Abstract: The present invention provides a method and apparatus for a programmable capacitor associated with an input/output pad in the semiconductor device. The apparatus includes a semiconductor die having an upper surface, a first capacitor deployed above the upper surface of the semiconductor die, a separation layer deployed above the first capacitor, and a bond pad deployed above the separation layer such that at least a portion of the bond pad lies above the first capacitor.

Abstract: An embodiment includes encoding parallel digital data into encoded and parallel digital data in an encoder and generating parallel test data in a pseudo-random binary sequence generator circuit. The encoded and parallel digital data is coupled through a multiplexer to be serialized in a serializer in a normal mode of operation and the parallel test data is coupled through the multiplexer to be serialized in the serializer in a test mode of operation. Encoded and serial digital data are transmitted to a transmission medium in the normal mode, and serial test data are transmitted to the transmission medium in the test mode. The encoder, the serializer, the sequence generator circuit, and the multiplexer may be fabricated in a single integrated circuit chip. The parallel test data may be parallel pseudo-random binary sequence data. The parallel digital data may include data to generate colors in a visual image.

Abstract: An embodiment includes encoding parallel digital data into encoded and parallel digital data in an encoder and generating parallel test data in a pseudo-random binary sequence generator circuit. The encoded and parallel digital data is coupled through a multiplexer to be serialized in a serializer in a normal mode of operation and the parallel test data is coupled through the multiplexer to be serialized in the serializer in a test mode of operation. Encoded and serial digital data are transmitted to a transmission medium in the normal mode, and serial test data are transmitted to the transmission medium in the test mode. The encoder, the serializer, the sequence generator circuit, and the multiplexer may be fabricated in a single integrated circuit chip. The parallel test data may be parallel pseudo-random binary sequence data. The parallel digital data may include data to generate colors in a visual image.

Abstract: An embodiment includes encoding parallel digital data into encoded and parallel digital data in an encoder and generating parallel test data in a pseudo-random binary sequence generator circuit. The encoded and parallel digital data is coupled through a multiplexer to be serialized in a serializer in a normal mode of operation and the parallel test data is coupled through the multiplexer to be serialized in the serializer in a test mode of operation. Encoded and serial digital data are transmitted to a transmission medium in the normal mode, and serial test data are transmitted to the transmission medium in the test mode. The encoder, the serializer, the sequence generator circuit, and the multiplexer may be fabricated in a single integrated circuit chip. The parallel test data may be parallel pseudo-random binary sequence data. The parallel digital data may include data to generate colors in a visual image.

Abstract: The present invention provides a method and apparatus for a programmable capacitor associated with an input/output pad in the semiconductor device. The apparatus includes a semiconductor die having an upper surface, a first capacitor deployed above the upper surface of the semiconductor die, a separation layer deployed above the first capacitor, and a bond pad deployed above the separation layer such that at least a portion of the bond pad lies above the first capacitor.

Abstract: The present invention provides a method and apparatus for a programmable capacitor associated with an input/output pad in the semiconductor device. The apparatus includes a semiconductor die having an upper surface, a first capacitor deployed above the upper surface of the semiconductor die, a separation layer deployed above the first capacitor, and a bond pad deployed above the separation layer such that at least a portion of the bond pad lies above the first capacitor.

Abstract: The present invention provides a method and apparatus for a programmable capacitor associated with an input/output pad in the semiconductor device. The apparatus includes a semiconductor die having an upper surface, a first capacitor deployed above the upper surface of the semiconductor die, a separation layer deployed above the first capacitor, and a bond pad deployed above the separation layer such that at least a portion of the bond pad lies above the first capacitor.

Abstract: The present invention provides a method and apparatus for a programmable capacitor associated with an input/output pad in the semiconductor device. The apparatus includes a semiconductor die having an upper surface, a first capacitor deployed above the upper surface of the semiconductor die, a separation layer deployed above the first capacitor, and a bond pad deployed above the separation layer such that at least a portion of the bond pad lies above the first capacitor.

Abstract: An embodiment includes encoding parallel digital data into encoded and parallel digital data in an encoder and generating parallel test data in a pseudo-random binary sequence generator circuit. The encoded and parallel digital data is coupled through a multiplexer to be serialized in a serializer in a normal mode of operation and the parallel test data is coupled through the multiplexer to be serialized in the serializer in a test mode of operation. Encoded and serial digital data are transmitted to a transmission medium in the normal mode, and serial test data are transmitted to the transmission medium in the test mode. The encoder, the serializer, the sequence generator circuit, and the multiplexer may be fabricated in a single integrated circuit chip. The parallel test data may be parallel pseudo-random binary sequence data. The parallel digital data may include data to generate colors in a visual image.

Abstract: An embodiment includes encoding parallel digital data into encoded and parallel digital data in an encoder and generating parallel test data in a pseudo-random binary sequence generator circuit. The encoded and parallel digital data is coupled through a multiplexer to be serialized in a serializer in a normal mode of operation and the parallel test data is coupled through the multiplexer to be serialized in the serializer in a test mode of operation. Encoded and serial digital data are transmitted to a transmission medium in the normal mode, and serial test data are transmitted to the transmission medium in the test mode. The encoder, the serializer, the sequence generator circuit, and the multiplexer may be fabricated in a single integrated circuit chip. The parallel test data may be parallel pseudo-random binary sequence data. The parallel digital data may include data to generate colors in a visual image.

