Abstract: A technique capable of improving the ability to observe a specimen using an electron beam in an energy region which has not been conventionally given attention is provided. This specimen observation method comprises: irradiating the specimen with an electron beam; detecting electrons to be observed which have been generated and have obtained information on the specimen by the electron beam irradiation; and generating an image of the specimen from the detected electrons to be observed. The electron beam irradiation comprises irradiating the specimen with the electron beam with a landing energy set in a transition region between a secondary emission electron region in which secondary emission electrons are detected and a mirror electron region in which mirror electrons are detected, thereby causing the secondary emission electrons and the mirror electrons to be mixed as the electrons to be observed.

Abstract: A reagent including a combination of a polyanionic compound and a bivalent cationic compound contains one substance selected from the group consisting of succinic acid, gluconic acid, alanine, glycine, valine, histidine, maltitol, and mannitol or at least one compound of the substance. A dry state of the reagent and deliquescence can be improved.

Abstract: There is provided a substrate inspection method. The method includes: maintaining a vacuum in said inspection chamber; isolating said inspection chamber from a vibration; positioning the substrate on a stage in the inspection chamber; selecting an evaluation parameter according to a kind of said processing apparatus; and determining inspection regions of the substrate so that an inspection time required per a lot of the substrate is equal to a processing time spent for said processing step required per a lot of the substrate. The method also includes radiating a primary electron beam from an electron gun; deflecting the primary electron beam with an E*B unit; irradiating said inspection regions of the substrate with the deflected primary electron beam; and projecting secondary electrons emitted from said substrate through the E*B unit onto a detector with a secondary optical system.

Abstract: The image forming apparatus includes process units that are closely arranged around respective photosensitive members and act on the photosensitive members, a light emission section that forms an electrostatic latent image for detection on the photosensitive member and a detection section that detects that the electrostatic latent image passes through a position facing the process unit, and a control section that performs misregistration correction control based on the detection result.

Abstract: An inspection apparatus by an electron beam comprises: an electron-optical device 70 having an electron-optical system for irradiating the object with a primary electron beam from an electron beam source, and a detector for detecting the secondary electron image projected by the electron-optical systems; a stage system 50 for holding and moving the object relative to the electron-optical system; a mini-environment chamber 20 for supplying a clean gas to the object to prevent dust from contacting the object; a working chamber 31 for accommodating the stage device, the working chamber being controllable so as to have a vacuum atmosphere; at least two loading chambers 41, 42 disposed between the mini-environment chamber and the working chamber, adapted to be independently controllable so as to have a vacuum atmosphere; and a loader 60 for transferring the object to the stage system through the loading chambers.

Abstract: An image forming apparatus includes: a photosensitive member configured to be rotated; scanning means for scanning, by light corresponding to image data, the photosensitive member that is charged, thereby forming an electrostatic latent image on the photosensitive member; and a contacting member in contact with the photosensitive member to form a nip portion. In a correction mode in which a shift of an image is corrected based on a detection result obtained by detecting, at the nip portion, an electrostatic latent image for correction formed on the photosensitive member by the scanning means, a width of the electrostatic latent image for correction is equal to or more than a width of the nip portion in a rotation direction of the photosensitive member.

Abstract: An analyzing device mixes a sample liquid with a reagent by rotation of the analyzing device about a rotation center to generate a centrifugal force. A measurement cell is formed so as to extend in a direction along which the centrifugal force is applied, and a capillary area to which the sample liquid is sucked by a capillary force is formed on one of the side walls of the measurement cell, the side walls being arranged in a rotational direction. The capillary area extends from the outer periphery position to the inner periphery of the measurement cell, thereby reducing the size of the analyzing device. Further, the sample liquid in the measurement cell is sucked to the capillary area by slowing or stopping a rotation, and then the rotation is accelerated to return the sample liquid in the capillary area to the measurement cell.

Abstract: A sliding bearing includes a center portion and end portions on a bearing surface 1. Convexo-concave portions are respectively formed in the center portion and the end portions. The average height of the vertexes of convex portions 1A in the center portion is set smaller than the average height of the vertexes of convex portions 1B in the end portions. Average height Lh of the convexo-concave portion 1A in the center portion and average height LH of the convexo-concave portions 1B in the end portions are set to the same height. The center portion may be formed flat.

Abstract: A rotating electric machine includes a stator and a rotor. The rotor includes an iron core and permanent magnets. The iron core includes a cylindrical connection portion and ten magnetic pole portions. The cylindrical connection portion surrounds a rotation shaft. The ten magnetic pole portions, the number of which corresponding to the number of poles, are disposed radially outside the connection portion. The connection portion and the magnetic pole portions are integrated with each other. The permanent magnets are disposed between the magnetic pole portions. The magnetic pole portions include flange portions that cover parts of radially outer surfaces of the permanent magnets while allowing at least parts of the radially outer surfaces to be exposed. Each of the permanent magnets includes a tapered portion in at least a part thereof, and the tapered portion has a length in a direction perpendicular to the radial direction that decreases radially inward.

Abstract: The disclosure discloses a motor including a stator and a mover. The stator and the mover are arranged facing each other so as to be relatively movable via a magnetic air gap. Any one of the stator and the mover includes a yoke, a plurality of teeth, and a plurality of coils. The plurality of teeth are disposed protruding from the yoke to the magnetic air gap side. The plurality of coils are wound around the plurality of teeth. The plurality of coils include, for each phase, coil groups. Each of the coil groups includes a plurality of the coils. The coils are continuously arranged along the relative movement direction and are in-phase with each other and have the same wire diameter with each other. The coil group includes at least one the coil in which a coil width is larger than a teeth pitch.

