Abstract: The present invention provides an imaging mass spectrometer which generates ions by irradiating a sample with a laser beam and performs mass spectrometry of the ions, the imaging mass spectrometer including: a laser irradiation unit 30 configured to emit the laser beam toward the sample, a condensing optical system 33 disposed between the laser irradiation unit 30 and the sample and configured to condense the laser beam emitted from the laser irradiation unit 30, an image acquiring unit 40 configured to acquire a condensing state checking image which is an optical microscopic image capable of checking a condensing state on the sample of the laser beam emitted from the laser irradiation unit 30, and a display unit 64 configured to display the condensing state checking image acquired by the image acquiring unit 40 on a display screen.

Abstract: The present invention provides an imaging mass spectrometer which generates ions by irradiating a sample with a laser beam and performs mass spectrometry of the ions, the imaging mass spectrometer including: a laser irradiation unit 30 configured to emit the laser beam toward the sample, a condensing optical system 33 disposed between the laser irradiation unit 30 and the sample and configured to condense the laser beam emitted from the laser irradiation unit 30, an image acquiring unit 40 configured to acquire a condensing state checking image which is an optical microscopic image capable of checking a condensing state on the sample of the laser beam emitted from the laser irradiation unit 30, and a display unit 64 configured to display the condensing state checking image acquired by the image acquiring unit 40 on a display screen.

Abstract: A chromatogram data processing system having an impurity detector including a differential chromatogram creator, a purity curve creator and a determiner. The differential chromatogram creator calculates a differential coefficient of an absorbance spectrum with respect to wavelength at a local maximum or local minimum absorption wavelength of the target component, and creates a differential chromatogram which shows a temporal change of the differential coefficient. The purity curve creator creates a purity curve which shows a temporal change of the difference between the degree of similarity of a spectrum on the target peak to a reference spectrum and a threshold of the degree of similarity which is determined taking into account the influence of noise components. The differential chromatogram and the purity curve are displayed on a display unit in a superposed form on a wavelength chromatogram created by a wavelength chromatogram creator.

Abstract: A system for creating a chromatogram based on a temporal change of a spectrum obtained within a predetermined wavelength range including a target wavelength, the system including a post-correction chromatogram display section for displaying a post-correction chromatogram obtained by multiplying a chromatogram at the designated wavelength by a sensitivity factor obtained by dividing the intensity of the designated-time spectrum at the target wavelength by the intensity of the designated-time spectrum at the designated wavelength, and for changing the display to a post-correction chromatogram corresponding to the latest values of the designated time point and the designated wavelength when one or both of the designated time point and the designated wavelength are changed.

Abstract: There are provided a position recognition apparatus for printed circuit board (PCB), a position recognition and processing apparatus, and a printed circuit board manufacturing method. A position recognition apparatus for PCB configured to recognize a mounting position of an LED package on a PCB, the LED package being including a phosphor emitting fluorescence in operation, includes: an illuminating means configured to irradiate the PCB with light containing a blue component; an observation filter configured to selectively pass at least blue light of reflected light from the PCB and fluorescence from the phosphor and cut light in a wavelength region longer than a wavelength of the blue light; an imaging means configured to capture an image of the light passed by the observation filter; and an image processing means configured to calculate a position of the phosphor on the PCB, based on image data captured by the imaging means.

Abstract: Regarding a chromatogram data processing device configured to process three-dimensional chromatogram data collected on a target sample in which dimensions are made up of time, wavelength, and absorbance, and the chromatogram data processing device includes a differential spectrum generating means configured to generate a differential spectrum that represents a change in a wavelength differential coefficient, which is a differential coefficient in a wavelength direction in a predetermined wavelength range, based on the three-dimensional chromatogram data, with respect to an absorbance spectrum representing a relation of the wavelength and the absorbance at each time in an entire temporal range or a predetermined temporal range, and a determination means configured to determine whether or not one or plural other components are included in a peak of a target component, based on a temporal change in a waveform of the differential spectrum, so that the determination on whether or not a target sample includes impur

Abstract: A data processing system for a chromatograph has an impurity detector including a differential chromatogram creator and a determining section. The differential chromatogram creator calculates a wavelength differential coefficient by differentiating an absorbance spectrum with respect to the wavelength at each point in time of the measurement and creates a differential chromatogram which shows a temporal change in the wavelength differential coefficient. Based on a shape of the thus created differential chromatogram, the determining section determines whether or not a peak of a target component contains an impurity. By this method, whether or not the peak of the target component contains an impurity can be determined with high accuracy, without requiring complex calculations.

