Abstract: A tool shape measurement apparatus for imaging a tool is provided with: a camera for imaging the tool disposed at a previously determined imaging position; a shutter disposed on the opposite side of the tool from the camera; an illuminating device for shining light toward the shutter; and a control device for calculating the shape of the tool from an image of the tool. The illuminating device is disposed so that an image in which the tool is darker than the background of the tool is captured due to light reflected at the reflecting surface of the shutter.

Abstract: A tool shape measurement apparatus for imaging a tool is provided with: a camera for imaging the tool disposed at a previously determined imaging position; a shutter disposed on the opposite side of the tool from the camera; an illuminating device for shining light toward the shutter; and a control device for calculating the shape of the tool from an image of the tool. The illuminating device is disposed so that an image in which the tool is darker than the background of the tool is captured due to light reflected at the reflecting surface of the shutter.

Abstract: A semiconductor integrated circuit device including a level conversion circuit in which the simplifying of the circuit and the increasing of the speed of operation have been attained is provided.A pair of complementary output signals amplified to a required signal level by a current switch circuit including differential transistors which receive an input signal and a reference voltage are inputted into a pair of emitter follower circuits. An emitter follower output transistor is driven by an output signal from one emitter follower circuit, while an N-channel MOSFET provided between the output transistor and a current source used as a load is driven by an output signal from the other emitter follower circuit, to obtain a level-amplified output signal from an emitter of the output transistor.

Abstract: Herein disclosed is a bipolar memory having redundancy, which can be produced with a small area. In this semiconductor memory having a body memory for storing data and a spare memory for relief of fault bit of the body memory, a row is selected by cutting fuses in a decoder. Fundamentally signal lines such as word lines are not provided with fuses. Other parts including a power source and a reference voltage source are provided with fuses without decreasing the operating speed accompanied by only a slight increase in the area.