Patents by Inventor Kenji Arinaga

Kenji Arinaga has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5534109
    Abstract: A method for etching an HgCdTe substrate selectively by dry etching. A substrate is selectively etched without damaging the substrate during a simple process in which the higher selectivity of an HgCdTe substrate versus a resist mask is obtainable. Removal of the resist mask after etching is easy. The etching gas contains molecules having a bond of nitrogen and hydrogen and is formed into plasma. An HgCdTe substrate is etched with a resist film as a mask by the plasma gas.
    Type: Grant
    Filed: October 11, 1994
    Date of Patent: July 9, 1996
    Assignee: Fujitsu Limited
    Inventors: Koji Fujiwara, Gen Sudo, Kenji Arinaga
  • Patent number: 5196692
    Abstract: A photoelectric transducer having a photocell includes a compound semiconductor substrate in which a photodiode is doped by an impurity of a conductivity type opposite to that of the substrate. An enclosure region is formed by the same doping impurity as the photodiode, surrounding but spaced apart from the photodiode. A gate electrode is formed on a portion of an insulation layer, the latter formed all over the substrate surface, which extends between the photodiode and the enclosure region. The enclosure region is selectively connected, via a contact hole through the insulation layer and a first switch to ground level. The gate electrode is connected via a second switch to a predetermined voltage having the same polarity as the conductivity type of the substrate.
    Type: Grant
    Filed: January 24, 1992
    Date of Patent: March 23, 1993
    Assignee: Fujitsu Limited
    Inventors: Kenji Arinaga, Nobuyuki Kajihara, Gen Sudo, Koji Fujiwara, Soichiro Hikida, Yuichiro Ito