Abstract: An image relay device that projects laser light representing an image emitted from a projection device onto the retina is provided. The image relay device includes a projection device, a first optical member, and a second optical member. The projection device includes a light source configured to emit laser light and a scan unit configured to scan the laser light based on image data. The first optical member receives an image light from the projection device and converts the image light which is a parallel light, to light beams of convergent light. The second optical member converts the light beams output from the first optical member into parallel light.

Abstract: A memory tester of the present embodiment includes a first memory, a second memory, an arithmetic circuit, and a determination circuit. The first memory is configured to store scan input data and expected value data, the scan input data including a don't care bit, the expected value data being obtained by converting the don't care bit into a first predetermined value. The second memory is configured to store scan output data and mask data obtained by converting a value of the scan input data other than the don't care bit into a second predetermined value. The arithmetic circuit is configured to perform an exclusive or operation between the expected value data and the scan output data. The determination circuit is configured to determine whether the don't care bit of an arithmetic result from the arithmetic circuit is passed or failed by using the mask data.

Abstract: A memory tester of the present embodiment includes a first memory, a second memory, an arithmetic circuit, and a determination circuit. The first memory is configured to store scan input data and expected value data, the scan input data including a don't care bit, the expected value data being obtained by converting the don't care bit into a first predetermined value. The second memory is configured to store scan output data and mask data obtained by converting a value of the scan input data other than the don't care bit into a second predetermined value. The arithmetic circuit is configured to perform an exclusive or operation between the expected value data and the scan output data. The determination circuit is configured to determine whether the don't care bit of an arithmetic result from the arithmetic circuit is passed or failed by using the mask data.

Abstract: A visual sense examination device includes: a beam source that emits a visible beam and an invisible beam; a visible beam optical system that includes a first scanner scanning the visible beam; an invisible beam optical system that includes a second scanner scanning the invisible beam; a detector that detects the invisible beam reflected by a retina of a subject; a controller that performs a first control; a synthesizer that synthesizes the visible beam scanned by the first scanner and the invisible beam scanned by the second scanner; and wherein scanning angles of the visible beam by the first scanner and the invisible beam by the second scanner are substantially the same, and projectable ranges of the visible beam scanned by the first scanner and the invisible light scanned by the second scanner are substantially the same on the retina of the subject.

Abstract: The invention provides an observation system capable of observing a formation position of a target shape that cannot be directly irradiated with an electron beam. The observation system includes an electron microscope and a computer. The electron microscope is configured to irradiate, with an electron beam, a first surface position on a specimen, which is different from a formation position of a target shape on the specimen, detect predetermined electrons that are scattered in the specimen from the first surface position and that escape from the formation position of the target shape to an outside of the specimen, and output the predetermined electrons as a detection signal. The computer is configured to output one or more values related to the target shape based on the detection signal.

Abstract: To provide a technique capable of quantitatively grasping a change in three-dimensional shape including a cross-sectional shape of a pattern within a surface of a wafer or between wafers in a non-destructive manner before cross-sectional observation.

Abstract: An image projection device includes: a light source emitting a light beam; an image input unit inputting image data; a control unit generating an image light beam based on the input image data, and controlling emission of the image light beam from the light source; a scan unit scanning the image light beam emitted from the light source; and a projection optical member illuminating a retina of an eyeball of a user with the image light beam scanned by the scan unit, and projecting an image onto the retina, wherein a diameter of the image light beam at a time when the image light beam enters a cornea of the eyeball is not smaller than 310 ?m and not larger than 800 ?m, and a user having an original visual acuity in a range of 0.04 to 1.2 has an acquired visual acuity of 0.4 or higher.

Abstract: An image relay device that projects laser light representing an image emitted from a projection device onto the retina is provided. The image relay device includes a projection device, a first optical member, and a second optical member. The projection device includes a light source configured to emit laser light and a scan unit configured to scan the laser light based on image data. The first optical member receives an image light from the projection device and converts the image light which is a parallel light, to light beams of convergent light. The second optical member converts the light beams output from the first optical member into parallel light.

Abstract: The present disclosure provides a pattern cross-sectional shape estimation system which includes a charged particle ray device which includes a scanning deflector that scans a charged particle beam, a detector that detects charged particles, and an angle discriminator that is disposed in a front stage of the detector and discriminates charged particles to be detected, and an arithmetic device that generates a luminance of an image, and calculates a signal waveform of a designated region on the image using the luminance. The arithmetic device generates angle discrimination images using signal electrons at different detection angles, and estimates a side wall shape of a measurement target pattern.

Abstract: To measure a depth of a three-dimensional structure, for example, a hole or a groove, formed in a sample without preparing information in advance, an electron microscope detects, among emitted electrons generated by irradiating a sample with a primary electron beam, an emission angle in a predetermined range, the emission angle being formed between an axial direction of the primary electron beam and an emission direction of the emitted electrons, and outputs a detection signal corresponding to the number of the emitted electrons detected. An emission angle distribution of a detection signal is obtained based on a plurality of detection signals, and an opening angle is obtained based on a change point of the emission angle distribution, the opening angle being based on an optical axis direction of the primary electron beam with respect to the bottom portion of the three-dimensional structure.