Abstract: An embodiment includes encoding parallel digital data into encoded and parallel digital data in an encoder and generating parallel test data in a pseudo-random binary sequence generator circuit. The encoded and parallel digital data is coupled through a multiplexer to be serialized in a serializer in a normal mode of operation and the parallel test data is coupled through the multiplexer to be serialized in the serializer in a test mode of operation. Encoded and serial digital data are transmitted to a transmission medium in the normal mode, and serial test data are transmitted to the transmission medium in the test mode. The encoder, the serializer, the sequence generator circuit, and the multiplexer may be fabricated in a single integrated circuit chip. The parallel test data may be parallel pseudo-random binary sequence data. The parallel digital data may include data to generate colors in a visual image.

Abstract: A voltage clamp circuit is disclosed and claimed. The voltage clamp circuit includes a bypass device and a differential sense amplifier or comparator adapted to control operation of the bypass device. The bypass device is activated in response to the differential sense amplifier or comparator sensing a voltage above a predetermined level.

Abstract: The present invention provides a method and apparatus for a programmable capacitor associated with an input/output pad in the semiconductor device. The apparatus includes a semiconductor die having an upper surface, a first capacitor deployed above the upper surface of the semiconductor die, a separation layer deployed above the first capacitor, and a bond pad deployed above the separation layer such that at least a portion of the bond pad lies above the first capacitor.

Abstract: A full rail-to-rail CMOS comparator is provided. The comparator includes a gain stage and a bias stage. The bias stage is responsive to the common mode input voltage level to provide a bias signal that maintains the gain stage with an optimum operating range regardless of the level of the common mode input voltage, thus maintaining the comparator output responsive to the differential input voltage. Accordingly, when operating in the optimum operating range, duty cycle distortion of the signal at the comparator output is minimized. The comparator also offers improved performance due to a lower component count and fewer comparator stages, thus decreasing power consumption and improving propagation delays.

Abstract: A circuit for producing an output signal at an output thereof in response to an input signal at an input thereof is comprised, in one embodiment, of a first switch for connecting the output to a first voltage source and a second switch for connecting the output to a second voltage source. A first control switch is provided for turning off the first switch in response to the logic level of the input signal while a second control switch is provided for turning off the second switch in response to the logic level of the input signal. An integrator is responsive to the input signal for turning on one of the first and second switches depending on the logic level of the input signal. A method of operating such a circuit is also disclosed.

Abstract: An embodiment includes encoding parallel digital data into encoded and parallel digital data in an encoder and generating parallel test data in a pseudo-random binary sequence generator circuit. The encoded and parallel digital data is coupled through a multiplexer to be serialized in a serializer in a normal mode of operation and the parallel test data is coupled through the multiplexer to be serialized in the serializer in a test mode of operation. Encoded and serial digital data are transmitted to a transmission medium in the normal mode, and serial test data are transmitted to the transmission medium in the test mode. The encoder, the serializer, the sequence generator circuit, and the multiplexer may be fabricated in a single integrated circuit chip. The parallel test data may be parallel pseudo-random binary sequence data. The parallel digital data may include data to generate colors in a visual image.

Abstract: A full rail-to-rail CMOS comparator is provided. The comparator includes a gain stage and a bias stage. The bias stage is responsive to the common mode input voltage level to provide a bias signal that maintains the gain stage with an optimum operating range regardless of the level of the common mode input voltage, thus maintaining the comparator output responsive to the differential input voltage. Accordingly, when operating in the optimum operating range, duty cycle distortion of the signal at the comparator output is minimized. The comparator also offers improved performance due to a lower component count and fewer comparator stages, thus decreasing power consumption and improving propagation delays.

Abstract: A voltage clamp circuit is disclosed and claimed. The voltage clamp circuit includes a bypass device and a differential sense amplifier or comparator adapted to control operation of the bypass device. The bypass device is activated in response to the differential sense amplifier or comparator sensing a voltage above a predetermined level.

Abstract: A full rail-to-rail CMOS comparator is provided. The comparator includes a gain stage and a bias stage. The bias stage is responsive to the common mode input voltage level to provide a bias signal that maintains the gain stage with an optimum operating range regardless of the level of the common mode input voltage, thus maintaining the comparator output responsive to the differential input voltage. Accordingly, when operating in the optimum operating range, duty cycle distortion of the signal at the comparator output is minimized. The comparator also offers improved performance due to a lower component count and fewer comparator stages, thus decreasing power consumption and improving propagation delays.

Abstract: A full rail-to-rail CMOS comparator is provided. The comparator includes a gain stage and a bias stage. The bias stage is responsive to the common mode input voltage level to provide a bias signal that maintains the gain stage with an optimum operating range regardless of the level of the common mode input voltage, thus maintaining the comparator output responsive to the differential input voltage. Accordingly, when operating in the optimum operating range, duty cycle distortion of the signal at the comparator output is minimized. The comparator also offers improved performance due to a lower component count and fewer comparator stages, thus decreasing power consumption and improving propagation delays.