Patents by Inventor Kenichi Tsutsumi

Kenichi Tsutsumi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240067883
    Abstract: Provided is a production system for producing a hydrocarbon compound, which is a hydrocarbon compound production system capable of managing an environmental load reducing effect derived from a raw material. The hydrocarbon compound production system includes a hydrogen production device that generates hydrogen, a carbon dioxide supply device that supplies a carbon dioxide, and a hydrocarbon compound production device that generates a hydrocarbon compound from each of the hydrogen generated by the hydrogen production device and the carbon dioxide supplied from the carbon dioxide supply device, wherein, on the basis of at least either one of respective environmental indicators of the hydrogen generated by the hydrogen production device and the carbon dioxide supplied from the carbon dioxide supply device, an environmental load level of the hydrocarbon compound generated by the hydrocarbon compound production device is categorized.
    Type: Application
    Filed: February 24, 2022
    Publication date: February 29, 2024
    Inventors: Shinya MARUSHIMA, Kenichi IRIE, Takahiro KAMO, Tadateru TANIOKA, Yoshimasa ANDO, Atsushi TSUTSUMI
  • Publication number: 20230402252
    Abstract: A charged particle beam device acquires an image by scanning a specimen with a probe formed from a charged particle beam and detects a signal emitted from the specimen. The charged particle beam device includes an optical system that forms the probe; a control unit that repeatedly performs correction processing and image acquisition processing for acquiring a frame image; and an image processing unit that generates an image of the specimen based on a plurality of the frame images. In the correction processing, the control unit acquires a reference image, and corrects the shifting of the irradiation position of the probe. The image processing unit acquires position shift information, corrects a position shift between the frame images based on the position shift information, and generates an image of the specimen based on the plurality of corrected frame images.
    Type: Application
    Filed: June 12, 2023
    Publication date: December 14, 2023
    Applicant: JEOL Ltd.
    Inventors: Nobuyuki Ikeo, Kenichi Tsutsumi
  • Publication number: 20230307206
    Abstract: A charged particle beam apparatus that forms a probe with a charged particle beam and scans a specimen with the probe to acquire a scanning image. The charged particle beam apparatus includes an optical system for scanning the specimen with the probe; a detector that detects a signal generated from the specimen through the scanning of the specimen with the probe; and a control unit that controls the optical system. The control unit performs correction processing of acquiring a reference image obtained by the scanning of the specimen with the probe, comparing the reference image to a criterion image to determine a drift amount, and correcting a displacement of an irradiation position with the probe on the specimen based on the drift amount; and processing of setting a frequency with which the correction processing is to be performed based on the drift amount.
    Type: Application
    Filed: March 14, 2023
    Publication date: September 28, 2023
    Inventors: Kenichi Tsutsumi, Tatsuya Uchida, Kazushiro Yokouchi, Nobuyuki Ikeo, Konomi Ikita
  • Patent number: 11710615
    Abstract: A charged particle beam device includes: a charged particle beam source; an analyzer that analyzes and detects particles including secondary electrons and backscattered charged particles that are emitted from a specimen by irradiating the specimen with a primary charged particle beam emitted from the charged particle beam source; a bias voltage applying unit that applies a bias voltage to the specimen; and an analysis unit that extracts a signal component of the secondary electrons based on a first spectrum obtained by detecting the particles with the analyzer in a state where a first bias voltage is applied to the specimen, and a second spectrum obtained by detecting the particles with the analyzer in a state where a second bias voltage different from the first bias voltage is applied to the specimen.
    Type: Grant
    Filed: January 28, 2022
    Date of Patent: July 25, 2023
    Assignee: JEOL Ltd.
    Inventors: Kenichi Tsutsumi, Tatsuya Uchida
  • Patent number: 11698336
    Abstract: An analysis method includes: obtaining n×m pieces of map data by repeating, m times, a map measurement in which n pieces of map data are obtained by scanning a specimen with a primary probe to detect electrons emitted from the specimen with an electron spectrometer, while measurement energy ranges of an analyzer are varied; and generating a spectral map in which a position on the specimen is associated with a spectrum based on the n×m pieces of map data, the measurement energy ranges of m times of the map measurement not overlapping each other.
