Patents by Inventor Kenji Yokose

Kenji Yokose has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20040064381
    Abstract: A method and system for supplying management and maintenance parts which enables earlier reception of orders of parts required for management and maintenance of products. A physical distribution management (logistics) server 3 is provided to connect users 6, a manufacturer 6, and cooperating manufacturers 9. The users 6 are connected to said logistic server 3 through Internet or the like. Said logistic server 3 contains a management and maintenance parts supply system 2 and a parts information (spare parts information) database which stores parts information required for management and maintenance of products. The users select required parts from said database and send information of the selected parts to said manufacturer.
    Type: Application
    Filed: September 30, 2003
    Publication date: April 1, 2004
    Applicant: HITACHI, LTD.
    Inventors: Yuichiro Mizumachi, Kenji Yokose, Tsuyoshi Aihara, Koichi Matsumoto
  • Publication number: 20020055893
    Abstract: A method and system for supplying management and maintenance parts which enables earlier reception of orders of parts required for management and maintenance of products. A physical distribution management (logistics) server 3 is provided to connect users 6, a manufacturer 6, and cooperating manufacturers 9. The users 6 are connected to said logistic server 3 through Internet or the like. Said logistic server 3 contains a management and maintenance parts supply system 2 and a parts information (spare parts information) database which stores parts information required for management and maintenance of products. The users select required parts from said database and send information of the selected parts to said manufacturer.
    Type: Application
    Filed: November 1, 2001
    Publication date: May 9, 2002
    Inventors: Yuichiro Mizumachi, Kenji Yokose, Tsuyoshi Aihara, Koichi Matsumoto
  • Patent number: 5463880
    Abstract: An absorption refrigerator is characterized by an absorber which has a tube bank of heat-conductive tubes in the absorber, a vapor flow passage between the tube bank and a side wall of the absorber which is opposite to and separated from the tube bank in a radial direction of the heat-conductive tubes by a distance equal to or larger than a maximum pitch of the heat-conductive tubes, at least a baffle plate disposed in the vapor flow passage, and a gas extraction port disposed outside the tube bank. A further arrangement is characterized by an absorber having a tube bank in the absorber, a vapor flow passage between the tube bank and a side wall of the absorber, and a gas extraction port disposed around a central portion of the tube bank.
    Type: Grant
    Filed: February 7, 1994
    Date of Patent: November 7, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitaka Nishino, Toshio Sawa, Takashi Nakao, Michihiko Aizawa, Kenji Yokose
  • Patent number: 5369674
    Abstract: This invention concerns a plant diagnosis apparatus which comprises a first detecting unit for detecting a state of devices constituting a circulating system in which a fluid circulates and a second detecting unit for detecting a quality of the above-mentioned circulating fluid or a quality of the atmosphere surrounding the above-mentioned circulating system, and a unit for diagnosing the circulating system by output of the first and second detecting units, and therefore can diagnose anomaly of facilities such as a nuclear power plant with high reliability and rapidity.
    Type: Grant
    Filed: January 23, 1992
    Date of Patent: November 29, 1994
    Assignee: Hitachi, Ltd.
    Inventors: Kenji Yokose, Makoto Nagase, Hiroshi Kamimura, Yamato Asakura, Tetsuya Matsui, Hidefumi Ibe, Yoshitaka Nishino, Shunsuke Uchida
  • Patent number: 5316983
    Abstract: An apparatus and a method for analysis of a particle by irradiation of the particle in a fluid with an intense laser pulse to cause laser breakdown and to detect sonic waves or plasma emission which are generated by the laser breakdown. The size of the particle is measured by using at least two kinds of information from the following: intensity of plasma emission or sonic wave generated by the laser breakdown, location of the laser breakdown plasma, and plasma emission waveform. Also, a laser pulse having flattened distribution of intensity for the irradiation is used in order to eliminate the dependence of the measured value on the particle location.
    Type: Grant
    Filed: August 5, 1991
    Date of Patent: May 31, 1994
    Assignee: Hitachi, Ltd.
    Inventors: Haruo Fujimori, Tetsuya Matsui, Taiko Ajiro, Kenji Yokose, Shigeru Izumi
  • Patent number: 5178836
    Abstract: This invention relates to an analytical method and a relevant equipment for particulate substances in a sample with the detection of acoustic waves generated in the sample with the irradiation of onto the sample. In this invention, the light power density of the irradiating light onto the sample is set high enough above the breakdown threshold of the particulate substances in the sample, and low enough below the breakdown threshold of the media, and the particulate substances in the sample are counted by detecting the acoustic waves generated by the breakdown of the particulate substances. The particulate substances are also analyzed for their components on the basis of the light signal (emission spectrum) which is detected with a dispersed spectrum from the light which is generated by the breakdown of the particulate substances.
    Type: Grant
    Filed: April 7, 1989
    Date of Patent: January 12, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Takehiko Kitamori, Kenji Yokose, Tetsuya Matsui, Masaharu Sakagami
  • Patent number: 5164592
    Abstract: The power density of a pulsed laser beam for irradiating a sample is adjusted to break down the sample into the form of a plasma. After the momentary breakdown of the sample into the form of a plasma, ions are generated having a high charge. Then, after a certain time elapses, the ions having a high charge recombine with the electrons in the plasma to provide monovalent or low valent ions. These low valent ions are taken out of the plasma and introduced to a mass spectrometric apparatus.
    Type: Grant
    Filed: September 13, 1990
    Date of Patent: November 17, 1992
    Assignee: Hitachi, Ltd.
    Inventors: Takehiko Kitamori, Masataka Koga, Tsuyoshi Nishitarumizu, Tetsuya Matsui, Kenji Yokose, Masaharu Sakagami
  • Patent number: 5122752
    Abstract: A method of and an apparatus for analyzing a granular material contained in a sample of a medium such as water produced by an ultra-pure water producing apparatus includes the steps of adding energy to granular materials contained in a sample which is mixed with the medium, wherein the energy is set to be lower than the breakdown threshold of the medium and to be higher than the breakdown threshold of the granular materials, detecting ions which are generated with the breakdown of the granular materials by using a pair of positive and negative electrodes; and analyzing characteristics of the granular materials based on the ions.
    Type: Grant
    Filed: August 30, 1990
    Date of Patent: June 16, 1992
    Assignee: Hitachi, Ltd.
    Inventors: Masataka Koga, Tsuyoshi Nishitarumizu, Tetsuya Matsui, Kenji Yokose, Masaharu Sakagami, Takehiko Kitamori
  • Patent number: 5070300
    Abstract: Apparatus for measuring breakdown plasma, comprising an irradiating device for irradiating a sample with a focused light beam and for causing breakdown of a ultrafine particle to be measured in the sample at the focused beam region to change the particle into plasma; a pair of electrodes arranged on opposite sides of the focused region of the beam; and a device for measuring an electrical resistance between the electrodes under a condition where the breakdown plasma is produced between the electrodes and for determining a diameter of the particle according to the measured electrical resistance serves for accurate measurement of the diameter of the ultrafine particle in the sample.
    Type: Grant
    Filed: August 8, 1989
    Date of Patent: December 3, 1991
    Assignee: Hitachi, Ltd.
    Inventors: Tetsuya Matsui, Takehiko Kitamori, Kenji Yokose, Masaharu Sakagami