Patents by Inventor Keng Chuah

Keng Chuah has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for detecting defects in coatings utilizing color-based thermal mismatch
    Patent number: 8204294
    Abstract: A method of analyzing a thermal image of a coated substrate to determine the presence of defects includes determining a defect temperature range based on a color of the coated substrate and the maximum temperature of the coated substrate in the thermal image. Thereafter, the thermal image is processed by determining a signal value of a pixel of interest based on a temperature of the pixel of interest, temperatures of pixels in a kernel of pixels surrounding the pixel of interest, and the color of the coated substrate. The signal value of the pixel of interest is then compared to the lower temperature threshold of the defect temperature range, wherein the pixel of interest is a defect location when the signal value of the pixel of interest is greater than or equal to the lower temperature threshold.
    Type: Grant
    Filed: November 25, 2009
    Date of Patent: June 19, 2012
    Assignees: Toyota Motor Engineering & Manufacturing North America, Inc., University of Kentucky Research Foundation
    Inventors: Richard Alloo, Kozo Saito, Belal Gharaibeh, Keng Chuah, Nelson Akafuah, Ahmad Salaimeh
  • SYSTEMS AND METHODS FOR DETECTING DEFECTS IN COATINGS UTILIZING COLOR-BASED THERMAL MISMATCH
    Publication number: 20110123093
    Abstract: A method of analyzing a thermal image of a coated substrate to determine the presence of defects includes determining a defect temperature range based on a color of the coated substrate and the maximum temperature of the coated substrate in the thermal image. Thereafter, the thermal image is processed by determining a signal value of a pixel of interest based on a temperature of the pixel of interest, temperatures of pixels in a kernel of pixels surrounding the pixel of interest, and the color of the coated substrate. The signal value of the pixel of interest is then compared to the lower temperature threshold of the defect temperature range, wherein the pixel of interest is a defect location when the signal value of the pixel of interest is greater than or equal to the lower temperature threshold.
    Type: Application
    Filed: November 25, 2009
    Publication date: May 26, 2011
    Applicant: Toyota Motor Engineering & Manufacturing North America, Inc.
    Inventors: Richard Alloo, Kozo Saito, Belal Gharaibeh, Keng Chuah, Nelson Akafuah, Ahmad Salaimeh