    Type: Grant
    Filed: September 29, 2020
    Date of Patent: July 11, 2023
    Assignees: JEOL Ltd., National Institute of Advanced Industrial Science and Technology
    Inventors: Kenichi Tsutsumi, Akihiro Tanaka, Kazushiro Yokouchi, Tatsuya Uchida, Noboru Taguchi, Shingo Tanaka
  • Patent number: 11391682
    Abstract: An Auger electron microscope includes a processing unit, and the processing unit performs processing of: acquiring an actually measured Auger spectrum obtained by measuring a test specimen containing an analysis target element; acquiring a plurality of first standard Auger spectra obtained by measuring a plurality of standard specimens each containing the same analysis target element but in different chemical states; calculating, based on a test specimen measurement condition that is a measurement condition when the test specimen has been measured and a standard specimen measurement condition that is a measurement condition when the standard specimens have been measured, a plurality of second standard Auger spectra under the test specimen measurement condition from the plurality of first standard Auger spectra; and performing curve fitting calculation of the actually measured Auger spectrum by using the plurality of calculated second standard Auger spectra.
    Type: Grant
    Filed: February 17, 2021
    Date of Patent: July 19, 2022
    Assignee: JEOL Ltd.
    Inventors: Kenichi Tsutsumi, Tatsuya Uchida
  • Publication number: 20220157558
    Abstract: A charged particle beam device includes: a charged particle beam source; an analyzer that analyzes and detects particles including secondary electrons and backscattered charged particles that are emitted from a specimen by irradiating the specimen with a primary charged particle beam emitted from the charged particle beam source; a bias voltage applying unit that applies a bias voltage to the specimen; and an analysis unit that extracts a signal component of the secondary electrons based on a first spectrum obtained by detecting the particles with the analyzer in a state where a first bias voltage is applied to the specimen, and a second spectrum obtained by detecting the particles with the analyzer in a state where a second bias voltage different from the first bias voltage is applied to the specimen.
    Type: Application
    Filed: January 28, 2022
    Publication date: May 19, 2022
    Inventors: Kenichi Tsutsumi, Tatsuya Uchida
  • Patent number: 11315753
    Abstract: A charged particle beam device includes: a charged particle beam source; an analyzer that analyzes and detects particles including secondary electrons and backscattered charged particles that are emitted from a specimen by irradiating the specimen with a primary charged particle beam emitted from the charged particle beam source; a bias voltage applying unit that applies a bias voltage to the specimen; and an analysis unit that extracts a signal component of the secondary electrons based on a first spectrum obtained by detecting the particles with the analyzer in a state where a first bias voltage is applied to the specimen, and a second spectrum obtained by detecting the particles with the analyzer in a state where a second bias voltage different from the first bias voltage is applied to the specimen.
    Type: Grant
    Filed: September 11, 2020
    Date of Patent: April 26, 2022
    Assignee: JEOL Ltd.
    Inventors: Kenichi Tsutsumi, Tatsuya Uchida
  • Publication number: 20210255124
    Abstract: An Auger electron microscope includes a processing unit, and the processing unit performs processing of: acquiring an actually measured Auger spectrum obtained by measuring a test specimen containing an analysis target element; acquiring a plurality of first standard Auger spectra obtained by measuring a plurality of standard specimens each containing the same analysis target element but in different chemical states; calculating, based on a test specimen measurement condition that is a measurement condition when the test specimen has been measured and a standard specimen measurement condition that is a measurement condition when the standard specimens have been measured, a plurality of second standard Auger spectra under the test specimen measurement condition from the plurality of first standard Auger spectra; and performing curve fitting calculation of the actually measured Auger spectrum by using the plurality of calculated second standard Auger spectra.
    Type: Application
    Filed: February 17, 2021
    Publication date: August 19, 2021
    Inventors: Kenichi Tsutsumi, Tatsuya Uchida
  • Publication number: 20210096063
    Abstract: An analysis method includes: obtaining n×m pieces of map data by repeating, m times, a map measurement in which n pieces of map data are obtained by scanning a specimen with a primary probe to detect electrons emitted from the specimen with an electron spectrometer, while measurement energy ranges of an analyzer are varied; and generating a spectral map in which a position on the specimen is associated with a spectrum based on the n×m pieces of map data, the measurement energy ranges of m times of the map measurement not overlapping each other.
