Patents by Inventor Kenichi Shinbo
Kenichi Shinbo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20110192970Abstract: For the achievement of data transfer time reduction, removal of noise data, and analytical efficiency improvement in an ADC data processing function of a time-of-flight mass spectrometer, the mass spectrometer comprises a data acquisition circuit including: an ND converter; a signal intensity addition memory that stores data of ion signals such as a time range and the number of measurements and performs an addition process; a voltage value frequency addition memory that performs an addition process of frequencies of voltage values of the predetermined time range and the number of measurements and stores addition results; a threshold level computation circuit that computes a predetermined threshold level from the results in the memory; a compression memory that extracts only data exceeding the threshold level from the data in the signal intensity addition memory; and a counter that controls a measurement time for data acquisition and the operation of each circuit.Type: ApplicationFiled: April 19, 2011Publication date: August 11, 2011Inventors: Fujio Oonishi, Kenichi Shinbo, Ritsuro Orihashi, Yasushi Terui, Tsukasa Shishika
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Patent number: 7928365Abstract: For the achievement of data transfer time reduction, removal of noise data, and analytical efficiency improvement in an ADC data processing function of a time-of-flight mass spectrometer, the mass spectrometer comprises a data acquisition circuit including: an A/D converter; a signal intensity addition memory that stores data of ion signals such as a time range and the number of measurements and performs an addition process; a voltage value frequency addition memory that performs an addition process of frequencies of voltage values of the predetermined time range and the number of measurements and stores addition results; a threshold level computation circuit that computes a predetermined threshold level from the results in the memory; a compression memory that extracts only data exceeding the threshold level from the data in the signal intensity addition memory; and a counter that controls a measurement time for data acquisition and the operation of each circuit.Type: GrantFiled: December 29, 2005Date of Patent: April 19, 2011Assignee: Hitachi High-Technologies CorporationInventors: Fujio Oonishi, Kenichi Shinbo, Ritsuro Orihashi, Yasushi Terui, Tsukasa Shishika
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Patent number: 7890074Abstract: In a data acquisition system of ADC system, a log amplifier is provided at the pre-stage of an A/D converter, a signal amplified by the log amplifier having a nonlinear input-output characteristic is A/D-converted, and an adding operation of data is performed while reconverting a voltage value data which is converted to a nonlinear characteristic to data with a linear scale according to a table memory for reverse-log conversion. A known voltage value is inputted into the log amplifier to perform measurement, and calibration of the table memory is performed by storing the voltage value and the voltage value data after A/D-converted.Type: GrantFiled: February 15, 2007Date of Patent: February 15, 2011Assignee: Hitachi High-Technologies CorporationInventors: Kenichi Shinbo, Fujio Oonishi, Ritsuro Orihashi, Yasushi Terui, Tsukasa Shishika
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Patent number: 7476850Abstract: The present invention relates to a data processing device for mass spectrometry, in which measurements are performed in a high dynamic range without causing an overrange in an A/D converter in any TOF scan. A data acquisition circuit of a mass spectrometer includes an amplitude value computing circuit which measures and stores a maximum amplitude value of an ion detection signal, a gain control circuit for determining and setting a gain amount for the next measurement, and others. From the immediately preceding TOF scan data or TOF scan data plural times before, the maximum amplitude value of the ion detection signal is extracted. Then, before the next TOF scan, an optimum gain amount is determined based on the extracted maximum amplitude value to adjust the gain of the input signal, and the ion signal is sampled in the A/D converter.Type: GrantFiled: May 11, 2006Date of Patent: January 13, 2009Assignee: Hitachi High-Technologies CorporationInventors: Fujio Oonishi, Kenichi Shinbo, Ritsuro Orihashi, Yasushi Terui, Tsukasa Shishika