Abstract: A substrate inspection device for inspecting a flexible printed board to determine whether the transparent adhesive material is properly applied thereto comprises: a substrate reading device which irradiates the flexible printed board with visible light to acquire image data; an adhesive material position determination unit which determines a position of adhesive material CAD data corresponding to the transparent adhesive material with respect to blue color image data among the image data corresponding to blue light which is readily absorbed by polyimide, to create adhesive material alignment data in which the adhesive material CAD data is superposed; an edge enhancing unit which performs processing, on the blue color image data, to enhance an edge of the transparent adhesive material; and a straight line determination unit which determines whether the edge of the transparent adhesive material is present in edge enhanced data in which the edge of the transparent adhesive material is enhanced.

Abstract: Provided are an automatic analysis method, an automatic analysis apparatus, and a program for the automatic analysis apparatus capable of discriminating a number of components included in a sample more accurately and easily. Components are discriminated based on respective pieces of resolution spectral data obtained by multivariate curve resolution (MCR) using a provisional number of components k, and the number of components included in the sample is determined based on a discriminated result.

Abstract: There are provided a data processing device for chromatograph and a data processing method for chromatograph which allow a peak to be desirably checked. A peak (correction target peak (P1)) whose intensity exceeds a predetermined threshold in a chromatogram at a target wavelength (?1) is corrected based on correction reference values (height (H1) and area (A1) of a peak (P11)) and a sensitivity coefficient (R=I1/I2), and the chromatogram after correction is displayed or printed. Therefore, even if the correction target peak (P1) is saturated, display or printing may be performed in a state where correction has been performed so that the chromatogram at the peak (P1) is not cut off in the middle. Accordingly, at the time of display or printing of the chromatogram, a fine peak may be prevented from becoming too small, and also the correction target peak (P1) may be prevented from being cut off in the middle, and thus the peaks may be desirably checked.

Abstract: There are provided a position recognition apparatus for printed circuit board (PCB), a position recognition and processing apparatus, and a printed circuit board manufacturing method. A position recognition apparatus for PCB configured to recognize a mounting position of an LED package on a PCB, the LED package being including a phosphor emitting fluorescence in operation, includes: an illuminating means configured to irradiate the PCB with light containing a blue component; an observation filter configured to selectively pass at least blue light of reflected light from the PCB and fluorescence from the phosphor and cut light in a wavelength region longer than a wavelength of the blue light; an imaging means configured to capture an image of the light passed by the observation filter; and an image processing means configured to calculate a position of the phosphor on the PCB, based on image data captured by the imaging means.

Abstract: A preparative separation chromatograph system having a column for temporally separating components in a sample and for discharging an eluate fluid with the components, a detector for obtaining an absorbance spectrum of the eluate fluid, and a fraction collector for continuously creating a chromatogram. The system further includes: a peak section determiner; a differential value determiner for calculating a differential spectrum value and for determining whether or not the absolute value of the differential spectrum value is equal to or less than a predetermined value; and a fraction collector controller for controlling the fraction collector so as to fractionate the eluate fluid during a period of time for which it is determined that the chromatogram peak of the target component is present and for which it is also determined the absolute value of the differential spectrum value is equal to or less than the predetermined value.

Abstract: A data processing system for a chromatograph including a standard sample data storage section; a standard sample sensitivity factor calculator; a post-correction standard sample chromatogram strength calculator; a specific designated retention time and specific designated wavelength setter; a measurement sample data storage section; a measurement sample sensitivity factor calculator; and a post-correction measurement sample chromatogram creator.

