Patents by Inventor Kenji Sugishima

Kenji Sugishima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9424528
    Abstract: Performance of a manufacturing tool is optimized. Optimization relies on recipe drifting and generation of knowledge that capture relationships among product output metrics and input material measurement(s) and recipe parameters. Optimized recipe parameters are extracted from a basis of learned functions that predict output metrics for a current state of the manufacturing tool and measurements of input material(s). Drifting and learning are related and lead to dynamic optimization of tool performance, which enables optimized output from the manufacturing tool as the operation conditions of the tool changes. Features of recipe drifting and associated learning can be autonomously or externally configured through suitable user interfaces, which also can be drifted to optimize end-user interaction.
    Type: Grant
    Filed: April 23, 2014
    Date of Patent: August 23, 2016
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Patent number: 9275335
    Abstract: An autonomous biologically based learning tool system and a method that the tool system employs for learning and analysis are provided. The autonomous biologically based learning tool system includes (a) one or more tool systems that perform a set of specific tasks or processes and generate assets and data related to the assets that characterize the various processes and associated tool performance; (b) an interaction manager that receives and formats the data, and (c) an autonomous learning system based on biological principles of learning. The autonomous learning system comprises a memory platform and a processing platform that communicate through a network. Both the memory platform and the processing platform include functional components and memories that can be defined recursively. Knowledge generated and accumulated in the autonomous learning system(s) can be cast into semantic networks that can be employed for learning and driving tool goals based on context.
    Type: Grant
    Filed: April 27, 2012
    Date of Patent: March 1, 2016
    Assignee: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Patent number: 8954184
    Abstract: System(s) and method(s) are provided for adjustment and analysis of performance of a tool through integration of tool operational data and spectroscopic data related to the tool. Such integration results in consolidated data that enable, in part, learning at least one relationship amongst selected portions of the consolidated data. Learning is performed autonomously without human intervention. Adjustment of performance of the tool relies at least in part on a learned relationship and includes generation of process recipe parameter(s) that can adjust a manufacturing process in order to produce a satisfactory tool performance in response to implementation of the manufacturing process. A process recipe parameter can be generated by solving an inverse problem based on the learned relationship.
    Type: Grant
    Filed: January 19, 2011
    Date of Patent: February 10, 2015
    Assignee: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Publication number: 20140304196
    Abstract: The subject disclosure relates to automatically learning relationships among a plurality of manufacturing tool parameters as applied to arbitrary semiconductor manufacturing tools and a graphical user interface that is supported, at least in part, by an autonomous learning system. The graphical user interface can create one or more matrixes based on received data and can further generate additional matrices by transforming the one or more matrixes. A series of windows can be output, wherein the series of windows, provide performance analysis that comprises a matching between a focus chamber and a reference chamber. In an aspect, the focus chamber and the reference chamber can be different chambers. In another aspect, the focus chamber and the reference chamber can be the same chamber, which provides analysis of the deterioration in performance of the same chamber over time.
    Type: Application
    Filed: April 7, 2014
    Publication date: October 9, 2014
    Inventors: Sanjeev Kaushal, Kenji Sugishima, Sukesh Janubhai Patel, Robert Filman, Wolfgang Polak, Orion Wolfe, Jessie Burger
  • Publication number: 20140229409
    Abstract: Performance of a manufacturing tool is optimized. Optimization relies on recipe drifting and generation of knowledge that capture relationships among product output metrics and input material measurement(s) and recipe parameters. Optimized recipe parameters are extracted from a basis of learned functions that predict output metrics for a current state of the manufacturing tool and measurements of input material(s). Drifting and learning are related and lead to dynamic optimization of tool performance, which enables optimized output from the manufacturing tool as the operation conditions of the tool changes. Features of recipe drifting and associated learning can be autonomously or externally configured through suitable user interfaces, which also can be drifted to optimize end-user interaction.