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Publication number: 20080244329Abstract: An apparatus diagnosing method is a method in which, in an apparatus including a control apparatus and a control board for controlling the control apparatus, on the controlling board, an error occurrence at the control apparatus and the control board is detected, an error signal is outputted, sensor data outputted from a sensor acquiring data about operation environments of the control apparatus and the control board is collected, and an environmental factor causing a failure or an error of the control apparatus and the control board is specified based upon the error signal and the sensor data, and the sensor data is collected in association with the error signal when the sensor data is collected.Type: ApplicationFiled: March 7, 2008Publication date: October 2, 2008Inventors: Kenichi SHINBO, Tadanobu Toba, Katsunori Hirano
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Publication number: 20080073504Abstract: In a data acquisition system of ADC system, a log amplifier is provided at the pre-stage of an A/D converter, a signal amplified by the log amplifier having a nonlinear input-output characteristic is A/D-converted, and an adding operation of data is performed while reconverting a voltage value data which is converted to a nonlinear characteristic to data with a linear scale according to a table memory for reverse-log conversion. A known voltage value is inputted into the log amplifier to perform measurement, and calibration of the table memory is performed by storing the voltage value and the voltage value data after A/D-converted.Type: ApplicationFiled: February 15, 2007Publication date: March 27, 2008Inventors: Kenichi Shinbo, Fujio Oonishi, Ritsuro Orihashi, Yasushi Terui, Tsukasa Shishika
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Publication number: 20060289739Abstract: The present invention relates to a data processing device for mass spectrometry, in which measurements are performed in a high dynamic range without causing an overrange in an A/D converter in any TOF scan. A data acquisition circuit of a mass spectrometer includes an amplitude value computing circuit which measures and stores a maximum amplitude value of an ion detection signal, a gain control circuit for determining and setting a gain amount for the next measurement, and others. From the immediately preceding TOF scan data or TOF scan data plural times before, the maximum amplitude value of the ion detection signal is extracted. Then, before the next TOF scan, an optimum gain amount is determined based on the extracted maximum amplitude value to adjust the gain of the input signal, and the ion signal is sampled in the A/D converter.Type: ApplicationFiled: May 11, 2006Publication date: December 28, 2006Inventors: Fujio Oonishi, Kenichi Shinbo, Ritsuro Orihashi, Yasushi Terui, Tsukasa Shishika
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Publication number: 20060248942Abstract: For the achievement of data transfer time reduction, removal of noise data, and analytical efficiency improvement in an ADC data processing function of a time-of-flight mass spectrometer, the mass spectrometer comprises a data acquisition circuit including: an A/D converter; a signal intensity addition memory that stores data of ion signals such as a time range and the number of measurements and performs an addition process; a voltage value frequency addition memory that performs an addition process of frequencies of voltage values of the predetermined time range and the number of measurements and stores addition results; a threshold level computation circuit that computes a predetermined threshold level from the results in the memory; a compression memory that extracts only data exceeding the threshold level from the data in the signal intensity addition memory; and a counter that controls a measurement time for data acquisition and the operation of each circuit.Type: ApplicationFiled: December 29, 2005Publication date: November 9, 2006Inventors: Fujio Oonishi, Kenichi Shinbo, Ritsuro Orihashi, Yasushi Terui, Tsukasa Shishika
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Patent number: 7132997Abstract: Multiple monopole antennas or loop antennas for generating electromagnetic fields whose phases become opposite to the phase of an electromagnetic field that the conventional single monopole antenna or loop antenna generates are located in proximity to the conventional single monopole antenna or loop antenna such that the components of the electromagnetic field in directions other than a probe-desired direction will be cancelled out.Type: GrantFiled: October 30, 2003Date of Patent: November 7, 2006Assignee: Hitachi, Ltd.Inventors: Kouichi Uesaka, Masami Makuuchi, Kenichi Shinbo