    Type: Application
    Filed: September 29, 2020
    Publication date: April 1, 2021
    Inventors: Kenichi Tsutsumi, Akihiro Tanaka, Kazushiro Yokouchi, Tatsuya Uchida, Noboru Taguchi, Shingo Tanaka
  • Publication number: 20210082660
    Abstract: A charged particle beam device includes: a charged particle beam source; an analyzer that analyzes and detects particles including secondary electrons and backscattered charged particles that are emitted from a specimen by irradiating the specimen with a primary charged particle beam emitted from the charged particle beam source; a bias voltage applying unit that applies a bias voltage to the specimen; and an analysis unit that extracts a signal component of the secondary electrons based on a first spectrum obtained by detecting the particles with the analyzer in a state where a first bias voltage is applied to the specimen, and a second spectrum obtained by detecting the particles with the analyzer in a state where a second bias voltage different from the first bias voltage is applied to the specimen.
    Type: Application
    Filed: September 11, 2020
    Publication date: March 18, 2021
    Inventors: Kenichi Tsutsumi, Tatsuya Uchida
  • Publication number: 20190242033
    Abstract: A sea-islands type composite fiber includes an island component that is a polymer having moisture absorbability; a ratio (T/R) of a thickness T of an outermost layer to a diameter R of the fiber in a transverse cross section of the fiber of 0.05 to 0.25; and a moisture absorption rate difference (?MR) after a hot water treatment of 2.0 to 10.0%, wherein the thickness of an outermost layer is a difference between a radius of the fiber and a radius of a circumscribed circle formed by connecting apexes of the island components disposed in an outermost circle, and represents a thickness of a sea component in the outermost layer.
    Type: Application
    Filed: June 30, 2017
    Publication date: August 8, 2019
    Applicant: Toray Industries, Inc.
    Inventors: Hidekazu KANO, Shogo HAMANAKA, Hideki MORIOKA, Kenichi TSUTSUMI, Katsuhiko MOCHIZUKI
  • Patent number: 9175618
    Abstract: An engine of a vehicle is provided with an engine control device including an idle speed control (ISC) device provided for an intake bypass passage connecting an upper side and a lower side of a throttle valve installed in an intake passage so as to control an idle speed of the engine by adjusting an amount of air flowing through the intake bypass passage at a time of idling of the engine. The engine control device includes a throttle opening degree sensor disposed in the intake passage and configured to detect a degree of opening of the throttle valve, an intake pressure sensor disposed in the intake passage and configured to detect an intake negative pressure at the lower side of the throttle valve, and a control unit configured to control an output of the engine.
    Type: Grant
    Filed: December 28, 2012
    Date of Patent: November 3, 2015
    Assignee: SUZUKI MOTOR CORPORATION
    Inventors: Takahiro Uchiyama, Tomoo Nagumo, Kenichi Tsutsumi, Hiroaki Otake
  • Publication number: 20110279083
    Abstract: A charging system of electric vehicles comprises: a delivery box 100 having a plurality of article storage boxes 104 each locked or unlocked by electrically operated locking devices 1042, 1043, the article storage boxes 104 being used to receive delivered or mailed articles in apartment buildings; delivery box controller 101 for controlling locking and unlocking of the locking devices 1042, 1043; a power supply circuit 202 for electrically charging the electric vehicles 300; and a control circuit 201 for controlling the power supply circuit 202, wherein the delivery box controller 101 regulates electrically charging services of the electric vehicles through the power supply circuit 202 and electrification controller 201 in addition to controlling operation of the locking devices 1042, 1043 for the delivery box 100.
    Type: Application
    Filed: January 26, 2010
    Publication date: November 17, 2011
    Applicants: MITSUBISHI JIDOSHA KOGYO KABUSHIKI KAISHA, JAPAN DELIVERY SYSTEM CORPORATION
    Inventors: Yasuo Asai, Nobuo Momose, Kenichi Tsutsumi
  • Patent number: 6365659
    Abstract: Polyester composition comprising a polyester and 0.5 to 300 ppm, expressed as titanium atoms, of a compound oxide (A) containing titanium as an essential element and also containing a metal element selected from the group consisting of aluminum, zirconium, germanium, tin and silicon, and 0.001 to 40 wt % of particles having an average particle size of 0.01 to 10 &mgr;m, and a production method, and a fiber or film composed of the polyester composition.
    Type: Grant
    Filed: June 8, 2000
    Date of Patent: April 2, 2002
    Assignee: Toray Industries, Inc.
