained by a measurement section and displacement detection section during the first scanning. A probe movement path is determined for a second scanning that includes a measuring spot in which a measurement including a parallel direction component to the sample surface to be performed on the probe movement path is determined, on the basis of the measurement information about the sample surface. As a result of performing the measurement including the parallel direction component based on the second scanning wear of the probe is reduced and measurement reliability and simplified movement control of the scanning of the probe is enabled.

Abstract: A probe is made by attaching a carbon nanotube 12 to a mounting base end 13, which eliminates the effects of a carbon contamination film, to increase the bonding strength, increase the conductivity of the probe, and strengthen the bonding performance thereof by coating the entire circumference of the nanotube and the base with a coating film, rather than coating just one side. The work of mounting the carbon nanotube and mounting base end are performed under observation by a microscope. Further, the carbon contamination film 14 formed by an electron microscope is stripped off at a stage before bonding by the coating film.

Abstract: The probe tip movement control method of the scanning probe microscope is used for a scanning probe microscope provided with a cantilever 21 having a probe tip 20 facing a sample 12. The atomic force occurring between the probe tip and sample is measured when the probe tip scans the surface of the sample. X-, Y-, and Z-fine movement mechanisms 23, 29, and 30 are used to relatively change the positions of the probe tip and sample. It is possible to maintain a high measurement accuracy and enable scan movement of a probe tip on a sample surface by simple control when measuring a part having a gradient in measurement of an uneven shape on a sample surface.

Abstract: A scanning probe microscope has a cantilever with a probe facing a sample and a measurement section for measuring a physical quantity occurring between the probe and the sample when the probe scans a surface of the sample, holding the physical quantity constant to measure the surface of the sample. The above microscope further has a probe tilt mechanism, an optical microscope etc. for detecting a position of the probe when the probe is tilted, and a control section for setting the probe in a first tilt posture and second tilt posture, measuring a surface of the sample by the measurement section at each tilt posture, detecting the position of the probe at least at the second tilt posture by the optical microscope etc., and making a measurement location at the second tilt posture match with a measurement location at the first tilt posture for measurement.

Abstract: A probe replacement method for a scanning probe microscope for measuring the surface of a sample, having a cantilever (21) having a probe (20), and a measurement unit for measuring a physical quantity between the probe and sample. The scanning probe microscope is provided with a cantilever mount (22), a cantilever cassette (30), an XY stage (14) and Z stage (15) for moving the cantilever cassette, and an optical microscope (18). In a first step, a cantilever is selected from the cantilever cassette and is mounted on the cantilever mount. In a second step, an optical microscope is moved and the mounted cantilever is set in a prescribed position in the field of view after the cantilever is mounted in the scanning probe microscope. In the second step, a step is provided for moving the optical microscope side or the cantilever side and performing positional adjustment.

Abstract: A method of producing a probe by attaching a carbon nanotube etc. to a mounting base end and bonding it there using a carbon film etc., which method of producing a probe eliminates the effects of a carbon contamination film to increase the bonding strength, increases the conductivity of the probe, and strengthens the bonding performance by coating the entire circumference rather than coating one side, the probe, and a scanning probe microscope are provided. The method of producing a probe is a method of producing a probe comprised of a carbon nanotube 12, a mounting base ends 13 holding this carbon nanotube, and a coating film 17 bonding the carbon nanotube to a mounting base, comprising performing the mounting work of the carbon nanotube and mounting base end under observation by a microscope and stripping off the carbon contamination film 14 formed by an electron microscope at a stage before bonding by the coating film.

Abstract: The probe tip movement control method of the scanning probe microscope is used for a scanning probe microscope provided with a cantilever 21 having a probe tip 20 facing a sample 12. The atomic force occurring between the probe tip and sample is measured when the probe tip scans the surface of the sample. X-, Y-, and Z-fine movement mechanisms 23, 29, and 30 are used to relatively change the positions of the probe tip and sample. It is possible to maintain a high measurement accuracy and enable scan movement of a probe tip on a sample surface by simple control when measuring a part having a gradient in measurement of an uneven shape on a sample surface.

Abstract: A scanning probe microscope has a cantilever with a probe facing a sample and a measurement section for measuring a physical quantity occurring between the probe and the sample when the probe scans a surface of the sample, holding the physical quantity constant to measure the surface of the sample. The above microscope further has a probe tilt mechanism, an optical microscope etc. for detecting a position of the probe when the probe is tilted, and a control section for setting the probe in a first tilt posture and second tilt posture, measuring a surface of the sample by the measurement section at each tilt posture, detecting the position of the probe at least at the second tilt posture by the optical microscope etc., and making a measurement location at the second tilt posture match with a measurement location at the first tilt posture for measurement.

