Abstract: A semiconductor examination apparatus includes an energy source device that supplies a semiconductor substrate having a pn junction with excitation energy that causes luminescence in the semiconductor substrate, an image capturing device that captures a first luminescence image of the semiconductor substrate supplied with first excitation energy and a second luminescence image of the semiconductor substrate supplied with second excitation energy that is different in magnitude from the first excitation energy, a luminescence image processing device that calculates the difference in luminescence intensity between the first luminescence image and the second luminescence image at positions on the semiconductor substrate and generates intensity difference image data, and a detecting device that detects a crack position of a crack occurring in the semiconductor substrate on the basis of determination values based on the magnitude of the difference on the intensity difference image data.

Abstract: The present invention is a birefringence measuring device that requires only three types of light intensity information and can measure birefringence characteristics of an object with a relatively inexpensive device configuration. One embodiment comprises a light source for emitting a light flux having a specific polarization state towards the object to be measured, an optical system for extracting each of light fluxes in predetermined three polarization direction; and, from the light flux having passed the object to be measured, a detector for detecting a light amount of each of the light fluxes in the predetermined three polarization directions extracted by the optical system, and a processor for calculating a size and an azimuth of the birefringence of the object to be measured. The processor may calculate the birefringence size and azimuth by assigning each of the light amounts of the light fluxes detected by the detector to a predetermined function expression.

Abstract: A disease resistance capacity of vegetables, grasses and flowers, etc., is enhanced and their survival rates are improved by growing plants in an appropriate coexistence of a glycolipid derived from Pantoea agglomerans or a composition containing the glycolipid. Thereby, a method of augmenting disease resistance of vegetables, grasses and flowers, etc., and growing agricultural crops with high quality is provided, and further a novel plant growing agent and plant disease resistance inducer that enables this are provided. As a result, it becomes possible to cultivate agricultural crops or increase productivity with as little use of agricultural chemicals as possible. Even if an amount of the agricultural chemical is reduced, a cultivation success rate of agricultural crops can be enhanced and immunity of the plant body can be enhanced even where useful soil bacteria are not frequently present.

Abstract: The present invention is a birefringence measuring device that requires only three types of light intensity information and thus, can measure birefringence characteristics of an object to be measured with relatively inexpensive device configuration and comprises a light source 1 for emitting a light flux having a specific polarization state to the object to be measured, an optical system for extracting each of light fluxes in predetermined three polarization directions from the light flux having passed the object to be measured, light-amount detecting means 9 for detecting a light amount of each of the light fluxes in the predetermined three polarization directions extracted by the optical system, and birefringence amount calculating means 20 for calculating a size of the birefringence of the object to be measured and an azimuth thereof by assigning each of the light amounts of the light fluxes detected by the light-amount detecting means to a predetermined function expression.

Abstract: A semiconductor examination apparatus includes an energy source device that supplies a semiconductor substrate having a pn junction with excitation energy that causes luminescence in the semiconductor substrate, an image capturing device that captures a first luminescence image of the semiconductor substrate supplied with first excitation energy and a second luminescence image of the semiconductor substrate supplied with second excitation energy that is different in magnitude from the first excitation energy, a luminescence image processing device that calculates the difference in luminescence intensity between the first luminescence image and the second luminescence image at positions on the semiconductor substrate and generates intensity difference image data, and a detecting device that detects a crack position of a crack occurring in the semiconductor substrate on the basis of determination values based on the magnitude of the difference on the intensity difference image data.

Abstract: The stress of a sample semiconductor wafer is detected with high accuracy in the form of an absolute value without rotating the sample or the entire optical system. A laser light R is subjected to photoelastic modulation in a PEM 6 to generate a birefringence phase difference and then it is passed through first and second quarter wavelength plates and passes through a semiconductor wafer D having residual stress. When it is passed through a test piece, the direction of the stress of the test piece is detected when the angle between the laser light R and a linear polarization light is 0 and 90 degrees. The transmitted electric signal is delivered to an analog/digital converter 16, and the signal is inputted to a signal processor thus generating transmission signal data. The signal processor reads out the stored reference signal data and the transmission signal data and calculates a reference birefringence phase difference and the absolute values of the birefringence phase difference.

Abstract: The stress of a sample semiconductor wafer is detected with high accuracy in the form of an absolute value without rotating the sample or the entire optical system. A laser light R is subjected to photoelastic modulation in a PEM 6 to generate a birefringence phase difference and then it is passed through first and second quarter wavelength plates and detected. This reference signal data is stored in a signal processor. The laser light R of polarized wave subjected to photoelastic modulation in the PEM 6 and passed through the quarter wavelength plate has a birefringence phase difference and passes through a semiconductor wafer D having residual stress. When it is passed through a test piece, the direction of the stress of the test piece is detected when the angle between the laser light R and a linear polarization light is 0 and 90 degrees.

Abstract: A blade assembly for a hydraulic power transmitting apparatus is made up of a plurality of blades disposed at an equal distance from one another; a joint piece provided at a radially outer end of each of the blades; and a tie member for tying the blades together at the joint pieces. The blades, the joint pieces and the tie member are integrally formed as a continuous semi-manufactured product of a belt-shaped metal plate. Each of the blades is raised or erected from a plane including the tie member. The joint piece is bent to change a direction of the tie member. The tie member containing therein a required number of blades is fixedly joined together at both ends into a ring shape.

Abstract: An impeller for a hydraulic power transmitting apparatus has a shell and a plurality of blades fixed to the shell. Each of the blades has a blade main body and a fixing flange which is bent at an angle relative to the blade main body. The shell and the fixing flange are placed one on top of the other and are pressed together at a fixing point such that a hollow cylindrical projection having a bottom is formed. The projection is made up of a diametrically expanded portion along a bottom outer periphery of that member out of the shell and the fixing flange which lies on an inner side in the projection. The expanded portion is thrusted into that member out of the shell and the fixing flange which lies on an outer side in the projection.