Patents by Inventor Kenji Udagawa

Kenji Udagawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7416574
    Abstract: A filter apparatus for improving gas temperature stability while maintaining a high impurity removal capacity. The filter apparatus includes a filter for removing impurities from a gas and a temperature adjuster for adjusting the temperature of the gas to a predetermined temperature. The filter apparatus further includes a humidity detector, arranged at the upstream side of the filter, for adjusting the humidity of the gas before the gas passes through the filter.
    Type: Grant
    Filed: December 2, 2005
    Date of Patent: August 26, 2008
    Assignee: Nikon Corporation
    Inventors: Kenji Udagawa, Yoshitomo Nagahashi
  • Publication number: 20060156927
    Abstract: A filter apparatus for improving gas temperature stability while maintaining a high impurity removal capacity. The filter apparatus includes a filter for removing impurities from a gas and a temperature adjuster for adjusting the temperature of the gas to a predetermined temperature. The filter apparatus further includes a humidity detector, arranged at the upstream side of the filter, for adjusting the humidity of the gas before the gas passes through the filter.
    Type: Application
    Filed: December 2, 2005
    Publication date: July 20, 2006
    Applicant: Nikon Corporation
    Inventors: Kenji Udagawa, Yoshitomo Nagahashi
  • Patent number: 6762820
    Abstract: A chemical filter, which removes chemical pollutants from gas and controls temperature fluctuation of the gas before and after passing through the filter to within a predetermined range, is arranged in a portion of a ventilation path extending from a machine chamber housing at least a portion of an air conditioning unit to a main body chamber housing an exposure apparatus main body. Accordingly, the atmosphere around the exposure apparatus main body arranged downstream of the chemical filter is kept chemically clean, and the temperature fluctuation of the gas, of which the temperature is set to a target temperature by the air conditioner, after passing through the chemical filter is limited. That is, occurrence of a problem such as an illumination reduction caused by tarnish of optical members and an increase of the temperature fluctuation amount of the gas supplied into the main body chamber can be effectively limited.
    Type: Grant
    Filed: September 10, 2001
    Date of Patent: July 13, 2004
    Assignee: Nikon Corporation
    Inventors: Kenji Udagawa, Tomoyuki Yoshida, Michinori Hashimoto, Fumio Karibe
  • Publication number: 20020036760
    Abstract: A chemical filter, which removes chemical pollutants from gas and controls temperature fluctuation of the gas before and after passing through the filter to within a predetermined range, is arranged in a portion of a ventilation path extending from a machine chamber housing at least a portion of an air conditioning unit to a main body chamber housing an exposure apparatus main body. Accordingly, the atmosphere around the exposure apparatus main body arranged downstream of the chemical filter is kept chemically clean, and the temperature fluctuation of the gas, of which the temperature is set to a target temperature by the air conditioner, after passing through the chemical filter is limited. That is, occurrence of a problem such as an illumination reduction caused by tarnish of optical members and an increase of the temperature fluctuation amount of the gas supplied into the main body chamber can be effectively limited.
    Type: Application
    Filed: September 10, 2001
    Publication date: March 28, 2002
    Applicant: Nikon Corporation
    Inventors: Kenji Udagawa, Tomoyuki Yoshida, Michinori Hashimoto, Fumio Karibe
  • Patent number: 6034374
    Abstract: Thermal infrared sensors are disclosed for the detection of an incident infrared flux. The sensors include an absorber each including an absorption layer and a thermal sensing element. The incident infrared flux is absorbed by the absorption layer. Heat generated by the absorption is detected by the thermal sensing element such as a thermistor. The absorber is supported above a substrate by supports and bridges, reducing heat transfer from the absorber to the substrate. The supports and bridges include electrical connections to the absorber and the substrate. The supports and bridges are located beneath the absorber so that a large proportion of the area of the absorber is available to absorb the incident flux. Imaging devices including arrays of such sensors and fabrication methods for the sensors and imaging devices are also disclosed.
    Type: Grant
    Filed: November 10, 1997
    Date of Patent: March 7, 2000
    Assignee: Nikon Corporation
    Inventors: Mitsuteru Kimura, Kenji Udagawa