Abstract: A preparative separation chromatograph system having a column for temporally separating components in a sample and for discharging an eluate fluid with the components, a detector for obtaining an absorbance spectrum of the eluate fluid, and a fraction collector for continuously creating a chromatogram. The system further includes: a peak section determiner; a differential value determiner for calculating a differential spectrum value and for determining whether or not the absolute value of the differential spectrum value is equal to or less than a predetermined value; and a fraction collector controller for controlling the fraction collector so as to fractionate the eluate fluid during a period of time for which it is determined that the chromatogram peak of the target component is present and for which it is also determined the absolute value of the differential spectrum value is equal to or less than the predetermined value.

Abstract: A preparative separation chromatograph system having a column for temporally separating components in a sample and for discharging an eluate fluid with the components, a detector for obtaining an absorbance spectrum of the eluate fluid, and a fraction collector for continuously creating a chromatogram. The system further includes: a peak section determiner; a differential value determiner for calculating a differential spectrum value and for determining whether or not the absolute value of the differential spectrum value is equal to or less than a predetermined value; and a fraction collector controller for controlling the fraction collector so as to fractionate the eluate fluid during a period of time for which it is determined that the chromatogram peak of the target component is present and for which it is also determined the absolute value of the differential spectrum value is equal to or less than the predetermined value.

Abstract: A substrate inspection device for inspecting a flexible printed board to determine whether the transparent adhesive material is properly applied thereto comprises: a substrate reading device which irradiates the flexible printed board with visible light to acquire image data; an adhesive material position determination unit which determines a position of adhesive material CAD data corresponding to the transparent adhesive material with respect to blue color image data among the image data corresponding to blue light which is readily absorbed by polyimide, to create adhesive material alignment data in which the adhesive material CAD data is superposed; an edge enhancing unit which performs processing, on the blue color image data, to enhance an edge of the transparent adhesive material; and a straight line determination unit which determines whether the edge of the transparent adhesive material is present in edge enhanced data in which the edge of the transparent adhesive material is enhanced.

Abstract: A data processing system for a chromatograph including a standard sample data storage section; a standard sample sensitivity factor calculator; a post-correction standard sample chromatogram strength calculator; a specific designated retention time and specific designated wavelength setter; a measurement sample data storage section; a measurement sample sensitivity factor calculator; and a post-correction measurement sample chromatogram creator.

Abstract: A chromatogram data processing system having an impurity detector including a differential chromatogram creator, a purity curve creator and a determiner. The differential chromatogram creator calculates a differential coefficient of an absorbance spectrum with respect to wavelength at a local maximum or local minimum absorption wavelength of the target component, and creates a differential chromatogram which shows a temporal change of the differential coefficient. The purity curve creator creates a purity curve which shows a temporal change of the difference between the degree of similarity of a spectrum on the target peak to a reference spectrum and a threshold of the degree of similarity which is determined taking into account the influence of noise components. The differential chromatogram and the purity curve are displayed on a display unit in a superposed form on a wavelength chromatogram created by a wavelength chromatogram creator.

Abstract: A system for creating a chromatogram based on a temporal change of a spectrum obtained within a predetermined wavelength range including a target wavelength, the system including a post-correction chromatogram display section for displaying a post-correction chromatogram obtained by multiplying a chromatogram at the designated wavelength by a sensitivity factor obtained by dividing the intensity of the designated-time spectrum at the target wavelength by the intensity of the designated-time spectrum at the designated wavelength, and for changing the display to a post-correction chromatogram corresponding to the latest values of the designated time point and the designated wavelength when one or both of the designated time point and the designated wavelength are changed.

Abstract: There are provided a data processing device for chromatograph and a data processing method for chromatograph which allow a peak to be desirably checked. A peak (correction target peak (P1)) whose intensity exceeds a predetermined threshold in a chromatogram at a target wavelength (X1) is corrected based on correction reference values (height (H1) and area (A1) of a peak (P11)) and a sensitivity coefficient (R=I1/I2), and the chromatogram after correction is displayed or printed. Therefore, even if the correction target peak (P1) is saturated, display or printing may be performed in a state where correction has been performed so that the chromatogram at the peak (P1) is not cut off in the middle. Accordingly, at the time of display or printing of the chromatogram, a fine peak may be prevented from becoming too small, and also the correction target peak (P1) may be prevented from being cut off in the middle, and thus the peaks may be desirably checked.