Patents by Inventor Ken Shioiri

Ken Shioiri has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11481673
    Abstract: A highly reliable signal analysis is performed by suppressing over-learning and appropriately distinguishing an abnormal signal. A signal analysis device 1 includes a data storage unit 4 which stores digital data of a measured signal, a training data storage unit 11 which stores training data to which a label of normality or abnormality is attached, a plurality of machine learning classifiers 5 which identify whether the measured signal is normal or abnormal by comparing the digital data of the measured signal stored in the data storage unit 4 with an identification boundary value and output identification results according to machine learning by the training data, and a determination unit 6 which determines whether the measured signal is normal, abnormal, or uncertain by comparing the identification results of the plurality of machine learning classifiers 5 with a determination threshold value.
    Type: Grant
    Filed: June 6, 2019
    Date of Patent: October 25, 2022
    Assignee: ANRITSU CORPORATION
    Inventor: Ken Shioiri
  • Patent number: 11255719
    Abstract: A material property inspection apparatus includes a conveyance unit, a light source, an irradiation unit, a light receiving unit, a signal detection unit, a material property value input unit, an inspection set value input unit, and a processing unit. The processing unit calculates a relation equation between the material property value from the material property values of the plurality of test pieces and the light intensity of the transmitted light or the reflected light of respective test pieces, calculates the material property value of the inspected object from the light intensity of the transmitted light or the reflected light detected by the signal detection unit and the relation equation, compares the calculated material property value of the inspected object with the inspection set value inputted from the inspection set value input unit, and determines the quality of the inspected object.
    Type: Grant
    Filed: October 24, 2019
    Date of Patent: February 22, 2022
    Assignee: ANRITSU CORPORATION
    Inventors: Masaaki Fuse, Ken Shioiri, Takao Tanimoto, Hideyuki Sakamoto
  • Publication number: 20200158565
    Abstract: A material property inspection apparatus includes a conveyance unit, a light source, an irradiation unit, a light receiving unit, a signal detection unit, a material property value input unit, an inspection set value input unit, and a processing unit. The processing unit calculates a relation equation between the material property value from the material property values of the plurality of test pieces and the light intensity of the transmitted light or the reflected light of respective test pieces, calculates the material property value of the inspected object from the light intensity of the transmitted light or the reflected light detected by the signal detection unit and the relation equation, compares the calculated material property value of the inspected object with the inspection set value inputted from the inspection set value input unit, and determines the quality of the inspected object.
    Type: Application
    Filed: October 24, 2019
    Publication date: May 21, 2020
    Inventors: Masaaki FUSE, Ken SHIOIRI, Takao TANIMOTO, Hideyuki SAKAMOTO
  • Publication number: 20200065698
    Abstract: A highly reliable signal analysis is performed by suppressing over-learning and appropriately distinguishing an abnormal signal. A signal analysis device 1 includes a data storage unit 4 which stores digital data of a measured signal, a training data storage unit 11 which stores training data to which a label of normality or abnormality is attached, a plurality of machine learning classifiers 5 which identify whether the measured signal is normal or abnormal by comparing the digital data of the measured signal stored in the data storage unit 4 with an identification boundary value and output identification results according to machine learning by the training data, and a determination unit 6 which determines whether the measured signal is normal, abnormal, or uncertain by comparing the identification results of the plurality of machine learning classifiers 5 with a determination threshold value.
    Type: Application
    Filed: June 6, 2019
    Publication date: February 27, 2020
    Inventor: Ken SHIOIRI
  • Patent number: 6023497
    Abstract: This invention provides a contaminant-detecting apparatus having high selectivity and high sensitivity against a contaminant. A product (1) is conveyed to a point where it is irradiated by x-rays from source (3). An x-ray detector (4), having a predetermined detection unit width in a direction perpendicularly intersecting the conveying direction, then detects the x-rays transmitted through the product. A storage unit (5) stores a two-dimensional distribution of x-ray intensity detected by the x-ray detector as a transmission image in units of pixels. An average calculation unit (7) performs a sum-or-product operation of a kernel, which is equal to or larger than 7.times.7 pixels, (9.times.9 or 11.times.11), and equal to or smaller than (a pixel count corresponding to 1/2 the predetermined x-ray detection unit width).times.
    Type: Grant
    Filed: April 17, 1998
    Date of Patent: February 8, 2000
    Assignee: Anritsu Corporation
    Inventors: Yoshifumi Takahashi, Ken Shioiri
  • Patent number: 5458225
    Abstract: The present invention relates to a coin discriminating apparatus for discriminating the thickness, material, diameter, and the like of a coin at high precision. A transmission coil (11) receives an AC signal generated by an AC signal generating unit (24) and applies an alternating magnetic field to a coin (C) to be discriminated. A reception coil (12) detects an electromotive force induced when the the transmission coil (11) applies the alternating magnetic field on the coin to be discriminated. A detection signal generating unit (27) generates a detection signal having a predetermined phase with respect to the AC signal generated by the AC signal generating unit (24). A phase detecting unit (26) phase-detects the electromotive force detected by the reception coil (12) in accordance with the detection signal generated by the detection signal generating unit.
    Type: Grant
    Filed: May 25, 1993
    Date of Patent: October 17, 1995
    Assignee: Anritsu Corporation
    Inventors: Takahasi Iwamoto, Ken Shioiri, Yoshifumi Takahashi, Noriyuki Kodama, Shintaro Inagaki, Masaru Honma
  • Patent number: 5452785
    Abstract: The present invention relates to a coin discriminating apparatus for discriminating the thickness, material, diameter, and the like of a coin at high precision. A transmission coil (11) receives an AC signal generated by an AC signal generating unit (24) and applies an alternating magnetic field to a coin (C) to be discriminated. A reception coil (12) detects an electromotive force induced when the the transmission coil (11) applies the alternating magnetic field on the coin to be discriminated. A detection signal generating unit (27) generates a detection signal having a predetermined phase with respect to the AC signal generated by the AC signal generating unit (24). A phase detecting unit (26) phase-detects the electromotive force detected by the reception coil (12) in accordance with the detection signal generated by the detection signal generating unit.
    Type: Grant
    Filed: September 26, 1994
    Date of Patent: September 26, 1995
    Assignee: Anritsu Corporation
    Inventors: Takahisa Iwamoto, Ken Shioiri, Yoshifumi Takahashi, Noriyuki Kodama, Shintaro Inagaki, Masaru Honma