    Type: Application
    Filed: April 23, 2014
    Publication date: August 14, 2014
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Patent number: 8744607
    Abstract: Performance of a manufacturing tool is optimized. Optimization relies on recipe drifting and generation of knowledge that capture relationships among product output metrics and input material measurement(s) and recipe parameters. Optimized recipe parameters are extracted from a basis of learned functions that predict output metrics for a current state of the manufacturing tool and measurements of input material(s). Drifting and learning are related and lead to dynamic optimization of tool performance, which enables optimized output from the manufacturing tool as the operation conditions of the tool changes. Features of recipe drifting and associated learning can be autonomously or externally configured through suitable user interfaces, which also can be drifted to optimize end-user interaction.
    Type: Grant
    Filed: February 11, 2013
    Date of Patent: June 3, 2014
    Assignee: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Patent number: 8723869
    Abstract: The subject disclosure relates to automatically learning relationships among a plurality of manufacturing tool parameters as applied to arbitrary semiconductor manufacturing tools and a graphical user interface that is supported, at least in part, by an autonomous learning system. The graphical user interface can create one or more matrixes based on received data and can further generate additional matrices by transforming the one or more matrixes. A series of windows can be output, wherein the series of windows, provide performance analysis that comprises a matching between a focus chamber and a reference chamber. In an aspect, the focus chamber and the reference chamber can be different chambers. In another aspect, the focus chamber and the reference chamber can be the same chamber, which provides analysis of the deterioration in performance of the same chamber over time.
    Type: Grant
    Filed: March 21, 2011
    Date of Patent: May 13, 2014
    Assignee: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Kenji Sugishima, Sukesh Janubhai Patel, Robert Filman, Wolfgang Polak, Orion Wolfe, Jessie Burger
  • Patent number: 8725667
    Abstract: Autonomous biologically based learning tool system(s) and method(s) that the tool system(s) employs for learning and analysis of performance degradation and mismatch are provided. The autonomous biologically based learning tool system includes (a) one or more tool systems that perform a set of specific tasks or processes and generate assets and data related to the assets that characterize the various processes and associated tool performance; (b) an interaction manager that receives and formats the data, and (c) an autonomous learning system based on biological principles of learning. Objectively generated knowledge gleaned from synthetic or production data can be utilized to determine a mathematical relationship among a specific output variable and a set of associated influencing variables. The generated relationship facilitates assessment of performance degradation of a set of tools, and performance mismatch among tools therein.
    Type: Grant
    Filed: March 31, 2009
    Date of Patent: May 13, 2014
    Assignee: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Patent number: 8396582
    Abstract: System(s) and method(s) for optimizing performance of a manufacturing tool are provided. Optimization relies on recipe drifting and generation of knowledge that capture relationships among product output metrics and input material measurement(s) and recipe parameters. Optimized recipe parameters are extracted from a basis of learned functions that predict output metrics for a current state of the manufacturing tool and measurements of input material(s). Drifting and learning are related and lead to dynamic optimization of tool performance, which enables optimized output from the manufacturing tool as the operation conditions of the tool changes. Features of recipe drifting and associated learning can be autonomously or externally configured through suitable user interfaces, which also can be drifted to optimize end-user interaction.
    Type: Grant
    Filed: January 29, 2010
    Date of Patent: March 12, 2013
    Assignee: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Publication number: 20120242667
    Abstract: The subject disclosure relates to automatically learning relationships among a plurality of manufacturing tool parameters as applied to arbitrary semiconductor manufacturing tools and a graphical user interface that is supported, at least in part, by an autonomous learning system. The graphical user interface can create one or more matrixes based on received data and can further generate additional matrices by transforming the one or more matrixes. A series of windows can be output, wherein the series of windows, provide performance analysis that comprises a matching between a focus chamber and a reference chamber. In an aspect, the focus chamber and the reference chamber can be different chambers. In another aspect, the focus chamber and the reference chamber can be the same chamber, which provides analysis of the deterioration in performance of the same chamber over time.