Abstract: A sheet detecting apparatus including: a sheet detecting member having a plurality of abutment surfaces in a peripheral direction thereof, the sheet detecting member being rotated by a conveyed sheet abutting against one of the plurality of abutment surfaces; a detection portion which operates in association with the sheet detecting member; a sensor which generates a signal based on a position of the detection portion; and an urging portion which generates an urging force for positioning the one of the plurality of abutment surfaces of the sheet detecting member in a waiting position in which the leading edge of a sheet conveyed by a conveying portion abuts against the one of the plurality of abutment surfaces, and thereafter the urging portion switching the urging force to an urging force for positioning, in the waiting position, another one of the plurality of abutment surfaces against which a succeeding sheet abuts.

Abstract: A substrate inspection apparatus 1-1 (FIG.

Abstract: A sheet conveying apparatus including: a conveying roller pair conveying a sheet by a nip portion; a shutter portion which is rotatably supported on a rotary shaft of the first conveying roller; a same radius portion, provided in the shutter portion, which is formed to have substantially the same radius as a radius of the first conveying roller; an abutment portion, provided in the shutter portion, and against which the leading edge of the sheet is abutted; and a boundary portion, provided in a boundary of the abutment portion and the same radius portion, which guides the leading edge of the sheet to the nip portion when the shutter portion is rotated by abutting the leading edge of the sheet against the boundary portion.

Abstract: An inspection apparatus by an electron beam comprises: an electron-optical device 70 having an electron-optical system for irradiating the object with a primary electron beam from an electron beam source, and a detector for detecting the secondary electron image projected by the electron-optical system; a stage system 50 for holding and moving the object relative to the electron-optical system; a mini-environment chamber 20 for supplying a clean gas to the object to prevent dust from contacting to the object; a working chamber 31 for accommodating the stage device, the working chamber being controllable so as to have a vacuum atmosphere; at least two loading chambers 41, 42 disposed between the mini-environment chamber and the working chamber, adapted to be independently controllable so as to have a vacuum atmosphere; and a loader 60 for transferring the object to the stage system through the loading chambers.

Abstract: A defect inspection apparatus including: a first illumination optical system which is configured to illuminate the inspection area on a sample surface from a normal line direction or a direction near thereof with respect to said sample surface; a second illumination optical system which is configured to illuminate said inspection area from a slant direction with respect to said sample surface; a detection optical system having a plurality of first detectors which are located, in front of, on the sides of, and behind said inspection area, respectively, with respect to the illumination direction of said second illumination optical system, and where the regular reflected light component, from said sample surface, by illumination light of said second illumination optical system, is not converged; and a signal processing system which is configured to inspect a defect, upon basis of signals obtained from said plurality of first detectors.

Abstract: A display unit includes a pixel group having pixels. Each of the pixels includes a light emitting section and a drive circuit. The pixel group is divided into P pieces of pixel blocks. The display unit is configured to allow the light emitting sections from the light emitting sections configuring the respective pixels in a first pixel block of the P pieces of pixel blocks to the light emitting sections configuring the respective pixels in a P-th pixel block of the P pieces of pixel blocks to sequentially emit light together on a pixel block basis, and when the light emitting sections configuring the respective pixels in pixel blocks of the P pieces of pixel blocks emit light, configured to allow the light emitting sections configuring the respective pixels in remaining pixel blocks of the P pieces of pixel blocks not to emit light.

Abstract: An induction heat cooking device is provided that finishes preheating in a short time and maintains the temperature obtained at the finish of the preheating. When a preheating heating mode is selected as an operation mode, a control unit (8) arranged in the induction heat cooking device starts operation in a preheating mode in which a cooking container is heated with a first heating output. When an increment of an output value of an infrared sensor exceeds a first predetermined increment since the heating starts with the first heating output, the control unit causes a notification unit to notify a user that the preheating is finished, and the operation mode is changed to a waiting mode for performing heating with a second heating output that is lower than the first heating output. Further, when the user sets a heating power by means of a heating power setting unit in the preheating mode, the control unit prohibits changing to the heating power set by the user.

Abstract: A system for further enhancing speed, i.e. improving throughput in a SEM-type inspection apparatus is provided. An inspection apparatus for inspecting a surface of a substrate produces a crossover from electrons emitted from an electron beam source 25•1, then forms an image under a desired magnification in the direction of a sample W to produce a crossover. When the crossover is passed, electrons as noises are removed from the crossover with an aperture, an adjustment is made so that the crossover becomes a parallel electron beam to irradiate the substrate in a desired sectional form. The electron beam is produced such that the unevenness of illuminance is 10% or less. Electrons emitted from the sample W are detected by a detector 25•11.

Abstract: A sheet conveying apparatus, including: a first conveying portion; a second conveying portion arranged downstream of the first conveying portion; a shutter member rotated by the pressure of the sheet and including a plurality of abutment surfaces against which a leading edge of the sheet conveyed by the first conveying portion abuts to correct a skew feed of the sheet; and an urging portion which provides the shutter member with an urging force for positioning one abutment surface at an abutment position at which the leading edge of the sheet abuts against the one abutment surface, the urging portion providing the shutter member with an urging force for rotating the shutter member to position another abutment surface at the abutment position after the leading edge of the sheet is nipped by the second conveying portion.

Abstract: A system for further enhancing speed, i.e. improving throughput in a SEM-type inspection apparatus is provided. An inspection apparatus for inspecting a surface of a substrate produces a crossover from electrons emitted from an electron beam source 25•1, then forms an image under a desired magnification in the direction of a sample W to produce a crossover. When the crossover is passed, electrons as noises are removed from the crossover with an aperture, an adjustment is made so that the crossover becomes a parallel electron beam to irradiate the substrate in a desired sectional form. The electron beam is produced such that the unevenness of illuminance is 10% or less. Electrons emitted from the sample W are detected by a detector 25•11.