Patents by Inventor Kenji Kudou

Kenji Kudou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for localizing sound image for vehicle's driver
    Patent number: 9451380
    Abstract: An acoustic apparatus mounted on a vehicle driven by a driver includes: acquiring unit for acquiring a gaze point at which the driver gazes while driving the vehicle, reflecting parameters including a location of the vehicle, a running state of the vehicle and a running environment of the vehicle; generation unit for generating a sound image in the vehicle; and localization unit for localizing the sound image to be at the gaze point.
    Type: Grant
    Filed: July 18, 2013
    Date of Patent: September 20, 2016
    Assignee: DENSO CORPORATION
    Inventors: Hiroshi Inou, Seiji Totsuka, Kenji Kudou
  • APPARATUS AND METHOD FOR LOCALIZING SOUND IMAGE FOR VEHICLE'S DRIVER
    Publication number: 20140023211
    Abstract: An acoustic apparatus mounted on a vehicle driven by a driver includes: acquiring unit for acquiring a gaze point at which the driver gazes while driving the vehicle, reflecting parameters including a location of the vehicle, a running state of the vehicle and a running environment of the vehicle; generation unit for generating a sound image in the vehicle; and localization unit for localizing the sound image to be at the gaze point.
    Type: Application
    Filed: July 18, 2013
    Publication date: January 23, 2014
    Applicant: DENSO CORPORATION
    Inventors: Hiroshi INOU, Seiji TOTSUKA, Kenji KUDOU
  • Method for inspecting pattern defect occured on patterns formed on a substrate
    Patent number: 7953269
    Abstract: In a pattern-defect inspection method for inspecting a defect in an inspection pattern by comparing an image of the inspection pattern with an image of a reference pattern, inspection sensitivity is adjusted in accordance with the number of corner portion and so on of the reference pattern.
    Type: Grant
    Filed: July 13, 2007
    Date of Patent: May 31, 2011
    Assignee: Fujitsu Semiconductor Limited
    Inventor: Kenji Kudou
  • METHOD FOR INSPECTING PATTERN DEFECT OCCURED ON PATTERNS FORMED ON A SUBSTRATE
    Publication number: 20070258636
    Abstract: In a pattern-defect inspection method for inspecting a defect in an inspection pattern by comparing an image of the inspection pattern with an image of a reference pattern, inspection sensitivity is adjusted in accordance with the number of corner portion and so on of the reference pattern.
    Type: Application
    Filed: July 13, 2007
    Publication date: November 8, 2007
    Applicant: FUJITSU LIMITED
    Inventor: Kenji KUDOU