    Type: Application
    Filed: March 21, 2011
    Publication date: September 27, 2012
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Sanjeev Kaushal, Kenji Sugishima, Sukesh Janubhai Patel, Robert Filman, Wolfgang Polak, Orion Wolfe, Jessie Burger
  • Publication number: 20120209798
    Abstract: An autonomous biologically based learning tool system and a method that the tool system employs for learning and analysis are provided. The autonomous biologically based learning tool system includes (a) one or more tool systems that perform a set of specific tasks or processes and generate assets and data related to the assets that characterize the various processes and associated tool performance; (b) an interaction manager that receives and formats the data, and (c) an autonomous learning system based on biological principles of learning. The autonomous learning system comprises a memory platform and a processing platform that communicate through a network. Both the memory platform and the processing platform include functional components and memories that can be defined recursively. Knowledge generated and accumulated in the autonomous learning system(s) can be cast into semantic networks that can be employed for learning and driving tool goals based on context.
    Type: Application
    Filed: April 27, 2012
    Publication date: August 16, 2012
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Publication number: 20120185813
    Abstract: System(s) and method(s) are provided for adjustment and analysis of performance of a tool through integration of tool operational data and spectroscopic data related to the tool. Such integration results in consolidated data that enable, in part, learning at least one relationship amongst selected portions of the consolidated data. Learning is performed autonomously without human intervention. Adjustment of performance of the tool relies at least in part on a learned relationship and includes generation of process recipe parameter(s) that can adjust a manufacturing process in order to produce a satisfactory tool performance in response to implementation of the manufacturing process. A process recipe parameter can be generated by solving an inverse problem based on the learned relationship.
    Type: Application
    Filed: January 19, 2011
    Publication date: July 19, 2012
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Patent number: 8190543
    Abstract: An autonomous biologically based learning tool system and a method that the tool system employs for learning and analysis are provided. The autonomous biologically based learning tool system includes (a) one or more tool systems that perform a set of specific tasks or processes and generate assets and data related to the assets that characterize the various processes and associated tool performance; (b) an interaction manager that receives and formats the data, and (c) an autonomous learning system based on biological principles of learning. The autonomous learning system comprises a memory platform and a processing platform that communicate through a network. Both the memory platform and the processing platform include functional components and memories that can be defined recursively. Knowledge generated and accumulated in the autonomous learning system(s) can be cast into semantic networks that can be employed for learning and driving tool goals based on context.
    Type: Grant
    Filed: March 8, 2008
    Date of Patent: May 29, 2012
    Assignee: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Patent number: 8078552
    Abstract: An autonomous biologically based learning tool system and a method that the tool system employs for learning and analysis are provided. The autonomous biologically based learning tool system includes (a) one or more tool systems that perform a set of specific tasks or processes and generate assets and data related to the assets that characterize the various processes and associated tool performance; (b) an interaction manager that receives and formats the data, and (c) an autonomous learning system based on biological principles of learning. The autonomous learning system comprises a memory platform and a processing platform that communicate through a network. The network receives data from the tool system and from an external actor through the interaction manager. Both the memory platform and the processing platform include functional components and memories that can be defined recursively.
    Type: Grant
    Filed: March 8, 2008
    Date of Patent: December 13, 2011
    Assignee: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Patent number: 8026113
    Abstract: A method and system for non-invasive sensing and monitoring of a processing system employed in semiconductor manufacturing. The method allows for detecting and diagnosing drift and failures in the processing system and taking the appropriate correcting measures. The method includes positioning at least one non-invasive sensor on an outer surface of a system component of the processing system, where the at least one invasive sensor forms a wireless sensor network, acquiring a sensor signal from the at least one non-invasive sensor, where the sensor signal tracks a gradual or abrupt change in a processing state of the system component during flow of a process gas in contact with the system component, and extracting the sensor signal from the wireless sensor network to store and process the sensor signal. In one embodiment, the non-invasive sensor can be an accelerometer sensor and the wireless sensor network can be motes-based.
