Abstract: The present invention relates to an improvement in spectral analysis in spectrometry, particularly in a technique of spectral analysis by spectral classification at high speed. A spectral analysis device 10 comprises: a measurement unit 20 that measures a sample spectrum of a target sample 30; and an analysis unit 40 that analyses the sample spectrum, and analyses a compound contained in the target sample 30, wherein the analysis unit has a library that is processed with an arithmetic processing in advance, the library has a plurality of compound groups to which the compound is classified, and the analysis unit further comprises an analysis display part 42, the analysis display part 42 displays, in real time, the compound group to which the compound belongs during analysis of the sample spectrum as the analysis progress or analysis result.

Abstract: A spectrometer capable of providing information, to a measurer, necessary for determining whether a sample set to the spectrometer is a sample expected by the measurer or not before a main measurement includes a data processor and a display. The data processor calculates a preliminary spectral information of the sample based on at least n of a latest detected signal and a BKG information retained in advance, calculates and updates the preliminary spectral information based on at least n of the latest detected signal and the BKG information again, and repeats these calculations and updates. The display shows the preliminary spectral information that is calculated and updated in the preview display. The data processor starts integration of N (N>n) of the detected signal during a preview display of the preliminary spectral information, and acquires a spectral information of the sample.

Abstract: The present invention relates to an improvement in spectral analysis in spectrometry, particularly in a technique of spectral analysis by spectral classification at high speed. A spectral analysis device 10 comprises: a measurement unit 20 that measures a sample spectrum of a target sample 30; and an analysis unit 40 that analyses the sample spectrum, and analyses a compound contained in the target sample 30, wherein the analysis unit has a library that is processed with an arithmetic processing in advance, the library has a plurality of compound groups to which the compound is classified, and the analysis unit further comprises an analysis display part 42, the analysis display part 42 displays, in real time, the compound group to which the compound belongs during analysis of the sample spectrum as the analysis progress or analysis result.

Abstract: A microscopic-measurement apparatus capable of displaying, on a display device, an enlarged view of a particular part of a specimen placed on a movable stage and providing optical information of a desired portion includes an observation-image display section for displaying an enlarged view of a specific part of the specimen on the display device; a thumbnail-image display section for acquiring the enlarged image of the specific part as a thumbnail image when the enlarged observation image is specified and displaying the thumbnail image together with the enlarged image on the display device; a thumbnail-coordinate storage section for storing coordinate information of the specific part, where the thumbnail image is acquired, in association with the thumbnail image; and a thumbnail jump display section for causing the observation-image display section to display an enlarged image of the position of the thumbnail image by specifying the thumbnail image.

Abstract: A microscopic-measurement apparatus capable of conducting measurement successively in several set areas regardless of the type of stage driving system or the precision of the stage driving system.

Abstract: A noise-component removing method for removing a noise component from multipoint spectral data that has been generated through measurements performed at measurement points of a sample surface, the method comprising: a PLS analysis step of determining components of the multipoint spectral data for each measurement point in a descending order of eigenvalues of the components by subjecting the multipoint spectral data to multivariate analysis based on the partial least squares regression using a value obtained by quantifying characteristic information about a characteristic of each measurement point, other than spectral information of the measurement point and using the spectral information as an independent variable in the partial least squares regression; and a spectrum reconstruction step of reconstructing the multipoint spectral data for each measurement point to eliminate a component having an eigenvalue lower than a predetermined value, from the components determined in the PLS analysis step.

Abstract: An irreversible-reaction measurement method comprising: a step in which a perturbation is applied to one of the divided portions of a measurement sample placed in a light path of a Fourier-transform spectrophotometer to cause an irreversible-reaction while a mirror of the spectrophotometer remains at a data point; a step in which interferogram is detected from the sample portion placed in the path at predetermined time intervals after the application of the perturbation; a step in which the mirror moves to and remains at the next data point after the reaction of the sample portion reaches an end point; a step in which the sample portion placed in the light path is changed to the next sample portion each time the mirror moves to the next data point; and a step in which the irreversible-reaction of the measurement sample is analyzed in accordance with the interferogram obtained by repeating the steps.

Abstract: A microscopic-measurement apparatus capable of conducting measurement successively in several set areas regardless of the type of stage driving system or the precision of the stage driving system.

Abstract: It is an object of the present invention to provide a mapping-data analyzing method that can display a map in which sufficient information is extracted from the spectra of obtained mapping data to enable objective analysis. The mapping-data analyzing method of the present invention is used for analyzing mapping data obtained by measuring, with a spectrometer apparatus, spectra at a plurality of points on a specimen surface. The method comprises a principal-component calculating step and a grouped-map display step. In the principal-component calculating step, spectral data obtained at each point on the specimen surface is defined as an individual sample and principal component analysis, in which values at a plurality of wave numbers of each spectral data set serve as variables, is performed to calculate the scores of a plurality of principal components for each individual sample.