Abstract: A retinal scanning type eye examination device includes a storage unit configured to store test image data; a laser emitting unit including a laser light source configured to generate an imaging laser beam based on the test image data, the laser emitting unit being configured to project a test image onto a retina of an eyeball of a person subjected to an eye examination by using the imaging laser beam; an optical component configured to cause the imaging laser beam to converge at an inside of the eyeball of the person; a parameter acquiring unit configured to acquire parameter information for a retinal scanning type eyewear, the parameter information including angle information indicating a rotation angle of the laser emitting unit when the laser emitting unit is rotated around a converging point of the laser beam; and an output unit configured to output the parameter information to an external device.

Abstract: A heat treatment method is provided in which a first steel component (11) formed with a coating (111) thereon is fitted in first holes (123, 124) of a second steel component (12) subjected to a quenching treatment. The heat treatment method includes a heating step of heating the second steel component to a first temperature (T1) equal to or higher than a tempering temperature (T0) of the second steel component and higher than a temperature of the first steel component by a temperature difference (?T) for achieving shrink fitting and a shrink-fitting step of shrink-fitting the first steel component in the first holes of the second steel component in a state of maintaining the temperature difference for achieving shrink fitting between the first steel component and the second steel component.

Abstract: The present disclosure provides a pattern cross-sectional shape estimation system which includes a charged particle ray device which includes a scanning deflector that scans a charged particle beam, a detector that detects charged particles, and an angle discriminator that is disposed in a front stage of the detector and discriminates charged particles to be detected, and an arithmetic device that generates a luminance of an image, and calculates a signal waveform of a designated region on the image using the luminance. The arithmetic device generates angle discrimination images using signal electrons at different detection angles, and estimates a side wall shape of a measurement target pattern.

Abstract: To measure a depth of a three-dimensional structure, for example, a hole or a groove, formed in a sample without preparing information for each pattern or calibration in advance. The invention provides an electron microscope including a detection unit that detects, among emitted electrons generated from a sample by irradiating the sample with a primary electron beam, emitted electrons of which an emission angle is in a predetermined range, the emission angle being an angle formed between an axial direction of the primary electron beam and an emission direction of the emitted electrons from the sample, and outputs a detection signal corresponding to the number of the emitted electrons which are detected.

Abstract: A visual sense examination device includes: a beam source that emits a visible beam and an invisible beam; a visible beam optical system that includes a first scanner scanning the visible beam; an invisible beam optical system that includes a second scanner scanning the invisible beam; a detector that detects the invisible beam reflected by a retina of a subject; a controller that performs a first control; a synthesizer that synthesizes the visible beam scanned by the first scanner and the invisible beam scanned by the second scanner; and wherein scanning angles of the visible beam by the first scanner and the invisible beam by the second scanner are substantially the same, and projectable ranges of the visible beam scanned by the first scanner and the invisible light scanned by the second scanner are substantially the same on the retina of the subject.

Abstract: A heat treatment method is provided in which a first steel component (11) formed with a coating (111) thereon is fitted in first holes (123, 124) of a second steel component (12) subjected to a quenching treatment. The heat treatment method includes a heating step of heating the second steel component to a first temperature (T1) equal to or higher than a tempering temperature (T0) of the second steel component and higher than a temperature of the first steel component by a temperature difference (?T) for achieving shrink fitting and a shrink-fitting step of shrink-fitting the first steel component in the first holes of the second steel component in a state of maintaining the temperature difference for achieving shrink fitting between the first steel component and the second steel component.

Abstract: A retinal scanning type eye examination device includes a storage unit configured to store test image data; a laser emitting unit including a laser light source configured to generate an imaging laser beam based on the test image data, the laser emitting unit being configured to project a test image onto a retina of an eyeball of a person subjected to an eye examination by using the imaging laser beam; an optical component configured to cause the imaging laser beam to converge at an inside of the eyeball of the person; a parameter acquiring unit configured to acquire parameter information for a retinal scanning type eyewear, the parameter information including angle information indicating a rotation angle of the laser emitting unit when the laser emitting unit is rotated around a converging point of the laser beam; and an output unit configured to output the parameter information to an external device.

Abstract: An image projection device includes: a light source emitting a light beam; an image input unit inputting image data; a control unit generating an image light beam based on the input image data, and controlling emission of the image light beam from the light source; a scan unit scanning the image light beam emitted from the light source; and a projection optical member illuminating a retina of an eyeball of a user with the image light beam scanned by the scan unit, and projecting an image onto the retina, wherein a diameter of the image light beam at a time when the image light beam enters a cornea of the eyeball is not smaller than 310 ?m and not larger than 800 ?m, and a user having an original visual acuity in a range of 0.04 to 1.2 has an acquired visual acuity of 0.4 or higher.

Abstract: A heat treatment method is provided in which a first steel component (11) formed with a coating (111) thereon is fitted in first holes (123, 124) of a second steel component (12) subjected to a quenching treatment. The heat treatment method includes a heating step of heating the second steel component to a first temperature (T1) equal to or higher than a tempering temperature (T0) of the second steel component and higher than a temperature of the first steel component by a temperature difference (?T) for achieving shrink fitting and a shrink-fitting step of shrink-fitting the first steel component in the first holes of the second steel component in a state of maintaining the temperature difference for achieving shrink fitting between the first steel component and the second steel component.

Abstract: A directional coupler according to the invention includes an opening in a wall surface of a waveguide, and a coupling line on an outer side of the waveguide. The opening is configured to not cross a tube axis of the waveguide in plan view, and to emit a circularly polarized wave. The coupling line includes first and second transmission lines and output parts disposed at both ends, the first and second transmission lines extending across the opening to cross the tube axis in plan view and being opposed to each other across the center of the opening. The first and second transmission lines are interconnected at a position displaced from an area vertically above the opening.