    Type: Grant
    Filed: March 24, 2006
    Date of Patent: September 27, 2011
    Assignee: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Kenji Sugishima, Donthineni Ramesh Kumar Rao
  • Publication number: 20110131162
    Abstract: An autonomous biologically based learning tool system and a method that the tool system employs for learning and analysis are provided. The autonomous biologically based learning tool system includes (a) one or more tool systems that perform a set of specific tasks or processes and generate assets and data related to the assets that characterize the various processes and associated tool performance; (b) an interaction manager that receives and formats the data, and (c) an autonomous learning system based on biological principles of learning. The autonomous learning system comprises a memory platform and a processing platform that communicate through a network. The network receives data from the tool system and from an external actor through the interaction manager. Both the memory platform and the processing platform include functional components and memories that can be defined recursively.
    Type: Application
    Filed: March 8, 2008
    Publication date: June 2, 2011
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Patent number: 7838072
    Abstract: An adaptive real time thermal processing system is presented that includes a multivariable controller. The method includes creating a dynamic model of the MLD processing system and incorporating virtual sensors in the dynamic model. The method includes using process recipes comprising intelligent set points, dynamic models, and/or virtual sensors.
    Type: Grant
    Filed: January 26, 2005
    Date of Patent: November 23, 2010
    Assignee: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Pradeep Pandey, Kenji Sugishima
  • Publication number: 20100138026
    Abstract: System(s) and method(s) for optimizing performance of a manufacturing tool are provided. Optimization relies on recipe drifting and generation of knowledge that capture relationships among product output metrics and input material measurement(s) and recipe parameters. Optimized recipe parameters are extracted from a basis of learned functions that predict output metrics for a current state of the manufacturing tool and measurements of input material(s). Drifting and learning are related and lead to dynamic optimization of tool performance, which enables optimized output from the manufacturing tool as the operation conditions of the tool changes. Features of recipe drifting and associated learning can be autonomously or externally configured through suitable user interfaces, which also can be drifted to optimize end-user interaction.
    Type: Application
    Filed: January 29, 2010
    Publication date: June 3, 2010
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima
  • Patent number: 7710565
    Abstract: A method for correcting systematic errors in an optical measurement tool in which a first diffraction spectrum is measured from a standard substrate including a layer having a known refractive index and a known extinction coefficient by exposing the standard substrate to a spectrum of electromagnetic energy. A tool-perfect diffraction spectrum is calculated for the standard substrate. A hardware systematic error is calculated by comparing the measured diffraction spectrum to the calculated tool-perfect diffraction spectrum. A second diffraction spectrum from a workpiece is measured by exposing the workpiece to the spectrum of electromagnetic energy, and the measured second diffraction spectrum is corrected based on the calculated hardware systematic error to obtain a corrected diffraction spectrum.
    Type: Grant
    Filed: December 14, 2007
    Date of Patent: May 4, 2010
    Assignee: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Sairam Sankaranarayanan, Kenji Sugishima
  • Publication number: 20090240366
    Abstract: Autonomous biologically based learning tool system(s) and method(s) that the tool system(s) employs for learning and analysis of performance degradation and mismatch are provided. The autonomous biologically based learning tool system includes (a) one or more tool systems that perform a set of specific tasks or processes and generate assets and data related to the assets that characterize the various processes and associated tool performance; (b) an interaction manager that receives and formats the data, and (c) an autonomous learning system based on biological principles of learning. Objectively generated knowledge gleaned from synthetic or production data can be utilized to determine a mathematical relationship among a specific output variable and a set of associated influencing variables. The generated relationship facilitates assessment of performance degradation of a set of tools, and performance mismatch among tools therein.
    Type: Application
    Filed: March 31, 2009
    Publication date: September 24, 2009
    Applicant: Tokyo Electron Limited
    Inventors: Sanjeev Kaushal, Sukesh Janubhai Patel, Kenji Sugishima