Abstract: An approximation B?f(Id,?) of a fluorescence spectral emissivity coefficient by a standard illumination light Id is obtained at following steps from spectral power distributions R(Ik,?) of sample radiation lights radiated from a fluorescence whitened sample when the fluorescence whitened sample is sequentially illuminated with a plurality of excitation lights Ik having different spectral power distributions, and a spectral power distribution Id(?) of the standard illumination light Id. Spectral power distributions Rf(Ik,?) of fluorescence are obtained from the spectral power distributions R(Ik,?) by respective excitation lights Ik (first step). The spectral power distributions Rf(Ik,?) of fluorescence by the respective excitation lights Ik are linearly combined with a given weighting coefficient Wk, and an approximation R?f(Id,?) of a spectral power distribution of fluorescence by the standard illumination light Id is obtained by equation (second step: #11).

Abstract: An approximation B?f(Id,?) of a fluorescence spectral emissivity coefficient by a standard illumination light Id is obtained at following steps from spectral power distributions R(Ik,?) of sample radiation lights radiated from a fluorescence whitened sample when the fluorescence whitened sample is sequentially illuminated with a plurality of excitation lights Ik having different spectral power distributions, and a spectral power distribution Id(?) of the standard illumination light Id. Spectral power distributions Rf(Ik,?) of fluorescence are obtained from the spectral power distributions R(Ik,?) by respective excitation lights Ik (first step). The spectral power distributions Rf(Ik,?) of fluorescence by the respective excitation lights Ik are linearly combined with a given weighting coefficient Wk, and an approximation R?f(Id,?) of a spectral power distribution of fluorescence by the standard illumination light Id is obtained by equation (second step: #11).

Abstract: Wavelength information indicating a correspondence relationship between a plurality of light receiving elements of a light receiving unit and wavelengths of pieces of lights is stored. First and second intensity distributions of the light related to first and second dispersion images are acquired based on a signal outputted from each of the light receiving elements when a monochromatic light is passed through a opening of a light shielding body and first and second dispersion images related to primary and secondary diffracted light are formed on the light receiving unit. An estimated intensity distribution of the light related to the second dispersion image is calculated from the first intensity distribution according to a predetermined relational expression. A change amount related to the wavelength information is calculated based on the estimated intensity distribution and the second intensity distribution. The wavelength information is corrected according to the change amount.

Abstract: Wavelength information indicating a correspondence relationship between a plurality of light receiving elements of a light receiving unit and wavelengths of pieces of lights is stored. First and second intensity distributions of the light related to first and second dispersion images are acquired based on a signal outputted from each of the light receiving elements when a monochromatic light is passed through a opening of a light shielding body and first and second dispersion images related to primary and secondary diffracted light are formed on the light receiving unit. An estimated intensity distribution of the light related to the second dispersion image is calculated from the first intensity distribution according to a predetermined relational expression. A change amount related to the wavelength information is calculated based on the estimated intensity distribution and the second intensity distribution. The wavelength information is corrected according to the change amount.

Abstract: A spectral characteristic measuring system includes, a data processing apparatus, and a program, which correct an illumination light variation caused by a temperature rise in a semiconductor light-emitting element due to light emission or in a scanning type color measurement system, which sequentially measures color samples 1n and in which a semiconductor light-emitting element is used as a light source. Spectral distributions of illumination lights which are measured before and after the color sample is measured are interpolated, to estimate a spectral distribution of an illumination light at the time when a spectral distribution of the color sample is obtained. Spectral characteristics of the color sample are identified based on the spectral distribution of the reflected light or the transmitted light reflected by or transmitted through the color sample and the estimated spectral distribution.

Abstract: An illumination apparatus to illuminate a sample surface with excellent illumination efficiency and a reflective characteristics measuring apparatus using the illumination apparatus. The illumination apparatus includes a plane light source positioned on a normal at a center of the sample surface and a mirror having an internal reflective surface positioned between the plane light source and the sample surface. The internal reflective surface has a circular or polygonal shape in a section perpendicular to the normal and the circular or polygonal shape substantially corresponds to an imaginary circle centered on the normal and having a radius equal to half a distance between the plane light source and the sample surface. In place of the mirror, a plurality of reflective faces may be positioned.

Abstract: An optical property measuring method and an optical property measuring apparatus according to an aspect of the invention are operable to select bi-spectral characteristics relatively close to bi-spectral characteristics of a fluorescent sample, out of multiple bi-spectral characteristics stored in advance, based on a relative ratio between excitation efficiencies of the fluorescent sample illuminated by excitation illuminations whose spectral distributions are different from each other, in calculating an optical property of the fluorescent sample. The inventive optical property measuring method and optical property measuring apparatus are advantageous in calculating an optical property of a fluorescent sample easily and with high precision.

Abstract: An optical property measurement apparatus includes: a main body which includes a plane-shape surface that is so disposed as to face the display portion; an optical sensor which receives light directed from an opening that is formed through the plane-shape surface; and a support portion which is disposed on a side of the plane-shape surface and keeps a constant distance between the display portion and the plane-shape surface; wherein a light shield portion that is so disposed as to enclose a circumferential area of the opening of the plane-shape surface and shields entrance of light from a region other than a measurement target region of the display portion when the optical property is measured.