    Inventors: Masatoshi Aoyama, Keisuke Honda, Kenichi Tsutsumi, Masahiro Kimura
  • Patent number: 6156867
    Abstract: The present invention relates to a polyester polymerization catalyst, comprising a solution containing an aluminum compound and an alkali compound, with water or an organic solvent or a mixture consisting of water and an organic solvent as the medium, a production method thereof, and a polyester production method, in which the product obtained by the esterification reaction or ester interchange reaction between an aromatic dicarboxylic acid or any of its ester forming derivative and a diol is polycondensed, to produce a polyester, comprising the use of said polymerization catalyst containing an aluminum compound.The present invention can provide a polyester excellent in processability and can overcome such problems as spinneret contamination, filtration pressure rise, filament breaking, film breaking and foreign matter production in the production process of products such as fibers, films, resins and bottles.
    Type: Grant
    Filed: November 6, 1998
    Date of Patent: December 5, 2000
    Assignee: Toray Industries, Inc.
    Inventors: Masatoshi Aoyama, Kenichi Tsutsumi, Minoru Uchida
  • Patent number: 6020454
    Abstract: The present invention relates to a polyester polymerization catalyst, comprising a solution containing an aluminum compound and an alkali compound, with water or an organic solvent or a mixture consisting of water and an organic solvent as the medium, a production method thereof, and a polyester production method, in which the product obtained by the esterification reaction or ester interchange reaction between an aromatic dicarboxylic acid or any of its ester forming derivative and a diol is polycondensed, to produce a polyester, comprising the use of said polymerization catalyst containing an aluminum compound.The present invention can provide a polyester excellent in processability and can overcome such problems as spinneret contamination, filtration pressure rise, filament breaking, film breaking and foreign matter production in the production process of products such as fibers, films, resins and bottles.
    Type: Grant
    Filed: November 6, 1998
    Date of Patent: February 1, 2000
    Assignee: Toray Industries, Inc.
    Inventors: Masatoshi Aoyama, Kenichi Tsutsumi, Minoru Uchida
  • Patent number: 5629632
    Abstract: A tester system comprising first areas on which objects to be tested are mounted, a first movable alignment section for aligning objects, first and second tester units each having terminals connected to each object and serving to test electric properties of each object, a second movable alignment section for aligning the objects after they have been tested, second areas on which the objects are mounted after they have been tested, a loader for transferring a predetermined number of objects from the first areas to the first alignment section, a first carrier mechanism for holding the predetermined number of objects aligned on the first alignment section and transferring them to the first tester unit, connecting the object to the terminals of the first tester unit, and transferring the objects to the second alignment section, a second carrier mechanism for holding the predetermined number of objects aligned on the first alignment section and transferring them to the second tester unit, connecting the object to
    Type: Grant
    Filed: March 13, 1996
    Date of Patent: May 13, 1997
    Assignee: Tokyo Electron Limited
    Inventor: Kenichi Tsutsumi
  • Patent number: 5069105
    Abstract: Disclosed is a musical tone signal generating apparatus for an electronic musical instrument. When waveforms are switched to change a tone color in correspondence with a change in pitch, waveforms are switched not simultaneously with a change in pitch but when waveform data corresponding to a loop end address is read out, and a peak value of the waveform falls within a predetermined range or a zero-crossing point is detected, thereby smoothly switching waveforms. The pitch is also changed at the above-mentioned timing to prevent generation of an unnecessary tone color upon switching. Furthermore, waveforms are switched by cross-fade control to more smoothly switch output waveforms.
    Type: Grant
    Filed: January 29, 1990
    Date of Patent: December 3, 1991
    Assignee: Casio Computer Co., Ltd.
    Inventors: Akio Iba, Kenichi Tsutsumi
  • Patent number: 5040448
    Abstract: An electronic material instrument includes a tone generator for synthesizing tones by using a number of time-division multiplexed (TDM) modules, an input unit for programming a connection configuration (tone synthesis algorithm) for the modules of each module pair, and a processing unit for converting the input program into control data for each module and transferring the control data to the tone generator. In one embodiment, each module pair is selectively operative in an addition mode, a phase mode or a ring modulation mode, independently of the modes selected for the other module pairs. It is thus possible to attain a tone synthesis desired by the user, and to make the best use of the capacity of the tone generator.
    Type: Grant
    Filed: November 27, 1989
    Date of Patent: August 20, 1991
    Assignee: Casio Computer Co., Ltd.
    Inventors: Akinori Matsubara, Kenichi Tsutsumi, Youji Kaneko, Takashi Akutsu, Naofumi Tateishi