Abstract: A microscopic-measurement apparatus capable of displaying, on a display device, an enlarged view of a particular part of a specimen placed on a movable stage and providing optical information of a desired portion includes an observation-image display section for displaying an enlarged view of a specific part of the specimen on the display device; a thumbnail-image display section for acquiring the enlarged image of the specific part as a thumbnail image when the enlarged observation image is specified and displaying the thumbnail image together with the enlarged image on the display device; a thumbnail-coordinate storage section for storing coordinate information of the specific part, where the thumbnail image is acquired, in association with the thumbnail image; and a thumbnail jump display section for causing the observation-image display section to display an enlarged image of the position of the thumbnail image by specifying the thumbnail image.

Abstract: A noise-component removing method for removing a noise component from multipoint spectral data that has been generated through measurements performed at measurement points of a sample surface, the method comprising: a PLS analysis step of determining components of the multipoint spectral data for each measurement point in a descending order of eigenvalues of the components by subjecting the multipoint spectral data to multivariate analysis based on the partial least squares regression using a value obtained by quantifying characteristic information about a characteristic of each measurement point, other than spectral information of the measurement point and using the spectral information as an independent variable in the partial least squares regression; and a spectrum reconstruction step of reconstructing the multipoint spectral data for each measurement point to eliminate a component having an eigenvalue lower than a predetermined value, from the components determined in the PLS analysis step.

Abstract: An irreversible-reaction measurement method comprising: a step in which a perturbation is applied to one of the divided portions of a measurement sample placed in a light path of a Fourier-transform spectrophotometer to cause an irreversible-reaction while a mirror of the spectrophotometer remains at a data point; a step in which interferogram is detected from the sample portion placed in the path at predetermined time intervals after the application of the perturbation; a step in which the mirror moves to and remains at the next data point after the reaction of the sample portion reaches an end point; a step in which the sample portion placed in the light path is changed to the next sample portion each time the mirror moves to the next data point; and a step in which the irreversible-reaction of the measurement sample is analyzed in accordance with the interferogram obtained by repeating the steps.

Abstract: A high-sensitivity reflection measurement apparatus disposed in an optical path between a light emitter and a detector of an analysis apparatus comprises an incident-side optical element, which bends the optical path of measurement light emitted from the light emitter such that the angle of incidence of the measurement light so emitted with respect to a sample surface under measurement ranges from 70° inclusive to 90° exclusive with respect to the direction perpendicular to the sample surface under measurement. The measurement light is transmitted as linearly polarized light having a desired oscillation direction, and is incident on the sample surface under measurement. Information related to the measured sample surface is obtained from light reflected from the measured sample surface when the linearly polarized light from the incident-side optical element is incident on the sample surface.

Abstract: The object of the invention is to provide an infrared circular dichroism measuring apparatus that improves the measuring time and the measuring accuracy. An infrared circular dichroism measuring apparatus 101 comprising: AC signal extractors 110–112 where an interference light beam from an IR light source 102 which has passed an interferometer 103 is converted into a clockwise and a counterclockwise circularly polarized light beams and is irradiated on a sample to extract from a detected signal of detector 107 an interferogram by each of the circularly polarized light beams; DC signal extractors 113, 112 for extracting an interferogram by the IR absorption of the sample; a calculator 114 for figuring out the circular dichroism; and a selective transmitter 120 for narrowing down the wavelength region to be measured based on an IR absorption wavelength region corresponding to a vibration mode of the structure to be measured in the sample molecule.

Abstract: A high-sensitivity reflection measurement apparatus disposed in an optical path between a light emitter and a detector of an analysis apparatus, the high-sensitivity reflection measurement apparatus comprising an incident-side optical element, wherein the incident-side optical element bends the optical path of measurement light emitted from the light emitter such that the angle of incidence of the measurement light emitted from the light emitter with respect to a sample surface under measurement is a desired angle ranging from 70 degrees inclusive to 90 degrees exclusive with respect to the direction perpendicular to the sample surface under measurement, transmits the measurement light as linearly polarized light having a desired oscillation direction, and makes the linearly polarized light incident on the sample surface under measurement; and information related to the sample surface under measurement is obtained according to light reflected from the sample surface under measurement when the linearly polariz

Abstract: The object of the invention is to provide an infrared circular dichroism measuring apparatus that improves the measuring time and the measuring accuracy.