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Patent number: 7085982Abstract: A pulse generation circuit including a pulse formation circuit for generating normal and dummy pulses according to second delay value data, a data calculation circuit for calculating first delay value data at a timing at which the pulses are generated from the pulse formation circuit according to pattern data having information for determining whether to generate pulses from the pulse formation circuit, a dummy pulse control circuit for controlling generation of a dummy pulse in a no-pulse-generation cycle from the pulse formation circuit according to the second delay value data obtained by detecting the no-pulse-generation cycle from the first delay value data, and a logical gate circuit for eliminating the dummy pulses generated from the pulse formation circuit.Type: GrantFiled: January 16, 2003Date of Patent: August 1, 2006Assignee: Hitachi, Ltd.Inventors: Kenichi Shinbo, Fujio Oonishi, Ritsurou Orihashi, Masashi Fukuzaki, Nobuo Motoki
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Patent number: 6768953Abstract: In an odd side storage circuit, logical values of a decision subject signal HCMP are stored in first and second FFs respectively at decision edges LH and HL generated from odd-numbered edges of a decision edge EH. Logical values of a delayed decision subject signal HCMP′ are stored in third and fourth FFs. According to a selection signal generated by a selection signal generation circuit based on outputs of the third and fourth FFs, a first selector selects an output of the first or second FF. An even side storage circuit operates similarly at even-numbered edges. A second selector selects the odd and even side storage circuits alternately. The FFs in the odd and even side storage circuits are reset by a decision edge LH′ of the even side and the decision edge HL of the odd side, respectively.Type: GrantFiled: October 10, 2002Date of Patent: July 27, 2004Assignee: Hitachi, Ltd.Inventors: Fujio Oonishi, Kenichi Shinbo, Ritsuro Orihashi, Masashi Fukuzaki, Nobuo Motoki
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Publication number: 20040135734Abstract: Multiple monopole antennas or loop antennas for generating electromagnetic fields whose phases become opposite to the phase of an electromagnetic field that the conventional single monopole antenna or loop antenna generates are located in proximity to the conventional single monopole antenna or loop antenna such that the components of the electromagnetic field in directions other than a probe-desired direction will be cancelled out.Type: ApplicationFiled: October 30, 2003Publication date: July 15, 2004Inventors: Kouichi Uesaka, Masami Makuuchi, Kenichi Shinbo
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Patent number: 6697755Abstract: In an odd side storage circuit, logical values of a decision subject signal HCMP are stored in first and second FFs respectively at decision edges LH and HL generated from odd-numbered edges of a decision edge EH. Logical values of a delayed decision subject signal HCMP′ are stored in third and fourth FFs. According to a selection signal generated by a selection signal generation circuit based on outputs of the third and fourth FFs, a first selector selects an output of the first or second FF. An even side storage circuit operates similarly at even-numbered edges. A second selector selects the odd and even side storage circuits alternately. The FFs in the odd and even side storage circuits are reset by a decision edge LH′ of the even side and the decision edge HL of the odd side, respectively.Type: GrantFiled: May 31, 2002Date of Patent: February 24, 2004Assignee: Hitachi, Ltd.Inventors: Fujio Oonishi, Kenichi Shinbo, Ritsuro Orihashi, Masashi Fukuzaki, Nobuo Motoki
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Patent number: 6617860Abstract: An electromagnetic wave source detecting apparatus may include a plurality of probes for measuring intensities of an electric field or magnetic field generated from an object to be measured at each measuring position. Calculation means may calculate a phase difference or time difference between electric fields or magnetic fields associated with the probes from the electric field or magnetic field intensities measured by the individual plural probes. A position of an electromagnetic wave source existing in the measured object may be calculated and identified by using the phase difference or time difference thus calculated. A magnitude of a current existing in the electromagnetic wave source at the position thus calculated may be identified on the basis of the electric field or magnetic field intensities thus measured.Type: GrantFiled: May 16, 2002Date of Patent: September 9, 2003Assignee: Hitachi, Ltd.Inventors: Kouichi Uesaka, Kenichi Shinbo