Abstract: This scanning probe microscope is provided with a cantilever with a probe tip facing a sample, a Z fine movement section for changing a distance between the sample and the probe tip, a XY scanning control section for providing relative displacement toward a sample surface between the sample and the probe tip, a displacement detecting means for detecting displacement arising in the cantilever, and a Z direction control section. In the configuration, when generating deformation in the cantilever due to a physical amount between the probe tip and the sample, the displacement detecting means detects the displacement of the cantilever, and the displacement of the cantilever is controlled to be a predetermined constant value. The scanning probe microscope further has a two frequency signals generating section for providing signals used to cause the probe tip to be moved in height direction by two frequencies to the Z fine movement section.

Abstract: This scanning probe microscope is provided with a cantilever with a probe tip facing a sample, a Z fine movement section for changing a distance between the sample and the probe tip, a XY scanning control section for providing relative displacement toward a sample surface between the sample and the probe tip, a displacement detecting means for detecting displacement arising in the cantilever, and a Z direction control section. In the configuration, when generating deformation in the cantilever due to a physical amount between the probe tip and the sample, the displacement detecting means detects the displacement of the cantilever, and the displacement of the cantilever is controlled to be a predetermined constant value. The scanning probe microscope further has a two frequency signals generating section for providing signals used to cause the probe tip to be moved in height direction by two frequencies to the Z fine movement section.

Abstract: An adhesive for biological tissue includeds: a glue agent and a cross-linking agent. The glue agent contains a recombinant human plasma protein as a main component. The cross-linking agent contains a bifunctional or multifunctional aldehyde as a main component.

Abstract: A scanning probe microscope is provided with a probe tip directed to a sample surface, an XYZ fine movement mechanism for providing a relative positional change between the sample and the probe tip, and a displacement detecting section for detecting the displacement of the probe tip. The scanning probe microscope measures the surface characteristic of the sample by using a control signal. This control signal is generated on a signal outputted from the displacement detecting section and is used for keeping a state of a mutual action generated between the sample and the probe tip identical to a predetermined state, while the probe tip scans the surface of the sample based on the operation of the XYZ fine movement mechanism.

Abstract: A fine movement mechanism unit is configured by a supporting member, two fixed sections fixed to this supporting member, two pairs of parallel-plate flexural sections disposed between the two fixed sections, an X fine movement mechanism, a Y fine movement mechanism, and a Z fine movement mechanism. The X fine movement mechanism has an X moving section movable in an X direction, connected to each of the two fixed sections through the two pairs of parallel-plate flexural sections, and two X direction piezoelectric actuators causing the X moving section to move. The Y fine movement mechanism arranged to the X moving section, has other two pairs of parallel-plate flexural sections, a Y moving section movable in the Y direction, connected to the X moving section through the other two pairs of parallel-plate flexural sections, and two Y direction piezoelectric actuators causing the Y moving section to move relatively to the X moving section.

Abstract: A stage unit used for moving a sample comprises a vertical stage for moving a sample stand in a vertical direction, a horizontal stage for moving the vertical stage in a horizontal direction. In the stage unit, the horizontal stage is fixed on a horizontal slide surface of a surface table and the vertical stage is slidably arranged on the slide surface. The vertical stage is coupled with the horizontal stage by means of plate springs having strong rigidity in the horizontal direction and weak rigidity in the vertical direction. The whole rigidity of the stage unit is determined only by the vertical stage and is not subject to the effect of the rigidity of the sections included in the horizontal stage and the rigidity of a driving section as to each axis direction. The rigidity of the stage unit can be increased. The standstill rigidity of the stage unit is determined only by the rigidity of the vertical stage. All stages of the stage unit are not piled up.

Abstract: This scanning probe microscope can accurately obtain information on surfaces of a sample when measuring the sample in a broad range from a slow scanning speed to a fast scanning speed. The scanning probe microscope comprises a cantilever (16) with a probe (15) at its tip, an optical lever mechanism (17,18) for measuring displacement of the cantilever (16), a mechanism for approaching/separating the cantilever against the sample, XY scanning circuit (21), and further comprises a Z axis piezoelectric element (14b) of a tripod for changing the distance between the cantilever and the sample, a control circuit (20) for controlling the distance between the cantilever and the sample to cause a displacement signal s1 obtained from the optical lever mechanism to be identical to a set value s0, and an adder (24) for adding a control signal from the control circuit and a signal based on the deviation between the displacement signal and the set value.

Abstract: A gas-permeable material with excellent compatibility with blood comprising polyurethane, polyurethaneurea, or the derivatives thereof is provided. The polyurethane or polyurethaneurea is obtained from a composition that comprises diisocyanate; polysiloxane containing terminal hydroxyl groups; and polyol or polyamine containing at least one tertiary amino gorup. The derivatives of the polyurethane or polyurethaneurea is obtained by the following steps of: converting the tertiary amino groups contained in the polyurethane or the polyurethaneurea to quarternary ammonium groups, and treating the polyurethane or the polyurethaneurea having quarternary ammonium groups with heparin.