Abstract: A source driver includes: a first gradation voltage generation unit generating a gradation voltage of a first polarity supplied to a pixel on a first source line; a first amplifier receiving the gradation voltage of the first polarity to an input end, amplifying it, and outputting a voltage from an output end; a second gradation voltage generation unit generating a gradation voltage of a second polarity opposite to the first polarity to be supplied to a pixel on a second source line provided in the vicinity of the first source line; a second amplifier receiving the gradation voltage of the second polarity to an input end, amplifying it, and outputting a voltage from an output end; and a voltage comparison unit comparing a voltage of the input end of the second amplifier with the voltage of the output end of the second amplifier and outputs a comparison result.

Abstract: A first ladder resistor circuit including multiple first resistors connected to each other in series between a first connection point to which a first reference voltage is supplied and a second connection point to which a second reference voltage is supplied, and outputting multiple first divided voltages as the first reference voltages of multiple reference voltages; and a second ladder resistor circuit including multiple second resistors connected to each other in series in at least one of an area between the first connection point and a power supply terminal to which a power supply voltage higher than the first reference voltage is supplied and an area between the second connection point and a grounding terminal to which a ground potential lower than the second reference voltage is supplied, and outputting at least one second divided voltage as the second reference voltage of the plurality of reference voltages are provided.

Abstract: A source driver includes a latch unit sequentially retrieving a video data signal for each data row corresponding to each of a first to n th horizontal scanning lines of the display panel, an overdrive arithmetic circuit calculating an overdrive value of the drive voltage applied to the pixel portions on an N th line based on a comparison result of comparing the data row corresponding to the N th line among the first to n th horizontal scanning lines and the data row corresponding to an (N?1) th line and a distance to the N th line from the source driver, and a voltage output unit generating the drive voltage applied to the pixel portions on the N th line based on the data row corresponding to the N th line and the overdrive value to output to the source line.

Abstract: A source driver includes: a first gradation voltage generation unit generating a gradation voltage of a first polarity supplied to a pixel on a first source line; a first amplifier receiving the gradation voltage of the first polarity to an input end, amplifying it, and outputting a voltage from an output end; a second gradation voltage generation unit generating a gradation voltage of a second polarity opposite to the first polarity to be supplied to a pixel on a second source line provided in the vicinity of the first source line; a second amplifier receiving the gradation voltage of the second polarity to an input end, amplifying it, and outputting a voltage from an output end; and a voltage comparison unit comparing a voltage of the input end of the second amplifier with the voltage of the output end of the second amplifier and outputs a comparison result.

Abstract: A source driver includes a latch unit sequentially retrieving a video data signal for each data row corresponding to each of a first to n th horizontal scanning lines of the display panel, an overdrive arithmetic circuit calculating an overdrive value of the drive voltage applied to the pixel portions on an N th line based on a comparison result of comparing the data row corresponding to the N th line among the first to n th horizontal scanning lines and the data row corresponding to an (N?1) th line and a distance to the N th line from the source driver, and a voltage output unit generating the drive voltage applied to the pixel portions on the N th line based on the data row corresponding to the N th line and the overdrive value to output to the source line.

Abstract: A display driver according to the present invention generates a plurality of driving voltages based on a video signal and applies the respective driving voltages to a plurality of source lines of a display panel. The display driver includes an overdrive part and an overdrive control circuit. The overdrive part executes an overdrive processing to increase amplitudes of the driving voltages. The overdrive control circuit detects an internal temperature of the display driver and stops the overdrive processing by the overdrive part when the temperature is higher than a predetermined temperature threshold.

Abstract: A polishing apparatus comprises a polishing tool, a substrate holding member, and a sensor for detecting a failure of a substrate to be polished.

Abstract: A polishing apparatus for polishing a workpiece comprises a polishing table having a polishing surface and a top ring for holding the workpiece and pressing the workpiece against the polishing surface. The polishing table and the top ring are rotated independently of each other. The polishing apparatus further comprises a dresser for dressing the polishing surface with certain timing and a sensor for observing a property of the polishing surface on the polishing table when the polishing surface is being dressed by the dresser.

Abstract: A polishing apparatus comprises a polishing tool, a substrate holding member, and a sensor for detecting a failure of a substrate to be polished.

Abstract: Disclosed is a polishing apparatus that comprises a polishing tool, a substrate holding member, a measuring device to measure a drive current of a drive unit while the drive unit drives at least one of the polishing tool and the substrate holding member, and a failure detection unit to detect either jumping of the substrate from the substrate member or breakage of the substrate. While a substrate is held by a substrate holding member and pressed against the polishing tool during a polishing operation, the failure detection unit will detect jumping of the substrate from the substrate holding member or breakage of the substrate based on a comparison of the value of the drive current with a threshold value, or a comparison of a waveform pattern of the drive current with a predetermined waveform pattern.

Abstract: A polishing apparatus has a turntable with a polishing surface, a top ring for pressing a workpiece against the polishing surface under a given pressure to polish the workpiece, and a dresser for dressing the polishing surface. The polishing surface has an outer circumferential edge portion cut off or the dresser has a predetermined outside diameter, such that the polishing surface has an outer circumferential edge positioned in alignment with or radially inwardly of an outer circumferential edge of the dresser in the radial direction of the turntable when the polishing surface is dressed by the dresser.

Abstract: A polishing apparatus for polishing a workpiece comprises a polishing table having a polishing surface and a top ring for holding the workpiece and pressing the workpiece against the polishing surface. The polishing table and the top ring are rotated independently of each other. The polishing apparatus further comprises a dresser for dressing the polishing surface with certain timing and a sensor for observing a property of the polishing surface on the polishing table when the polishing surface is being dressed by the dresser.

Abstract: A polishing apparatus for polishing semiconductor wafers has a space divided into a plurality of rooms cleaned to different degrees. A storage unit for storing semiconductor wafers is disposed in one of the rooms. A polishing unit for chemically and mechanically polishing a semiconductor wafer supplied from the storage unit is disposed in another one of the rooms. A delivery gate is disposed between the storage unit and the polishing unit and has a temporary storage chamber defined therein for temporarily storing a semiconductor wafer therein.