Abstract: A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.

Abstract: An optical characteristic measuring apparatus of the invention includes a sequentially-readable charge storage sensor array having a plurality of light receiving elements. Irradiation of first illumination light and second illumination light is controlled in such a manner that a period for irradiating the second illumination light onto a sample containing a fluorescent material is included in an integration period of each of the light receiving elements for receiving a wavelength component of fluoresced light from the sample in measuring an optical characteristic of the sample. The optical characteristic measuring apparatus having the above arrangement enables to accurately measure the optical characteristics of samples containing a fluorescent material in a short time by scanning the samples.

Abstract: A light receiving optical system includes: a relay optical system for converging light to be measured which has been converged on an image plane of an objective optical system. The light receiving optical system has a relay optical system with a relay lens operable to be selectively switched between first and a second conjugate positions, and a first and a second light flux limiting aperture members selectively switched between the first and the second conjugate positions. The relay optical system selectively forms, on the image plane of the objective optical system, an enlarged image and a reduced image of a view angle defining aperture in the case where the relay lens is selectively switched between the first and the second conjugate positions to define an incident light flux through the view angle defining aperture by a first and a second light flux limiting apertures, respectively.

Abstract: A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.

Abstract: A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.

Abstract: A concave diffraction grating device, a reflective dispersion device, and a spectral device of the invention include a diffraction grating plane having an aspherical configuration, wherein the diffraction grating plane is symmetrical in a predetermined direction, and asymmetrical in a direction orthogonal to the predetermined direction in such a manner that the curvature of one end portion of the diffraction grating plane in the direction orthogonal to the predetermined direction is gradually decreased, and the curvature of the other end portion thereof is gradually increased. The concave diffraction grating device, the reflective dispersion device, and the spectral device with the above arrangement have desirable slit image forming performance with respect to all the wavelengths in a visible region, and are suitable for mass-production.

Abstract: An object of the present invention is to provide a spectral characteristic measuring system, a spectral characteristic measuring instrument, a data processing apparatus, and a program, which make it possible to appropriately correct an influence of an illumination light variation caused by a temperature rise in a semiconductor light-emitting element due to light emission, in a scanning type color measurement system or the like which sequentially measures many color samples 1n and in which a semiconductor light-emitting element such as an LED is used as a light source and a reference system is not provided. Spectral distributions of illumination lights which are measured before and after the color sample is measured are interpolated, to thereby estimate a spectral distribution of an illumination light at the time when a spectral distribution of the color sample is obtained.

Abstract: In a polychrometer and a method for correcting stray light of the polychrometer, relative spectral (inter-pixel) distribution of stray light independent of a spectral distribution of an incident light is obtained, intensity coefficient of the stray light is calculated according to spectral (inter-pixel) distribution of the incident light, spectral (inter-pixel) distribution of the stray light included in a spectral (inter-pixel) distribution of an incident light is estimated and corrected. Thus, the stray light can be more accurately corrected as compared with a conventional case where stray light distribution is directly estimated from an incident light.

Abstract: An optical property measuring apparatus and an optical property measuring method of the invention determine a specified optical property of a sample by using a distribution function indicating a distribution of the amounts of reflected light incident on an optical sensor along a coordinate axis defined on a light-sensing surface of the optical sensor. Therefore, even when the optical sensor is a light-sensing device provided with a relatively small number of photosensitive elements, it is possible to measure the specified optical property regardless of a position error of the sample, if any, and reduce errors in measurement values caused by such a sample position error.

Abstract: An illumination apparatus to illuminate a sample surface with excellent illumination efficiency and a reflective characteristics measuring apparatus using the illumination apparatus. The illumination apparatus includes a plane light source positioned on a normal at a center of the sample surface and a mirror having an internal reflective surface positioned between the plane light source and the sample surface. The internal reflective surface has a circular or polygonal shape in a section perpendicular to the normal and the circular or polygonal shape substantially corresponds to an imaginary circle centered on the normal and having a radius equal to half a distance between the plane light source and the sample surface. In place of the mirror, a plurality of reflective faces may be positioned.

Abstract: A reflection characteristic measuring apparatus for measuring a characteristic, such as a gloss, of a sample surface. The apparatus includes at least one illuminator for illuminating a sample surface to be measured with light and a plurality of light receiving sections which are arranged axially symmetrically to each other with respect to a normal to an intended object surface and which output two-dimensional light receiving data. A deriving section derives a characteristic of the sample surface such as gloss based on a weighted average obtained by applying a weighting factor to each of the light receiving data outputted from the light receiving sections.

Abstract: In a calibration reference light source and a sensitivity calibration system using the same, a plurality of single-wavelength light sources for emitting reference lights having mutually different single-wavelengths are used instead of a black body radiation source for radiating a white light, and not only the intensities of the single-wavelength reference lights, but also the wavelengths thereof are measured to obtain sensitivity correction coefficients of intensity-to-radiance conversion data. Thus, obtained reference radiance are highly reliable and sensitivity correction of spectrophotometers and spectral illuminometers can be performed with high accuracy and reliability at a user side, whereby the calibration reference light source and the calibration system using the same can be obtained at low cost.