Abstract: A first portion of an insulator is provided on a first region of an end surface of a tooth. A second portion of the insulator is provided on a second region of the end surface of the tooth so as to be separated from the first portion in a circumferential direction. A third portion of the insulator is connected to fourth side ends of the first portion and the second portion in a radial direction. A coil includes a crossing portion in a coil end. A stator includes an insert body in a housing space. The insert is made of a material having a higher thermal conductivity than a material forming the insulator.

Abstract: A crack estimation device which accurately estimates a crack inside a structure is provided. The crack estimation device includes: a measurement unit which measures deformation of a measurement plane as a measurement plane deformation vector; a model generation unit which sets deformation of the measurement plane when a crack is generated in a crack generation plane, as a measurement plane estimated change vector for multiple types of crack candidates; and a crack state analysis unit which obtains a similarity between the measurement plane deformation vector and the measurement plane estimated change vector, normalizes the similarity, and estimates the crack generated in the crack generation plane from a result obtained by multiplying a vector of a state quantity indicating a state of the crack generation plane by the normalized similarity for each crack candidate, and adding together results of the multiplication for all the crack candidates.

Abstract: Provided are a shape model setting circuitry for setting a shape model of a target structure, a crack candidate plane in the shape model, and an observation plane of the shape model, an estimation model generator for generating an estimation model obtained from a numerical analysis of a structural analysis model by sequentially changing a boundary condition of the crack candidate plane in the structural analysis model generated from the shape model, and a crack state analyzer for estimating a position and a size of the crack by obtaining a distribution of load and displacement in the crack candidate plane at the same time by probabilistic inference through the application of an observation plane deformation vector indicating deformation of the observation plane obtained from measurement values, the estimation model, and a latent variable indicating presence or absence of the crack in the crack candidate plane.

Abstract: This crack estimation device includes: a data determination unit which determines a shape model of a target structure to be inspected, and a crack occurrence plane and an observation plane in the shape model; an estimation data calculation unit which outputs an estimation model for estimating a state of the crack occurrence plane from a state of the observation plane, on the basis of a matrix that associates, with each other, the state of the crack occurrence plane and the state of the observation plane, obtained through numerical analysis of a structural analysis model generated from the shape model; and a crack estimation unit which estimates a state of a crack at the crack occurrence plane on the basis of the estimation model and a measurement value for the target structure actually measured at the observation plane.

Abstract: The present invention is directed to a new joint estimation framework employing MAP estimation based on pixel-based latent variables for tissue types. The method combines the geometrical information described by latent MRF, statistical relation between tissue types and P-C coefficients, and Poisson noise models of PCD data, and makes possible the continuous Baysian estimation from detected photon counts. The proposed method has better accuracy and RMSE than the method using FBP and thresholding. The joint estimation framework has the potential to further improve the accuracy by introducing more information about tissues in human body, e.g., the location, size, and number of tissues, or limited variation of neighboring tissues, which will be easily formulated by pixel-based latent variables.

Abstract: The present invention is directed to a new joint estimation framework employing MAP estimation based on pixel-based latent variables for tissue types. The method combines the geometrical information described by latent MRF, statistical relation between tissue types and P-C coefficients, and Poisson noise models of PCD data, and makes possible the continuous Baysian estimation from detected photon counts. The proposed method has better accuracy and RMSE than the method using FBP and thresholding. The joint estimation framework has the potential to further improve the accuracy by introducing more information about tissues in human body, e.g., the location, size, and number of tissues, or limited variation of neighboring tissues, which will be easily formulated by pixel-based latent variables.

Abstract: A provided optical-phase-distribution measuring method, by which optical phase distribution is identified at high speed and with high accuracy from information on light-intensity distribution without using a special measuring device, comprises steps: for inputting light to be measured to optical systems, respectively, modulating the intensity and the phase, detecting the output light to be measured with CCD, and measuring the intensity distribution of detected light to be measured as an image with an optical-phase-distribution measuring system provided with the two different optical systems; for setting an observation equation, based on the intensity distribution and on the optical characteristics of the optical systems; for setting a phase-distribution identification inverse-problem from the observation equation, and formulating the set phase-distribution identification inverse-problem as a first nonlinear optimization problem in which complex amplitude representing the light to be measured is assumed to be

Abstract: In a micro lithography using a photoresist, the invention provides a high resolution pattern projecting method which is not exposed to a proximity effect, by coating further a photochromic material on a surface of a photoresist layer, dividing a circuit pattern into plural image sub-sets, forming an image of the divided first sub-sets onto a substrate so as to expose the photoresist layer, thereafter recovering an absorption rate of the photochromic material to an initial state, thereafter forming an image of the divided next sub-sets onto the substrate so as to expose the photoresist layer, thereby repeatedly executing the formation with respect to all of the sub-sets, and forming the circuit patterns onto the photoresist layer on the substrate.

Abstract: A provided optical-phase-distribution measuring method, by which optical phase distribution is identified at high speed and with high accuracy from information on light-intensity distribution without using a special measuring device, comprises steps: for inputting light to be measured to optical systems, respectively, modulating the intensity and the phase, detecting the output light to be measured with CCD, and measuring the intensity distribution of detected light to be measured as an image with an optical-phase-distribution measuring system provided with the two different optical systems; for setting an observation equation, based on the intensity distribution and on the optical characteristics of the optical systems; for setting a phase-distribution identification inverse-problem from the observation equation, and formulating the set phase-distribution identification inverse-problem as a first nonlinear optimization problem in which complex amplitude representing the light to be measured is assumed to be

Abstract: An object of the present invention is to provide a boundary element analytic method and a boundary element analytic program, which are capable of coping with the problem of diversity in symmetric property to be encountered when carrying out an analytic operation by taking advantage of the symmetric property of a subject to be analyzed, and thus providing an efficient analysis. Various types of data for the use in the boundary element analysis, which have been previously input at step S101, are stored at step S102. To carry out this operation, at least boundary element definition information for defining a boundary element in the subject to be analyzed and state quantity information in which boundary element identification information for identifying the defined boundary element is associated with the boundary element for each state quantity thereof.

Abstract: A plating analysis method is disclosed for electroplating in a system in which resistance of an anode and/or a cathode cannot be neglected. This method comprises giving a three-dimensional Laplace's equation, as a dominant equation, to a region containing a plating solution; discretizing the Laplace's equation by the boundary element method; giving a two-dimensional or three-dimensional Poisson's equation dealing with a flat surface or a curved surface, as a dominant equation, to a region within the anode and/or the cathode; discretizing the Poisson's equation by the boundary element method or the finite element method; and formulating a simultaneous equation of the discretized equations to calculate a current density distribution i and a potential distribution &phgr; in the system. The method can obtain the current density and potential distributions efficiently for a plating problem requiring consideration for the resistance of an electrode.

Abstract: An object to be analyzed for corrosion and corrosion prevention is divided into a plurality of adjacent regions of plural types by a dividing plane, with one of the adjacent regions being referred to as an attentional region with a boundary as the dividing plane and the other as a non-attentional region with a boundary as the dividing plane. An initial current density or an initial potential is imparted to each element of the boundary of the non-attentional region to effect a boundary element analysis for determining a relationship between a potential and a current density in each the element. A potential distribution and a current density distribution in the attentional region in its entirety are determined, using the relationship between the potential and the current density in each the element of the boundary of the non-attentional region as a boundary condition for the attentional region.