Patents by Inventor Kenichiro Kusano

Kenichiro Kusano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230209817
    Abstract: A semiconductor memory device includes a semiconductor region including an active region for a memory transistor and plural depressions for trench isolation, insulating regions respectively provided at the depressions, a gate electrode and a gate insulation film. The gate electrode extends in a direction from one to the other of a first insulating region and second insulating region, and passes over the active region. The gate insulation film is provided between the gate electrode and the active region provided between the first and second insulating regions. The first and second insulating regions includes an adjacent region and a distant region. The distant region is adjacent to the adjacent region under the gate electrode. The adjacent region is adjacent to the active region under the gate electrode. The adjacent region is provided between the distant region and the active region, and has a smaller thickness than the distant region.
    Type: Application
    Filed: December 21, 2022
    Publication date: June 29, 2023
    Inventor: KENICHIRO KUSANO
  • Patent number: 11041824
    Abstract: A measurement device including: an ion-sensitive element; a reference electrode disposed in a state in which a measurement subject is interposed between the reference electrode and the ion-sensitive element; and a controller configured to: establish a first state at a predetermined interval, the first state being a state in which a current flows at the ion-sensitive element, and establish a second state within each period after the first state has been established and before the first state is next established, the second state being a state in which a potential difference between the ion-sensitive element and the reference electrode is greater than a potential difference between the ion-sensitive element and the reference electrode in the first state.
    Type: Grant
    Filed: May 23, 2019
    Date of Patent: June 22, 2021
    Assignee: LAPIS SEMICONDUCTOR CO., LTD.
    Inventors: Kenichiro Kusano, Atsuhiko Okada, Hiroaki Sano, Masao Okihara
  • Publication number: 20190360962
    Abstract: A measurement device including: an ion-sensitive element; a reference electrode disposed in a state in which a measurement subject is interposed between the reference electrode and the ion-sensitive element; and a controller configured to: establish a first state at a predetermined interval, the first state being a state in which a current flows at the ion-sensitive element, and establish a second state within each period after the first state has been established and before the first state is next established, the second state being a state in which a potential difference between the ion-sensitive element and the reference electrode is greater than a potential difference between the ion-sensitive element and the reference electrode in the first state.
    Type: Application
    Filed: May 23, 2019
    Publication date: November 28, 2019
    Inventors: KENICHIRO KUSANO, ATSUHIKO OKADA, HIROAKI SANO, MASAO OKIHARA
  • Patent number: 8604588
    Abstract: A semiconductor device including: a first resistance element formed of a first polysilicon layer that contains impurities; a second resistance element provided on a same surface as the first polysilicon layer, and formed of a second polysilicon layer that contains an equal amount of impurities to the first polysilicon layer; a first interlayer insulation film provided so as to cover the first resistance element and the second resistance element; and a first metal layer provided on the first interlayer insulation film so as to cover the second resistance element with the first interlayer insulation film disposed therebetween.
    Type: Grant
    Filed: February 22, 2011
    Date of Patent: December 10, 2013
    Assignee: Oki Semiconductor Co., Ltd.
    Inventors: Kenichiro Kusano, Junko Azami
  • Publication number: 20110204481
    Abstract: The present invention provides a semiconductor device including: a first resistance element formed of a first polysilicon layer that contains impurities; a second resistance element provided on a same surface as the first polysilicon layer, and formed of a second polysilicon layer that contains an equal amount of impurities to the first polysilicon layer; a first interlayer insulation film provided so as to cover the first resistance element and the second resistance element; and a first metal layer provided on the first interlayer insulation film so as to cover the second resistance element with the first interlayer insulation film disposed therebetween.
    Type: Application
    Filed: February 22, 2011
    Publication date: August 25, 2011
    Applicant: OKI SEMICONDUCTOR CO., LTD.
    Inventors: Kenichiro Kusano, Junko Azami
  • Publication number: 20040097414
    Abstract: A full-length cDNA encoding the human FGF23 protein was isolated, and mutants having a single amino acid substitution in the cDNA were constructed using the mutagenesis method. These mutants had the effect of decreasing the phosphorus level in the blood when expressed in vivo. These mutants and the DNAs encoding them are expected to be useful as therapeutic agents, or employed for gene therapy against hyperphosphatemia.
    Type: Application
    Filed: December 12, 2003
    Publication date: May 20, 2004
    Inventors: Hirotaka Itoh, Naoshi Fukushima, Hitoshi Saito, Kenichiro Kusano