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Publication number: 20030167145Abstract: In an odd side storage circuit, logical values of a decision subject signal HCMP are stored in first and second FFs respectively at decision edges LH and HL generated from odd-numbered edges of a decision edge EH. Logical values of a delayed decision subject signal HCMP′ are stored in third and fourth FFs. According to a selection signal generated by a selection signal generation circuit based on outputs of the third and fourth FFs, a first selector selects an output of the first or second FF. An even side storage circuit operates similarly at even-numbered edges. A second selector selects the odd and even side storage circuits alternately. The FFs in the odd and even side storage circuits are reset by a decision edge LH′ of the even side and the decision edge HL of the odd side, respectively.Type: ApplicationFiled: May 31, 2002Publication date: September 4, 2003Applicant: Hitachi, Ltd.Inventors: Fujio Oonishi, Kenichi Shinbo, Ritsuro Orihashi, Masashi Fukuzaki, Nobuo Motoki
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Publication number: 20030140286Abstract: The present invention provides a pulse generation circuit comprising: a pulse formation circuit for generating normal and dummy pulses according to second delay value data; a data calculation circuit for calculating first delay value data being shown a timing at which the pulses is generated from the pulse formation circuit according to pattern data that has information for determining whether to generate pulses from the pulse formation circuit; a dummy pulse control circuit for controlling generation of a dummy pulse in a no-pulse-generation cycle from the pulse formation circuit according to the second delay value data obtained by detecting said no-pulse-generation cycle from said first delay value data; and a logical gate circuit for eliminating the dummy pulses generated from the pulse formation circuit, being disposed between said pulse formation circuit.Type: ApplicationFiled: January 16, 2003Publication date: July 24, 2003Inventors: Kenichi Shinbo, Fujio Oonishi, Ritsurou Orihashi, Masashi Fukuzaki, Nobuo Motoki
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Publication number: 20030040874Abstract: In an odd side storage circuit, logical values of a decision subject signal HCMP are stored in first and second FFs respectively at decision edges LH and HL generated from odd-numbered edges of a decision edge EH. Logical values of a delayed decision subject signal HCMP′ are stored in third and fourth FFs. According to a selection signal generated by a selection signal generation circuit based on outputs of the third and fourth FFs, a first selector selects an output of the first or second FF. An even side storage circuit operates similarly at even-numbered edges. A second selector selects the odd and even side storage circuits alternately. The FFs in the odd and even side storage circuits are reset by a decision edge LH′ of the even side and the decision edge HL of the odd side, respectively.Type: ApplicationFiled: October 10, 2002Publication date: February 27, 2003Applicant: Hitachi, Ltd.Inventors: Fujio Oonishi, Kenichi Shinbo, Ritsuro Orihashi, Masashi Fukuzaki, Nobuo Motoki
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Publication number: 20020153904Abstract: There are provided electromagnetic wave source detecting apparatus and method as well as electromagnetic wave source analyzing system and method which can detect and analyze a source of (electromagnetic disturbing wave) representing a main factor in generating an electromagnetic field remotely of the apparatus in order to suppress the electromagnetic field intensity at the remote distance from the apparatus to below a regulated value.Type: ApplicationFiled: May 16, 2002Publication date: October 24, 2002Inventors: Kouichi Uesaka, Kenichi Shinbo
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Patent number: 6411104Abstract: There are provided electromagnetic wave source detecting apparatus and method as well as electromagnetic wave source analyzing system and method which can detect and analyze a source of (electromagnetic disturbing wave) representing a main factor in generating an electromagnetic field remotely of the apparatus in order to suppress the electromagnetic field intensity at the remote distance from the apparatus to below a regulated value.Type: GrantFiled: April 20, 2000Date of Patent: June 25, 2002Assignee: Hitachi, Ltd.Inventors: Kouichi Uesaka, Kenichi Shinbo